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Jens Luepke

Infineon Technologies

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Publication

Featured researches published by Jens Luepke.

Archive | 2002

Test circuit for testing a circuit

Wolfgang Ernst; Gunnar Krause; Peter Poechmueller; Justus Kuhn; Jens Luepke; Jochen Mueller; Michael Schittenhelm

Archive | 2002

Test data generator

Wolfgang Ernst; Gunnar Krause; Justus Kuhn; Jens Luepke; Jochen Mueller; Peter Poechmueller; Michael Schittenhelm

Archive | 2002

Test circuit for testing a synchronous circuit

Wolfgang Ernst; Gunnar Krause; Justus Kuhn; Jens Luepke; Jochen Mueller; Peter Poechmueller; Michael Schittenhelm

Archive | 2002

Address generator for generating addresses for testing a circuit

Wolfgang Ernst; Justus Kuhn; Jens Luepke; Peter Poechmuller; Gunnar Krause; Jochen Mueller; Michael Schittenhelm

Archive | 2002

Method and device for testing semiconductor memory devices

Eric Cordes; Georg Eggers; Jens Luepke; Christian Stocken

Archive | 2001

Test circuit for testing synchronous memory circuit compares generated test data with data read from memory circuit, outputs display signal indicating whether memory circuit is functional

Peter Poechmueller; Wolfgang Ernst; Gunnar Krause; Justus Kuhn; Jens Luepke; Jochen Mueller; Michael Schittenhelm

Archive | 2001

Test circuit for synchronous integrated circuits, especially memory (DRAM) chips whereby test errors due to signal transfer time differences are minimized and the circuit is insensitive to signal voltage potential variations

Peter Poechmueller; Wolfgang Ernst; Gunnar Krause; Justus Kuhn; Jens Luepke; Jochen Mueller; Michael Schittenhelm

Archive | 2001

Test data generator for integrated circuit, has test unit that generates multi-row register selection control data vector having number of control data equivalent to frequency multiplication factor of input clock signal

Peter Poechmueller; Wolfgang Ernst; Gunnar Krause; Justus Kuhn; Jens Luepke; Jochen Mueller; Michael Schittenhelm

Archive | 2001

Test circuit has decoder clocked by high frequency clock signal that generates internal control signals for test circuit depending on control signals applied to control signal input bus

Peter Poechmueller; Wolfgang Ernst; Gunnar Krause; Justus Kuhn; Jens Luepke; Jochen Mueller; Michael Schittenhelm

Archive | 2000

Test system for quick synchronous digital circuit, has BOST module with switching unit for switching between two operation modes based on detected switching criteria of changeover switching

Wolfgang Ernst; Gunnar Krause; Justus Kuhn; Jens Luepke; Jochen Mueller; Peter Poechmueller; Michael Schittenhelm

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Gunnar Krause

Infineon Technologies

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Jochen Mueller

Infineon Technologies

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Justus Kuhn

Infineon Technologies

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Michael Schittenhelm

Infineon Technologies

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Peter Poechmueller

Infineon Technologies

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Wolfgang Ernst

Infineon Technologies

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Christian Stocken

Infineon Technologies

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Eric Cordes

Siemens

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Georg Eggers

Infineon Technologies

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