Hao-Chung Kuo

Enhancing the output power of GaN-based LEDs grown on wet-etched patterned sapphire substrates

GaN-based light-emitting diodes (LEDs) with emitting wavelength of 450 nm were grown on patterned sapphire substrates (PSSs) fabricated by chemical wet etching. The crystallography-etched facet was {1-102} R-plane with a 57deg against {0001} C-axis and had superior capability for enhancing light extraction efficiency. The light output power of the PSS LED was 1.15 times higher than that of the conventional LED at an injection current of 20 mA. The output power and external quantum efficiency were estimated to be 9 mW and 16.4%, respectively. The improvement was attributed not only to geometrical shapes of {1-102} crystallography-etched facets that efficiently scatter the guided light to find escape cones, but also to dislocation density reduction by adopting the PSS growth scheme

CW lasing of current injection blue GaN-based vertical cavity surface emitting laser

Here, we report the cw laser operation of electrically pumped GaN-based vertical cavity surface emitting laser (VCSEL). The GaN-based VCSEL has a ten-pair InGaN∕GaN multiple quantum well active layer embedded in a GaN hybrid microcavity of 5λ optical thickness with two high reflectivity mirrors provided by an epitaxially grown AlN∕GaN distributed Bragg reflector (DBR) and a Ta2O5∕SiO2 dielectric DBR. cw laser action was achieved at a threshold injection current of 1.4mA at 77K. The laser emitted a blue wavelength at 462nm with a narrow linewidth of about 0.15nm. The laser beam has a divergence angle of about 11.7° with a polarization ratio of 80%. A very strong spontaneous coupling efficiency of 7.5×10−2 was measured.

Study of GaN light-emitting diodes fabricated by laser lift-off technique

The fabrication process and performance characteristics of the laser lift-off (LLO) GaN light-emitting diodes (LEDs) were investigated. The LLO-GaN LEDs were fabricated by lifting off the GaN LED wafer structure grown on the original sapphire substrate by a KrF excimer laser at 248 nm wavelength with the laser fluence of 0.6 J/cm2 and transferring it onto a Cu substrate. The LLO-GaN LEDs on Cu show a nearly four-fold increase in the light output power over the regular LLO-LEDs on the sapphire substrate. High operation current up to 400 mA for the LLO-LEDs on Cu was also demonstrated. Based on the emission wavelength shift with the operating current data, the LLO-LEDs on Cu show an estimated improvement of heat dissipation capacities by nearly four times over the light-emitting devices on sapphire substrate. The LLO process should be applicable to other GaN-based LEDs in particular for those high light output power and high operation current devices.

Patterned structure of remote phosphor for phosphor-converted white LEDs.

High efficiency white light-emitting diodes with superior color-mixing have been investigated. It is suggested that the patterned remote phosphor structure could improve the uniformity of angular-dependent correlated color temperature (CCT) and achieve high chromatic stability in wider operating current range, as compared to the conventional remote phosphor coating structure. In this experiment, we employed a pulse spray coating method to place the patterned phosphor on the package and to leave a window region. The window area, a clear space without coating of the phosphor not only increases the extraction efficiency of blue rays at large angle, but also improves the stability of angular-dependent CCT. Moreover, the CCT deviation could be reduced from 1320 K to 266 K by this patterned remote phosphor method, and the stray blue/yellow light within the package can be effectively reduced and controlled. The design was verified both experimentally and theoretically.

Improvement of InGaN-GaN light-emitting diode performance with a nano-roughened p-GaN surface

This investigation describes the development of InGaN-GaN light-emitting diode (LED) with a nano-roughened top p-GaN surface which uses Ni nano-mask and wet etching. The light output of the InGaN-GaN LED with a nano-roughened top p-GaN surface is 1.4 times that of a conventional LED, and wall-plug efficiency is 45% higher. The operating voltage of InGaN-GaN LED was reduced from 3.65 to 3.5 V at 20 mA and the series resistance was reduced by 20%. The light output is increased by the nano-roughening of the top p-GaN surface. The reduction in the series resistance can be attributed to the increase in the contact area of nano-roughened surface.

