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Dive into the research topics where Parul Tyagi is active.

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Featured researches published by Parul Tyagi.


Journal of Vacuum Science and Technology | 2012

Substrate grain size and orientation of Cu and Cu–Ni foils used for the growth of graphene films

Zachary Robinson; Parul Tyagi; Thomas M. Murray; Carl A. Ventrice; Shanshan Chen; Andrew Munson; Carl W. Magnuson; Rodney S. Ruoff

Graphene growth on Cu foils by catalytic decomposition of methane forms predominantly single-layer graphene films due to the low solubility of carbon in Cu. On the other hand, graphene growth on Cu–Ni foils can result in the controlled growth of few-layer graphene films because of the higher solubility of carbon in Ni. One of the key issues for the use of graphene grown by chemical vapor deposition for device applications is the influence of defects on the transport properties of the graphene. For instance, growth on metal foil substrates is expected to result in multidomain graphene growth because of the presence of grains within the foil that exhibit a variety of surface terminations. Therefore, the size and orientation of the grains within the metal foil should influence the defect density of the graphene. For this reason, we have studied the effect of total anneal time and temperature on the orientation and size of grains within Cu foils and Cu–Ni alloy foils with a nominal concentration of 90/10 by weight. The graphene growth procedure involves preannealing the foil in a H2 background followed by the graphene growth in a CH4/H2 atmosphere. Measurements of the substrate grain size have been performed with optical microscopy and scanning electron microscopy. These results show typical lateral dimensions ranging from a few millimeters up to approximately a centimeter for Cu foils annealed at 1030 °C for 35 min and from tens of microns up to a few hundred microns for the 90/10 Cu–Ni foils annealed at 1050 °C for times ranging from 45 to 90 min. The smaller grains within the Cu–Ni foils are attributed to the higher melting point of the Cu–Ni alloy. The crystallographic orientation within each substrate grain was studied with electron backscatter diffraction, and shows that the preferred orientation for the Cu foil is primarily toward the (100) surface plane. For the 90/10 Cu–Ni foils, the orientation of the surface of the grains is initially toward the (110) plane and shifts into an orientation midway between the (100) and (111) planes as the anneal time is increased.Graphene growth on Cu foils by catalytic decomposition of methane forms predominantly single-layer graphene films due to the low solubility of carbon in Cu. On the other hand, graphene growth on Cu–Ni foils can result in the controlled growth of few-layer graphene films because of the higher solubility of carbon in Ni. One of the key issues for the use of graphene grown by chemical vapor deposition for device applications is the influence of defects on the transport properties of the graphene. For instance, growth on metal foil substrates is expected to result in multidomain graphene growth because of the presence of grains within the foil that exhibit a variety of surface terminations. Therefore, the size and orientation of the grains within the metal foil should influence the defect density of the graphene. For this reason, we have studied the effect of total anneal time and temperature on the orientation and size of grains within Cu foils and Cu–Ni alloy foils with a nominal concentration of 90/10 by w...


Physical Review B | 2012

Argon Assisted Growth of Epitaxial Graphene on Cu(111)

Zachary Robinson; Parul Tyagi; Tyler R. Mowll; Carl A. Ventrice; James B. Hannon

The growth of graphene by catalytic decomposition of ethylene on Cu(111) in an ultra-high vacuum system was investigated with low energy electron diraction, low energy electron microscopy, and atomic force microscopy. Attempts to form a graphene overlayer using ethylene at pressures as high as 10 mTorr and substrate temperatures as high as 900 C resulted in almost no graphene growth. By using an argon overpressure, the growth of epitaxial graphene on Cu(111) is achieved. The suppression of graphene growth without the use of an argon overpressure is attributed to Cu sublimation at elevated temperatures. During the initial stages of growth, a random distribution of rounded graphene islands is observed. The predominant rotational orientation of the islands is within 1 of the Cu(111) substrate lattice.


