Howard A. Padmore

Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins

The arrangement of spins at interfaces in a layered magnetic material often has an important effect on the properties of the material. One example of this is the directional coupling between the spins in an antiferromagnet and those in an adjacent ferromagnet, an effect first discovered in 1956 and referred to as exchange bias. Because of its technological importance for the development of advanced devices such as magnetic read heads and magnetic memory cells, this phenomenon has received much attention. Despite extensive studies, however, exchange bias is still poorly understood, largely due to the lack of techniques capable of providing detailed information about the arrangement of magnetic moments near interfaces. Here we present polarization-dependent X-ray magnetic dichroism spectro-microscopy that reveals the micromagnetic structure on both sides of a ferromagnetic–antiferromagnetic interface. Images of thin ferromagnetic Co films grown on antiferromagnetic LaFeO3 show a direct link between the arrangement of spins in each material. Remanent hysteresis loops, recorded for individual ferromagnetic domains, show a local exchange bias. Our results imply that the alignment of the ferromagnetic spins is determined, domain by domain, by the spin directions in the underlying antiferromagnetic layer.

Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis

We present the development and characterization of a dedicated resonant soft x-ray scattering facility. Capable of operation over a wide energy range, the beamline and endstation are primarily used for scattering from soft matter systems around the carbon K-edge (∼285 eV). We describe the specialized design of the instrument and characteristics of the beamline. Operational characteristics of immediate interest to users such as polarization control, degree of higher harmonic spectral contamination, and detector noise are delineated. Of special interest is the development of a higher harmonic rejection system that improves the spectral purity of the x-ray beam. Special software and a user-friendly interface have been implemented to allow real-time data processing and preliminary data analysis simultaneous with data acquisition.

Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films

Scanning X-ray microdiffraction (microSXRD) combines the use of high-brilliance synchrotron sources with the latest achromatic X-ray focusing optics and fast large-area two-dimensional-detector technology. Using white beams or a combination of white and monochromatic beams, this technique allows for the orientation and strain/stress mapping of polycrystalline thin films with submicrometer spatial resolution. The technique is described in detail as applied to the study of thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments. It is shown that there are significant orientation and strain/stress variations between grains and inside individual grains. A polycrystalline film when investigated at the granular (micrometer) level shows a highly mechanically inhomogeneous medium that allows insight into its mesoscopic properties. If the microSXRD data are averaged over a macroscopic range, results show good agreement with direct macroscopic texture and stress measurements.

Beamline 10.3.2 at ALS: a hard X-ray microprobe for environmental and materials sciences

Beamline 10.3.2 at the ALS is a bend-magnet line designed mostly for work on environmental problems involving heavy-metal speciation and location. It offers a unique combination of X-ray fluorescence mapping, X-ray microspectroscopy and micro-X-ray diffraction. The optics allow the user to trade spot size for flux in a size range of 5-17 microm in an energy range of 3-17 keV. The focusing uses a Kirkpatrick-Baez mirror pair to image a variable-size virtual source onto the sample. Thus, the user can reduce the effective size of the source, thereby reducing the spot size on the sample, at the cost of flux. This decoupling from the actual source also allows for some independence from source motion. The X-ray fluorescence mapping is performed with a continuously scanning stage which avoids the time overhead incurred by step-and-repeat mapping schemes. The special features of this beamline are described, and some scientific results shown.

A SAXS/WAXS/GISAXS Beamline with Multilayer Monochromator

We discuss the construction of a new SAXS/WAXS beamline at the Advanced Light Source at Lawrence Berkeley Laboratory. The beamline is equipped with a multilayer monochromator in order to obtain a high X-ray flux. The detrimental effects that the increased bandwidth transmitted by this monochromator could have on the data quality of the SAXS and WAXS patterns is shown to be negligible for the experimental program intended to be operated on this beamline.

Submicron X-ray diffraction and its applications to problems in materials and environmental science.

The availability of high brilliance third generation synchrotron sources together with progress in achromatic focusing optics allows us to add submicron spatial resolution to the conventional century-old x-ray diffraction technique. The new capabilities include the possibility to map in situ, grain orientations, crystalline phase distribution, and full strain/stress tensors at a very local level, by combining white and monochromatic x-ray microbeam diffraction. This is particularly relevant for high technology industry where the understanding of material properties at a microstructural level becomes increasingly important. After describing the latest advances in the submicron x-ray diffraction techniques at the Advanced Light Source, we will give some examples of its application in material science for the measurement of strain/stress in metallic thin films and interconnects. Its use in the field of environmental science will also be discussed.

