Heike Geisler
State University of New York at Oneonta
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Featured researches published by Heike Geisler.
Bulletin of the American Physical Society | 2013
Zachary R. Robinson; Eng Wen Ong; Tyler R. Mowll; Parul Tyagi; D. Kurt Gaskill; Heike Geisler; Carl Ventrice
Understanding the influence that copper substrate surface symmetry and oxygen impurities have on the growth of graphene by chemical vapor deposition is important for developing techniques for producing high-quality graphene. Therefore, we have studied the growth of graphene by catalytic decomposition of ethylene in an ultrahigh-vacuum chamber on both a clean Cu(100) surface and a Cu(100) surface predosed with a layer of chemisorbed oxygen. The crystal structure of the graphene films was characterized with in situ low energy electron diffraction. By heating the clean Cu(100) substrate from room temperature to the growth temperature in ethylene, epitaxial graphene films were formed. The crystal quality was found to depend strongly on the growth temperature. At 900 °C, well-ordered two-domain graphene films were formed. Predosing the Cu(100) surface with a chemisorbed layer of oxygen before graphene growth was found to adversely affect the crystal quality of the graphene overlayer by inducing a much higher d...
Journal of Applied Physics | 2016
Zachary Robinson; Glenn G. Jernigan; Virginia D. Wheeler; Sandra C. Hernández; Charles R. Eddy; Tyler R. Mowll; Eng Wen Ong; Carl A. Ventrice; Heike Geisler; Ivo Pletikosic; Hongbo Yang; T. Valla
Intelligent engineering of graphene-based electronic devices on SiC(0001) requires a better understanding of processes used to deposit gate-dielectric materials on graphene. Recently, Al2O3 ndielectrics have been shown to form conformal, pinhole-free thin films by functionalizing the top surface of the graphene with fluorine prior to atomic layer deposition n(ALD) of the Al2O3 using a trimethylaluminum (TMA) precursor. In this work, the functionalization and ALD-precursor adsorption processes have been studied with angle-resolved photoelectron spectroscopy, low energy electron diffraction, and X-ray photoelectron spectroscopy. It has been found that the functionalization process has a negligible effect on the electronic structure of the graphene, and that it results in a twofold increase in the adsorption of the ALD-precursor. In situ TMA-dosing and XPS studies were also performed on three different Si(100) substrates that were terminated with H, OH, or dangling Si-bonds. This dosing experiment revealed that OH is required for TMA adsorption. Based on those data along with supportive in situ measurements that showed F-functionalization increases the amount of oxygen (in the form of adsorbed H2O) on the surface of the graphene, a model for TMA-adsorption on graphene is proposed that is based on a reaction of a TMA molecule with OH.
Archive | 1999
Carl Ventrice; Heike Geisler
Bulletin of the American Physical Society | 2017
Heike Geisler; Jacob Bachor; Nicolas LaScala
Bulletin of the American Physical Society | 2015
Zachary Robinson; Virginia D. Wheeler; Sandra C. Hernández; Glenn G. Jernigan; Rachael L. Myers-Ward; D. Kurt Gaskill; Tyler Mowl; Eng Wen Ong; Carl Ventrice; Heike Geisler; Ivo Pletikosic; T. Valla; C.R. Eddy
Bulletin of the American Physical Society | 2015
Heike Geisler; Seamus Murray; Eng Wen Ong; Tyler R. Mowll; Parul Tyagi; Carl Ventrice
Bulletin of the American Physical Society | 2014
Heike Geisler; Seamus Murray; Eng Wen Ong; Zachary Robinson; Tyler R. Mowll; Parul Tyagi; Carl Ventrice
Bulletin of the American Physical Society | 2012
Zachary Robinson; Parul Tyagi; Heike Geisler; Carl Ventrice; A.A. Bol; James B. Hannon
Archive | 2009
Jennifer Walters; Alan E Harrison; Christopher Cumby; Gabriel Arellano; Heike Geisler; Carl A. Ventrice
Archive | 2008
Carl A. Ventrice; Heike Geisler; David Ray Borst; Guo-Xing Miao; Anoop Gupta