Hyeonggeun Yu

Vertical Organic Field-Effect Transistors for Integrated Optoelectronic Applications.

Direct integration of a vertical organic field-effect transistor (VOFET) and an optoelectronic device offers a single stacked, low power optoelectronic VOFET with high aperture ratios. However, a functional optoelectronic VOFET could not be realized because of the difficulty in fabricating transparent source and gate electrodes. Here, we report a VOFET with an on/off ratio up to 10(5) as well as output current saturation by fabricating a transparent gate capacitor consisting of a perforated indium tin oxide (ITO) source electrode, HfO2 gate dielectric, and ITO gate electrode. Effects of the pore size and the pore depth within the porous ITO electrodes on the on/off characteristic of a VOFET are systematically explained in this work. By combining a phosphorescent organic light-emitting diode with an optimized VOFET structure, a vertical organic light-emitting transistor with a luminance on/off ratio of 10(4) can be fabricated.

Inorganic UV–Visible–SWIR Broadband Photodetector Based on Monodisperse PbS Nanocrystals

Solution-processed inorganic UV-visible short-wave-infrared photodetectors with light sensitivity from 350 nm to 2000 nm are fabricated using highly monodispersed large PbS NCs. These devices showed detectivity values over 1 × 10(11) Jones from 350 nm to 2000 nm, and a maximum detectivity value of 1.2 × 10(12) Jones at 1800 nm.

Photodetectors: Inorganic UV–Visible–SWIR Broadband Photodetector Based on Monodisperse PbS Nanocrystals (Small 10/2016)

Synthesis of highly mono-dispersed large PbS nanocrystals (NCs) with low particle size dispersion is demonstrated by F. So and co-workers on page 1328, by controlling the sulfur concentration below the nucleation threshold during multiple injections of the sulfur precursor. These NCs are used to fabricate multi-spectral photodetectors and high detectivity values in the UV-Visible-SWIR (short-wave-IR) wavelength range from 350 nm to 2000 nm are demonstrated.

All solution-processed inorganic/organic hybrid permeable metal-base transistor.

All solution-processed inorganic/organic hybrid permeable-base transistor (PMBT) based on nickel oxide emitter and P3HT collector is developed. Due to the high charge injection properties of nickel oxide and spontaneously formed nano-pinholes in the base electrode, the devices exhibit high common-base and common-emitter current gains up to 0.98 and 304, respectively with saturated output current.

Solution-processed copper oxide interlayers for broadband PbS quantum-dot photodiodes

Metal oxide interlayers are promising for optoelectronic applications due to solution processability, optical transparency, and excellent charge blocking properties. Highly efficient, air-stable quantum dot photodetectors have been reported using solution-processed metal oxide interlayers. However, the processing temperatures are high, significantly limiting their potential for roll-to-roll processing. Here, we report low temperature-processed broadband PbS quantum dot photodiodes by employing a solution-processed CuOx interlayer. The resulting photodiodes exhibit a low dark current of 10 nA cm−2 with a detectivity over 1013 Jones. Finally, we demonstrate a flexible inorganic photodiode on a polyethylene terephthalate substrate.

Transparent indium-tin oxide/indium-gallium-zinc oxide Schottky diodes formed by gradient oxygen doping

Amorphous InGaZnO (a-IGZO) is promising for transparent electronics due to its high carrier mobility and optical transparency. However, most metal/a-IGZO junctions are ohmic due to the Fermi-level pinning at the interface, restricting their device applications. Here, we report that indium-tin oxide/a-IGZO Schottky diodes can be formed by gradient oxygen doping in the a-IGZO layer that would otherwise form an ohmic contact. Making use of back-to-back a-IGZO Schottky junctions, a transparent IGZO permeable metal-base transistor is also demonstrated with a high common-base gain.

Enhanced piezoelectricity of thin film hafnia-zirconia (HZO) by inorganic flexible substrates

Hf0.5Zr0.5O2 (HZO) films are grown on rigid glass and flexible polyimide substrates using non-rapid thermal annealing. Films are comparatively investigated using macroscopic and local probe-based approaches to characterize their ferroelectric and piezoelectric properties. The polarization-electric field (P-E) measurements reveal that the ferroelectric characteristics of these thin films agree with the observed switchable piezoresponse hysteresis loops as well as electrically written, oppositely oriented domains. Moreover, the HZO thin films grown on flexible polyimide substrates display significantly enhanced piezoelectric response in comparison to the films grown on rigid substrates. This effect is likely due to improved domain wall motion caused by the mechanical release of the film-substrate couple. These findings suggest that inherently lead-free HZO thin films on flexible substrates are potential candidate materials for improved piezoelectric applications in wearable devices.Hf0.5Zr0.5O2 (HZO) films are grown on rigid glass and flexible polyimide substrates using non-rapid thermal annealing. Films are comparatively investigated using macroscopic and local probe-based approaches to characterize their ferroelectric and piezoelectric properties. The polarization-electric field (P-E) measurements reveal that the ferroelectric characteristics of these thin films agree with the observed switchable piezoresponse hysteresis loops as well as electrically written, oppositely oriented domains. Moreover, the HZO thin films grown on flexible polyimide substrates display significantly enhanced piezoelectric response in comparison to the films grown on rigid substrates. This effect is likely due to improved domain wall motion caused by the mechanical release of the film-substrate couple. These findings suggest that inherently lead-free HZO thin films on flexible substrates are potential candidate materials for improved piezoelectric applications in wearable devices.

Flexoelectricity in a metal/ferroelectric/semiconductor heterostructure

The flexoelectricity in a 100 nm-thick BaTiO3 (BTO) thin film based metal/ferroelectric insulator/semiconductor (MFS) heterostructure was reported in this letter. The transverse flexoelectric coefficient of the BTO thin film in the heterojunction structure was measured to be 287-418 μC/m at room temperature, and its temperature dependence shows that the flexoelectric effect in the BTO thin film was dominated in the paraelectric phase. We showed that the BTO thin film capacitance could be controlled at multi-levels by introducing ferroelectric and flexoelectric polarization in the film. These results are promising for understanding of the flexoelectricity in epitaxial ferroelectric thin films and practical applications of the enhanced flexoelectricity in nanoscale devices.

Sub-Band Gap Turn-On Near-Infrared-to-Visible Up-Conversion Device Enabled by an Organic–Inorganic Hybrid Perovskite Photovoltaic Absorber

Direct integration of an infrared (IR) photodetector with an organic light-emitting diode (OLED) enables low-cost, pixel-free IR imaging. However, the operation voltage of the resulting IR-to-visible up-conversion is large because of the series device architecture. Here, we report a low-voltage near-IR (NIR)-to-visible up-conversion device using formamidinium lead iodide as a NIR absorber integrated with a phosphorescent OLED. Because of the efficient photocarrier injection from the hybrid perovskite layer to the OLED, we observed a sub-band gap turn-on of the OLED under NIR illumination. The device showed a NIR-to-visible up-conversion efficiency of 3% and a luminance on/off ratio of 103 at only 5 V. Finally, we demonstrate pixel-free NIR imaging using the up-conversion device.