Bulletin of the American Physical Society | 2013

Influence of Chemisorbed Oxygen on the Growth of Graphene on Cu(100) by Chemical Vapor Deposition

Zachary R. Robinson; Eng Wen Ong; Tyler R. Mowll; Parul Tyagi; D. Kurt Gaskill; Heike Geisler; Carl Ventrice

Understanding the influence that copper substrate surface symmetry and oxygen impurities have on the growth of graphene by chemical vapor deposition is important for developing techniques for producing high-quality graphene. Therefore, we have studied the growth of graphene by catalytic decomposition of ethylene in an ultrahigh-vacuum chamber on both a clean Cu(100) surface and a Cu(100) surface predosed with a layer of chemisorbed oxygen. The crystal structure of the graphene films was characterized with in situ low energy electron diffraction. By heating the clean Cu(100) substrate from room temperature to the growth temperature in ethylene, epitaxial graphene films were formed. The crystal quality was found to depend strongly on the growth temperature. At 900 °C, well-ordered two-domain graphene films were formed. Predosing the Cu(100) surface with a chemisorbed layer of oxygen before graphene growth was found to adversely affect the crystal quality of the graphene overlayer by inducing a much higher d...


FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 | 2009

Spectroscopic Ellipsometry Characterization of High‐k films on SiO2/Si

Ming Di; Eric Bersch; Steven Consiglio; Tianhao Zhang; Parul Tyagi; Robert D. Clark; Gert J. Leusink; Arun R. Srivatsa; Alain C. Diebold

Spectroscopic ellipsometry (SE) with VUV wavelength region has been used to characterize high‐k films grown on SiO2/Si. The high‐k stack thickness measurements by SE are compared to thickness measurements derived from angle resolved x‐ray photoemission spectroscopy. The optical properties of hafnium silicate change with silicate concentration, which is the mechanism for SE to measure this quantity. Other factors that affect high‐k optical properties such as N concentration and annealing are also investigated.


Surface Science | 2015

Characterization of graphene films grown on CuNi foil substrates

Parul Tyagi; Zachary Robinson; Andrew Munson; Carl W. Magnuson; Shanshan Chen; James McNeilan; R. Moore; Richard D. Piner; Rodney S. Ruoff; Carl A. Ventrice


Bulletin of the American Physical Society | 2016

Growth of Graphene on Cu Single Crystal Substrates

Tyler R. Mowll; Eng Wen Ong; Parul Tyagi; Zachary Robinson; Carl Ventrice


Bulletin of the American Physical Society | 2015

Effect of Ar Overpressure Ratio on the Growth of Graphene on Cu(111)

Heike Geisler; Seamus Murray; Eng Wen Ong; Tyler R. Mowll; Parul Tyagi; Carl Ventrice


Bulletin of the American Physical Society | 2015

Role of Surface Termination on the Growth of Graphene on Cu

Tyler R. Mowll; Eng Wen Ong; Parul Tyagi; Zachary Robinson; Carl Ventrice


Bulletin of the American Physical Society | 2014

Influence of Substrate Orientation on the Growth of Graphene on Cu Single Crystals

Tyler R. Mowll; Zachary Robinson; Parul Tyagi; Eng Wen Ong; Carl Ventrice


Bulletin of the American Physical Society | 2014

CVD Growth Studies of Graphene on Cu(111)

Heike Geisler; Seamus Murray; Eng Wen Ong; Zachary Robinson; Tyler R. Mowll; Parul Tyagi; Carl Ventrice

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Zachary Robinson

State University of New York System

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Carl Ventrice

University of New Orleans

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Eng Wen Ong

State University of New York System

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Carl W. Magnuson

University of Texas at Austin

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Heike Geisler

State University of New York at Oneonta

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Rodney S. Ruoff

Ulsan National Institute of Science and Technology

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Alain C. Diebold

State University of New York System

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Andrew Munson

University of Texas at Austin

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Carl A. Ventrice

State University of New York System

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