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Dive into the research topics where Helga T. Danga is active.

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Featured researches published by Helga T. Danga.


Journal of Physics: Condensed Matter | 2018

Electrically active induced energy levels and metastability of B and N vacancy-complexes in 4H-SiC

Emmanuel Igumbor; Okikiola Olaniyan; Refilwe Edwin Mapasha; Helga T. Danga; Ezekiel Omotoso; W.E. Meyer

Electrically active induced energy levels in semiconductor devices could be beneficial to the discovery of an enhanced p or n-type semiconductor. Nitrogen (N) implanted into 4H-SiC is a high energy process that produced high defect concentrations which could be removed during dopant activation annealing. On the other hand, boron (B) substituted for silicon in SiC causes a reduction in the number of defects. This scenario leads to a decrease in the dielectric properties and induced deep donor and shallow acceptor levels. Complexes formed by the N, such as the nitrogen-vacancy centre, have been reported to play a significant role in the application of quantum bits. In this paper, results of charge states thermodynamic transition level of the N and B vacancy-complexes in 4H-SiC are presented. We explore complexes where substitutional N[Formula: see text]/N[Formula: see text] or B[Formula: see text]/B[Formula: see text] sits near a Si (V[Formula: see text]) or C (V[Formula: see text]) vacancy to form vacancy-complexes (N[Formula: see text]V[Formula: see text], N[Formula: see text]V[Formula: see text], N[Formula: see text]V[Formula: see text], N[Formula: see text]V[Formula: see text], B[Formula: see text]V[Formula: see text], B[Formula: see text]V[Formula: see text], B[Formula: see text]V[Formula: see text] and B[Formula: see text]V[Formula: see text]). The energies of formation of the N related vacancy-complexes showed the N[Formula: see text]V[Formula: see text] to be energetically stable close to the valence band maximum in its double positive charge state. The N[Formula: see text]V[Formula: see text] is more energetically stable in the double negative charge state close to the conduction band minimum. The N[Formula: see text]V[Formula: see text] on the other hand, induced double donor level and the N[Formula: see text]V[Formula: see text] induced a double acceptor level. For B related complexes, the B[Formula: see text]V[Formula: see text] and B[Formula: see text]V[Formula: see text] were energetically stable in their single positive charge state close to the valence band maximum. As the Fermi energy is varied across the band gap, the neutral and single negative charge states of the B[Formula: see text]V[Formula: see text] become more stable at different energy levels. B and N related complexes exhibited charge state controlled metastability behaviour.


Physica B-condensed Matter | 2016

Electrical characterisation of electron beam exposure induced defects in silicon

Helga T. Danga; Francois D Auret; Sergio M.M. Coelho; M. Diale


Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2017

Electrical characterization of defects induced by electron beam exposure in low doped n-GaAs

S.M. Tunhuma; F.D. Auret; Jackie M. Nel; Ezekiel Omotoso; Helga T. Danga; Emmanuel Igumbor; M. Diale


Physica B-condensed Matter | 2017

Comparison of nickel, cobalt, palladium, and tungsten Schottky contacts on n-4H-silicon carbide

V.E. Gora; A. Chawanda; C. Nyamhere; F.D. Auret; F. Mazunga; T. Jaure; B. Chibaya; Ezekiel Omotoso; Helga T. Danga; S.M. Tunhuma


Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2017

Thermal stability of defects introduced by electron beam deposition in p-type silicon

Helga T. Danga; F.D. Auret; S.M. Tunhuma; Ezekiel Omotoso; Emmanuel Igumbor; W.E. Meyer


Materials Science in Semiconductor Processing | 2019

Induced defect levels of P and Al vacancy-complexes in 4H-SiC: A hybrid functional study

Emmanuel Igumbor; Okikiola Olaniyan; Refilwe Edwin Mapasha; Helga T. Danga; Ezekiel Omotoso; W.E. Meyer


Surface & Coatings Technology | 2018

Electrical characterisation of deep level defects created by bombarding the n -type 4 H -SiC with 1.8 MeV protons

Ezekiel Omotoso; Alexander Tapera Paradzah; P.J. Janse van Rensburg; M. J. Legodi; F.D. Auret; Emmanuel Igumbor; Helga T. Danga; M. Diale; W.E. Meyer


Applied Physics A | 2018

The influence of thermal annealing on the characteristics of Au/Ni Schottky contacts on n-type 4H-SiC

Ezekiel Omotoso; F.D. Auret; Emmanuel Igumbor; S.M. Tunhuma; Helga T. Danga; P.N.M. Ngoepe; B. A. Taleatu; W.E. Meyer


Physica B-condensed Matter | 2017

Electrically active defects in p-type silicon after alpha-particle irradiation

Helga T. Danga; F. Danie Auret; S.M. Tunhuma; Ezekiel Omotoso; Emmanuel Igumbor; W.E. Meyer


Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2017

The effects of high-energy proton irradiation on the electrical characteristics of Au/Ni/4H-SiC Schottky barrier diodes

Ezekiel Omotoso; W.E. Meyer; P.J. Janse van Rensburg; Emmanuel Igumbor; S.M. Tunhuma; P.N.M. Ngoepe; Helga T. Danga; Francois D Auret

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W.E. Meyer

University of Pretoria

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F.D. Auret

University of Pretoria

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M. Diale

University of Pretoria

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