Nanoscale epitaxial lateral overgrowth of GaN-based light-emitting diodes on a SiO2 nanorod-array patterned sapphire template

High efficiency GaN-based light-emitting diodes (LEDs) are demonstrated by a nanoscale epitaxial lateral overgrowth (NELO) method on a SiO2 nanorod-array patterned sapphire substrate (NAPSS). The transmission electron microscopy images suggest that the voids between SiO2 nanorods and the stacking faults introduced during the NELO of GaN can effectively suppress the threading dislocation density. The output power and external quantum efficiency of the fabricated LED were enhanced by 52% and 56%, respectively, compared to those of a conventional LED. The improvements originated from both the enhanced light extraction assisted by the NAPSS and the reduced dislocation densities using the NELO method.

Low efficiency droop in blue-green m-plane InGaN/GaN light emitting diodes

We investigated the electroluminescence and relatively external quantum efficiency (EQE) of m-plane InGaN/GaN light emitting diodes (LEDs) emitting at 480 nm to elucidate the droop behaviors in nitride-based LEDs. With increasing the injection current density to 100 A/cm2, the m-plane LEDs exhibit only 13% efficiency droop, whereas conventional c-plane LEDs suffer from efficiency droop at very low injection current density and the EQE of c-plane LEDs decrease to as little as 50% of its maximum value. Our simulation models show that in m-plane LEDs the absence of polarization fields manifest not only the hole distribution more uniform among the wells but also the reduction in electron overflow out of electron blocking layer. These results suggest that the nonuniform distribution of holes and electron leakage current due to strong polarization fields are responsible for the relatively significant efficiency droop of conventional c-plane LEDs.

Continuous wave operation of current injected GaN vertical cavity surface emitting lasers at room temperature

We report the demonstration of the continuous wave laser action on GaN-based vertical cavity surface emitting lasers at room temperature. The laser structure consists of a ten-pair Ta2O5/SiO2 distributed Bragg reflector (DBR), a 7λ-thick optical cavity, ten-pairs InGaN/GaN multiquantum wells with an AlGaN electron blocking layer, and a 29-pair AlN/GaN DBR. The laser has a threshold current of about 9.7 mA corresponding to the current density of about 12.4 kA/cm2 and a turn-on voltage about 4.3 V at 300 K. The lasing wavelength was 412 nm with a linewidth of about 0.5 nm. A spontaneous emission coupling efficiency factor of about 5×10−3 and the degree of polarization of about 55% were measured, respectively. The laser beam has a narrow divergence angle of about 8°.

Hole transport improvement in InGaN/GaN light-emitting diodes by graded-composition multiple quantum barriers

Graded-composition multiple quantum barriers (GQB) were designed and incorporated in c-plane InGaN/GaN light-emitting diodes (LEDs) grown on c-plane sapphire substrate to improve hole transport and efficiency droop. The simulation of GQB LED design predicts enhancement of the hole transport in the active region at both low and high current densities. The fabricated LED with GQB structure exhibits lower series resistance and substantially reduced droop behavior of only 6% in comparison with 34% for conventional LED, supporting the improvement of hole transport in our design.

450-nm GaN laser diode enables high-speed visible light communication with 9-Gbps QAM-OFDM

A TO-38-can packaged Gallium nitride (GaN) blue laser diode (LD) based free-space visible light communication (VLC) with 64-quadrature amplitude modulation (QAM) and 32-subcarrier orthogonal frequency division multiplexing (OFDM) transmission at 9 Gbps is preliminarily demonstrated over a 5-m free-space link. The 3-dB analog modulation bandwidth of the TO-38-can packaged GaN blue LD biased at 65 mA and controlled at 25°C is only 900 MHz, which can be extended to 1.5 GHz for OFDM encoding after throughput intensity optimization. When delivering the 4-Gbps 16-QAM OFDM data within 1-GHz bandwidth, the error vector magnitude (EVM), signal-to-noise ratio (SNR) and bit-error-rate (BER) of the received data are observed as 8.4%, 22.4 dB and 3.5 × 10(-8), respectively. By increasing the encoded bandwidth to 1.5 GHz, the TO-38-can packaged GaN blue LD enlarges its transmission capacity to 6 Gbps but degrades its transmitted BER to 1.7 × 10(-3). The same transmission capacity of 6 Gbps can also be achieved with a BER of 1 × 10(-6) by encoding 64-QAM OFDM data within 1-GHz bandwidth. Using the 1.5-GHz full bandwidth of the TO-38-can packaged GaN blue LD provides the 64-QAM OFDM transmission up to 9 Gbps, which successfully delivers data with an EVM of 5.1%, an SNR of 22 dB and a BER of 3.6 × 10(-3) passed the forward error correction (FEC) criterion.