Herbert J. Erhardt
Eastman Kodak Company
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Featured researches published by Herbert J. Erhardt.
international conference on asic | 1994
R.M. Guidash; Paul P. Lee; J.M. Andrus; Antonio S. Ciccarelli; Herbert J. Erhardt; John Fischer; Eric J. Meisenzahl; Robert H. Philbrick; Goodwin Ting
A 2 /spl mu/m BiCMOS process module has been developed for incorporation into existing charge-coupled device (CCD) image sensor processes. The modular process architecture allows integration of CMOS, NPN bipolar or BiCMOS circuits without affecting the baseline CCD characteristics, and enables on-chip integration of desired analog and digital circuit functions with the image sensor. To our knowledge this is the first demonstration of high performance CCD, 2 /spl mu/m CMOS, and an isolated vertical NPN integrated on the same chip.<<ETX>>
IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology | 1995
R. Michael Guidash; Paul P. Lee; J. M. Andrus; Antonio S. Ciccarelli; Herbert J. Erhardt; John Fischer; Eric J. Meisenzahl; Robert H. Philbrick; Timothy J. Kenney
A 2 micrometers BiCMOS process module has been developed for incorporation into existing high performance 2-phase CCD processes, to enable integration of digital and analog circuits on- chip with the CCD image sensor. The modular process architecture allows the integration of CMOS, NPN bipolar or BiCMOS circuits without affecting the baseline CCD characteristics. A design of experiments approach was employed using process and device simulation tools and selected physical experiments, to optimize CMOS and NPN device performance and process latitude. Both enhancement and depletion mode Poly-1 and Poly-2 CMOS devices were realized and demonstrated good long channel behavior down to 1.6 micrometers drawn. A 12 V, 2.5 GHz, low collector resistance NPN was also produced. Experimental process splits were used to demonstrate and verify that the CMOS and NPN process module incorporation did not affect the CCD device characteristics or yield. CMOS circuit performance was found to be comparable to that of a standard 2 micrometers CMOS process. Finally, a trilinear sensor with on-chip timing generation and correlated double sample was designed and fabricated. To our knowledge this is the first demonstration of high performance CCD, 2 micrometers CMOS, and an isolated vertical NPN, integrated on the same chip.
Archive | 1992
Herbert J. Erhardt
Archive | 1989
Herbert J. Erhardt
Archive | 1990
Herbert J. Erhardt; Edward T. Nelson; Eric G. Stevens
Archive | 2010
Herbert J. Erhardt; Robert M. Guidash
Archive | 1995
Antonio S. Ciccarelli; Herbert J. Erhardt; Martin Potucek
Archive | 1990
Herbert J. Erhardt
Archive | 1990
Teh-Hsuang Lee; Herbert J. Erhardt
Archive | 1992
Constantine N. Anagnostopoulos; Herbert J. Erhardt; Eric G. Stevens; Robert H. Philbrick