Hein Thomas | Researchain

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Archive | 1999

Integrierte Schaltung mit einem Phasenregelkreis

Heyne Patrick; Hein Thomas; Partsch Torsten; Marx Thilo

Archive | 2001

MEMORY MODULE HAVING SHORT ACCESS TIME

Dietrich Stefan; Hein Thomas; Heyne Patrick; Marx Thilo; Partsch Torsten; Schroegmeier Peter

Archive | 1999

Integrated circuit e.g. for generation of phase-shifted output clock from clock signal

Heyne Patrick; Hein Thomas; Partsch Torsten; Marx Thilo

Archive | 1998

Integrierte Schaltung und Verfahren zu ihrer Prüfung

Schoeniger Sabine; Schroegmeier Peter; Hein Thomas; Dietrich Stefan

IEEE Conference Proceedings | 2017

費用効果の高い高性能応用のための23.1 8Gb12Gb/s/pin GDDR5X DRAM【Powered by NICT】

Brox Martin; Balakrishnan Mani; Broschwitz Martin; Chetreanu Cristian; Dietrich Stefan; Funfrock Fabien; Gonzalez Marcos Alvarez; Hein Thomas; Huber Eugen; Lauber Daniel; Ivanov Milena; Kuzmenka Maksim; Mohr Chris; Munoz Francisco Emiliano; Garrido Juan Ocon; Padaraju Swetha; Piatkowski Sven; Pottgiesser Jan; Pfefferl Peter; Plan Manfred; Polney Jens; Rau Stefan; Richter Michael; Schneider Ronny; Seitter Ralf Oliver; Spirkl Wolfgang; Walter Marc; Weller Jorg; Vitale Filippo

Archive | 2008

Integrierte Schaltung mit Testbetriebsart und Verfahren zum Testen einer Vielzahl solcher integrierter Schaltungen

Dietrich Stefan Dr; Heyne Patrick; Marx Thilo; Schoeniger Sabine; Sommer Michael; Hein Thomas; Markert Michael; Partsch Torsten; Schroegmeier Peter; Weis Christian

Archive | 2003

Integrated memory with row-access-controller to activate and de-activate the row-lines

Dietrich Stefan Dr; Hein Thomas; Heyne Patrick; Marx Thilo; Partsch Torsten

Archive | 2003

Circuit arrangement used for programmed delay time of signal route

Dietrich Stefan Dr; Hein Thomas; Heyne Patrick; Markert Michael; Marx Thilo

Archive | 2003

Circuit-arrangement to generate a local output-clock-signal with optimal signal-generation-time

Partsch Torsten; Heyne Patric; Marx Thilo; Hein Thomas

Archive | 2002

INTEGRATED CIRCUIT HAVING TEST OPERATION MODE AND METHOD FOR TESTING NUMBER OF INTEGRATED CIRCUITS

Dietrich Stefan; Hein Thomas; Heyne Patrick; Markert Michael; Marx Thilo; Partsch Torsten; Schoeniger Sabine; Schroegmeier Peter; Sommer Michael; Weis Christian

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