Markert Michael | Researchain

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Featured researches published by Markert Michael.

Archive | 2013

FB DRAM-Speicher mit Zustandsspeicher

Dimitrova Milena; Hoenigschmid Heinz; Dietrich Stefan; Markert Michael

Archive | 2008

Speicherelement zur Verbesserung der Zuverlässigkeit eines Speicherelements

Liaw Corvin; Dimitrova Milena; Markert Michael; Dietrich Stefan

Archive | 2008

Integrierte Schaltung mit Testbetriebsart und Verfahren zum Testen einer Vielzahl solcher integrierter Schaltungen

Dietrich Stefan Dr; Heyne Patrick; Marx Thilo; Schoeniger Sabine; Sommer Michael; Hein Thomas; Markert Michael; Partsch Torsten; Schroegmeier Peter; Weis Christian

Archive | 2003

Semiconductor memory device has driver transistor pair for each memory module and coupling transistor for coupling adjacent memory row selection lines

Schroegmeier Peter; Dietrich Stefan; Acharya Pramod; Kieser Sabine; Graesser Ursula; Schneider Helmut; Markert Michael

Archive | 2003

Integrated memory has control circuit that activates at least two different column selection lines with one column address, one of the column selection lines for two or more column addresses

Schroegmeier Peter; Dietrich Stefan; Kieser Sabine; Weis Christian; Markert Michael; Hein Thomas

Archive | 2003

Circuit arrangement used for programmed delay time of signal route

Dietrich Stefan Dr; Hein Thomas; Heyne Patrick; Markert Michael; Marx Thilo

Archive | 2002

INTEGRATED CIRCUIT HAVING TEST OPERATION MODE AND METHOD FOR TESTING NUMBER OF INTEGRATED CIRCUITS

Dietrich Stefan; Hein Thomas; Heyne Patrick; Markert Michael; Marx Thilo; Partsch Torsten; Schoeniger Sabine; Schroegmeier Peter; Sommer Michael; Weis Christian

Archive | 2002

INTEGRATED CIRCUIT AND TEST METHOD OF SAME

Dietrich Stefan; Heyne Patrick; Marx Thilo; Schoeniger Sabine; Sommer Michael; Hein Thomas; Markert Michael; Partsch Torsten; Schroegmeier Peter; Weis Christian

Archive | 2002

Schaltungsanordnung zur Programmierung einer Verzögerungszeit eines Signalpfads

Heyne Patrick; Sommer Michael; Schroegmeier Peter; Dietrich Stefan; Schoeniger Sabine; Weis Christian; Marx Thilo; Markert Michael; Partsch Torsten; Hein Thomas

Archive | 2002

Test arrangement for integrated circuit memory chips

Heyne Patrick; Sommer Michael; Marx Thilo; Markert Michael; Partsch Torsten; Hein Thomas; Schroegmeier Peter; Dietrich Stefan; Schoeniger Sabine; Weis Christian

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