Performance of the vacuum ultraviolet high-resolution and high-flux beamline for chemical dynamics studies at the Advanced Light Source

At the Advanced Light Source an undulator beamline, with an energy range from 6 to 30 eV, has been constructed for chemical dynamics experiments. The higher harmonics of the undulator are suppressed by a novel, windowless gas filter. In one branchline high-flux, 2% bandwidth radiation is directed toward an end station for photodissociation and crossed molecular-beam experiments. A photon flux of 1016 photon/s has been measured at this end station. In a second branchline a 6.65 m off-plane Eagle monochromator delivers narrow bandwidth radiation to an end station for photoionoization studies. At this second end station a peak flux of 3×1011 was observed for 25 000 resolving power. This monochromator has achieved a resolving power of 70 000 using a 4800 grooves/mm grating, one of the highest resolving powers obtained by a vacuum ultraviolet monochromator.

Photoemission electron microscope for the study of magnetic materials

The design of a high resolution photoemission electron microscope (PEEM) for the study of magnetic materials is described. PEEM is based on imaging the photoemitted (secondary) electrons from a sample irradiated by x rays. This microscope is permanently installed at the Advanced Light Source at a bending magnet that delivers linearly polarized, and left and right circularly polarized radiation in the soft x-ray range. The microscope can utilize several contrast mechanisms to study the surface and subsurface properties of materials. A wide range of contrast mechanisms can be utilized with this instrument to form topographical, elemental, chemical, magnetic circular and linear dichroism, and polarization contrast high resolution images. The electron optical properties of the microscope are described, and some first results are presented.

A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source

A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T superconducting bending magnet (superbend). This provides a hard x-ray spectrum from 5 to 22 keV and a flux within a 1 microm spot of approximately 5x10(9) photons/s (0.1% bandwidth at 8 keV). The radiation is relayed from the superbend source to a focus in the experimental hutch by a toroidal mirror. The focus spot is tailored by two pairs of adjustable slits, which serve as secondary source point. Inside the lead hutch, a pair of Kirkpatrick-Baez (KB) mirrors placed in a vacuum tank refocuses the secondary slit source onto the sample position. A new KB-bending mechanism with active temperature stabilization allows for more reproducible and stable mirror bending and thus mirror focusing. Focus spots around 1 microm are routinely achieved and allow a variety of experiments, which have in common the need of spatial resolution. The effective spatial resolution (approximately 0.2 microm) is limited by a convolution of beam size, scan-stage resolution, and stage stability. A four-bounce monochromator consisting of two channel-cut Si(111) crystals placed between the secondary source and KB-mirrors allows for easy changes between white-beam and monochromatic experiments while maintaining a fixed beam position. High resolution stage scans are performed while recording a fluorescence emission signal or an x-ray diffraction signal coming from either a monochromatic or a white focused beam. The former allows for elemental mapping, whereas the latter is used to produce two-dimensional maps of crystal-phases, -orientation, -texture, and -strain/stress. Typically achieved strain resolution is in the order of 5x10(-5) strain units. Accurate sample positioning in the x-ray focus spot is achieved with a commercial laser-triangulation unit. A Si-drift detector serves as a high-energy-resolution (approximately 150 eV full width at half maximum) fluorescence detector. Fluorescence scans can be collected in continuous scan mode with up to 300 pixels/s scan speed. A charge coupled device area detector is utilized as diffraction detector. Diffraction can be performed in reflecting or transmitting geometry. Diffraction data are processed using XMAS, an in-house written software package for Laue and monochromatic microdiffraction analysis.

PRINCIPLES OF X-RAY MAGNETIC DICHROISM SPECTROMICROSCOPY

A review is given of the principles underlying X-ray magnetic circular (XMCD) and linear (XMLD) dichroism spectromicroscopies consisting of polarized X-ray absorption spectroscopy in conjunction with scanning or imaging microscopy. The techniques are shown to have many useful and important capabilities for the study of complex magnetic materials. They offer elemental specificity, chemical specificity and variable depth sensitivity, among others. XMCD microscopy is best suited for the study of ferromagnets and ferrimagnets, and it allows a quantitative determination of the size and direction of spin and orbital moments. XMLD microscopy promises to become a powerful tool for the study of antiferromagnets which are difficult to study by conventional microscopy techniques.