Gustavo A. Schwartz

Water dynamics in n-propylene glycol aqueous solutions

The relaxation dynamics of dipropylene glycol and tripropylene glycol (nPG-n=2,3) water solutions on the nPG-rich side has been studied by broadband dielectric spectroscopy and differential scanning calorimetry in the temperature range of 130-280 K. Two relaxation processes are observed for all the hydration levels; the slower process (I) is related to the alpha relaxation of the solution whereas the faster one (II) is associated with the reorientation of water molecules in the mixture. Dielectric data for process (II) at temperatures between 150 and 200 K indicate the existence of a critical water concentration (x(c)) below which water mobility is highly restricted. Below x(c), nPG-water domains drive the dielectric signal whereas above x(c), water-water domains dominate the dielectric response at low temperatures. The results also show that process (II) at low temperatures is due to local motions of water molecules in the glassy frozen matrix. Additionally, we will show that the glass transition temperatures (T(g)) for aqueous PG, 2PG, and 3PG solutions do not extrapolate to approximately 136 K, regardless of the extrapolation method. Instead, we find that the extrapolated T(g) value for water from these solutions lies in the neighborhood of 165 K.

Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

We present a method to determine the local dielectric permittivity of thin insulating layers. The measurement is based on the detection of force gradients in electric force microscopy by means of a double pass method. The proposed experimental protocol is simple to implement and does not need any modification of standard commercial devices. Numerical simulations based on the equivalent charge method make it possible to carry out quantification whatever the thickness of film, the radius of the tip, and the tip-sample distance. This method has been validated on a thin SiO2 sample for which the dielectric permittivity at the nanoscale has been characterized in the literature. We also show how we can quantitatively measure the local dielectric permittivity for ultrathin polymer film of poly(vinyl acetate) and polystyrene.

Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy

We have developed a method for imaging the temperature-frequency dependence of the dynamics of nanostructured polymer films with spatial resolution. This method provides images with dielectric compositional contrast well decoupled from topography. Using frequency-modulation electrostatic-force-microscopy, we probe the local frequency-dependent (0.1–100 Hz) dielectric response through measurement of the amplitude and phase of the force gradient in response to an oscillating applied electric field. When the phase is imaged at fixed frequency, it reveals the spatial variation in dielectric losses, i.e., the spatial variation in molecular/dipolar dynamics, with 40 nm lateral resolution. This is demonstrated by using as a model system; a phase separated polystyrene/polyvinyl-acetate (PVAc) blend. We show that nanoscale dynamic domains of PVAc are clearly identifiable in phase images as those which light-up in a band of temperature, reflecting the variations in the molecular/dipolar dynamics approaching the glass transition temperature of PVAc.

Combining configurational entropy and self-concentration to describe the component dynamics in miscible polymer blends

We provide a new approach to describe the component segmental dynamics of miscible polymer blends combining the concept of chain connectivity, expressed in terms of the self-concentration, and the Adam-Gibbs model. The results show an excellent agreement between the prediction of our approach and the experimental data. The self-concentrations obtained yield length scales between 1 and 3.2 nm depending on the temperature, the flexibility of the polymer, expressed in terms of the Kuhn segment, and its concentration in the blends, at temperatures above the glass transition range of the blend.

Temperature and strain rate dependence of the tensile yield stress of PVC

SYNOPSIS Data on the tensile yield behavior of poly(viny1 chloride) (PVC), reported in the literature, are interpreted in terms of a model involving a cooperative movement of several independent structural units, all with the same activation enthalpy. This analysis leads to physical parameters such as the internal stress, activation volume, and enthalpy, etc. These values are discussed and compared with those determined from thermodynamical considerations using stress relaxation tests and tensile curves at a constant strain rate. 0 1996 John Wiley & Sons, Inc.

