Gunnar Krause

Method for determining the temperature of a semiconductor chip and semiconductor chip with temperature measuring configuration

Apparatus for flexible deactivation of word lines of dynamic memory modules and method therefor

System for testing fast synchronous semiconductor circuits

Test configuration and test method for testing a plurality of integrated circuits in parallel

Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested

System for testing fast integrated digital circuits, in particular semiconductor memory modules

Test circuit for testing a circuit

DDR to SDR conversion that decodes read and write accesses and forwards delayed commands to first and second memory modules

Test data generator

Semiconductor component and method for testing and operating a semiconductor component