Hendricus J. M. Veendrick
Philips
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Publication
Featured researches published by Hendricus J. M. Veendrick.
international solid-state circuits conference | 2006
Violeta Petrescu; Marcel Pelgrom; Hendricus J. M. Veendrick; P. Pavithran; J. Wieling
A fully integrated signal-integrity self-test concept is implemented in a 90nm CMOS process. The outputs of different analog monitors are locally converted to digital form and then transported through a test-compatible scan chain. The temperature monitor has 4b resolution. The supply-noise monitor detects 10ps-wide pulses of 20mV. The total area overhead is <0.1%
Archive | 2009
Marcel Pelgrom; Hendricus J. M. Veendrick; Victor Zieren
Archive | 2006
Hendricus J. M. Veendrick; Atul Katoch
Archive | 2005
Praveen Pavithran; Marcel Pelgrom; Jean Wieling; Hendricus J. M. Veendrick
Archive | 2009
Victor Zieren; Harold Geradus Pieter Hendrikus Benten; Agnese Antonietta Maria Bargagli-Stoffi; Marcel Pelgrom; Hendricus J. M. Veendrick
Archive | 2004
Hendricus J. M. Veendrick
Archive | 2005
Hendricus J. M. Veendrick; Marcel Philips Int. Property Std. Pelgrom; Violeta Petrescu
Archive | 2004
Atul Katoch; Manish Garg; Evert Seevinck; Hendricus J. M. Veendrick
Archive | 2009
Hendricus J. M. Veendrick; Marcel Pelgrom; Victor Zieren
Archive | 1999
Hendricus J. M. Veendrick