Relaxation dynamics of a polymer in a 2D confinement

The molecular dynamics of oligomeric poly(propylene glycol) (PPG) liquids (MW=1000, 2000, and 4000 g/mol) confined in a two-dimensional layer-structured Na-vermiculite clay has been studied by broadband dielectric spectroscopy. The alpha-relaxation and the normal mode relaxation processes were studied for all samples in bulk and confinement. The most prominent experimental observation was that for the normal mode process: the relaxation rate in the clay is drastically shifted to lower frequencies compared to that of the bulk material. This slowing down is probably caused by the strongly reduced number of accessible chain conformations in two dimensions. Also the temperature dependence of the relaxation time for the normal mode process is strongly affected by the confinement. In contrast, for the alpha-relaxation of the confined polymers we observed only a slight increase of the relaxation rate at high temperatures compared to the corresponding bulk samples, and a decrease of its relaxation strength relative to the beta relaxation. Thus, the glass transition is unaffected by the 2D confinement, suggesting that the underlying phenomena responsible for the glass transition is the same as in bulk. Moreover, in the clay the intensity of the normal mode is stronger than that of the alpha-process, in contrast to the bulk samples where the opposite behavior is observed.

Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)

In this work we present a new AFM based approach to measure the local dielectric response of polymer films at the nanoscale by means of Amplitude Modulation Electrostatic Force Microscopy (AM-EFM). The proposed experimental method is based on the measurement of the tip-sample force via the detection of the second harmonic component of the photosensor signal by means of a lock-in amplifier. This approach allows reaching unprecedented broad frequency range (2-3 × 10(4)Hz) without restrictions on the sample environment. The method was tested on different poly(vinyl acetate) (PVAc) films at several temperatures. Simple analytical models for describing the electric tip-sample interaction semi-quantitatively account for the dependence of the measured local dielectric response on samples with different thicknesses and at several tip-sample distances.

Stress Relaxation of PVC Below the Yield Point

SYNOPSIS Stress relaxation of commercial poly(viny1 chloride) (PVC) is measured at strains below 3% and at different temperatures below the glass transition temperature. First it is shown that below the yield point the material follows a linear viscoelastic behavior. Then the data at a fixed deformation level (0.03) are fitted by considering a lognormal distribution function of relaxation times. Furthermore, from the measured stress-strain curves, the temperature dependence of the elastic tensile modulus is determined. The temperature dependence of the elastic modulus, the relaxation strength, and the parameters of the distribution: mean relaxation time, T,, and half-width, p, are given. Moreover, the distribution function and the temperature dependence of its characteristic parameters are discussed in terms of a cooperative model of the mechanisms involved in the mechanical relaxation of glassy polymers. Finally, the relationship proposed between the tensile modulus and the free volume helps explain the temperature dependence of the relaxation strength. 0 1996 John Wiley & Sons, Inc.

A numerical simulation of the electrical resistivity of carbon black filled rubber

A simple model is proposed and a numerical simulation is carried out to calculate the electrical resistivity of a composite of carbon black in an insulating matrix. From load of carbon black and aggregate size and distribution, it is possible to know the resistivity of the compound assuming a random lattice where the resistance between sites (aggregates) varies exponentially with the gap. A computer program was developed and several samples were prepared and measured to obtain the model parameters. Numerical results are compared with experimental data.

Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images

Dielectric relaxation (DR) has shown to be a very useful technique to study dielectric materials like polymers and other glass formers, giving valuable information about the molecular dynamics of the system at different length and time scales. However, the standard DR techniques have a fundamental limitation: they have no spatial resolution. This is of course not a problem when homogeneous and non-structured systems are analyzed but it becomes an important limitation for studying the local properties of heterogeneous and/or nano-structured materials. To overcome this constrain we have developed a novel approach that allows quantitatively measuring the local dielectric permittivity of thin films at the nanoscale by means of Electrostatic Force Microscopy. The proposed experimental method is based on the detection of the local electric force gradient at different values of the tip-sample distance. The value of the dielectric permittivity is then calculated by fitting the experimental points using the Equivalent Charge Method. Even more interesting, we show how this approach can be extended in order to obtain quantitative dielectric images of insulating thin films with an excellent lateral resolution.