Jack E. Hetzner
Dow Chemical Company
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Featured researches published by Jack E. Hetzner.
IEEE Transactions on Advanced Packaging | 2000
Philip Garrou; D. Scheck; Jang-Hi Im; Jack E. Hetzner; Gregory Meyers; D. Hawn; Jiali Wu; M.B. Vincent; Ching-Ping Wong
The adhesion of several commercial underfills (Dexter Hysol FP4511, FP4527, and CNB775-34) to BCB (CYCLOTENE 4022, 4024) has been studied through die shear testing and subsequent failure analysis. Die shear values range between 69-30 MPa. Failure analysis by optical microscopy, profilometry and XPS spectroscopy indicates mixed mode failure at various interfaces. From the die shear data collected before and after 24 h water boil for Cyclotene 4022 and 4024 (with AP3000 adhesion promoter) and underfillers FP 4511 and 4527 we find the die shear strength decreases an average of 11% for the four comparisons. Adhesion promoters based on vinyltriacetoxysilane or 3-amino-propyltriethoxysilane show equivalent die shear performance. Substrate surface cleaning based on UV ozone treatment reveals oxidation of the BCB surface which by SIMS analysis remains <0.1 /spl mu/m deep after 10 min of treatment.
electronics packaging technology conference | 2004
Ying-Hung So; Edmund J. Stark; Shellene K. Thurston; Ted Stokich; Yongfu Li; Albert Achen; Jack E. Hetzner; Jang-hi Im; James Curphy; G. Gavit; Elvin Beach; Jason Folkenroth; A. Chakrabarti; D. Hawn; S. Mecca; C.C. de Biaugue
This work describes a positive-tone and aqueous-base-developable benzocyclobutene (BCB)-based dielectric material. The polymer is made from divinylsiloxane bis(benzocyclobutene) and BCB-acrylic acid. A diazonap-thoquinone in the formulation makes it photosensitive. Patterned films have high resolution, and via openings are scum-free without a de-scum operation. The material possesses optical, electrical, thermal, and mechanical properties desirable for many microelectronic applications, including as a planarization layer or an insulation layer in display, and in packaging.
IEEE Transactions on Advanced Packaging | 2006
Ying Hung So; Edmund J. Stark; Yongfu Li; Scott Kisting; Albert Achen; Kayla Baranek; Daniel Scheck; Jack E. Hetzner; Jason Folkenroth; Michael Töpper; Tobias Baumgartner
A positive-tone and aqueous-base-developable benzocyclobutene (BCB)-based dielectric material curable in air is described in this paper. The prepolymer is made from divinylsiloxane bisbenzocyclobutene (DVS-bisBCB) and BCB-acrylic acid. The formulation contains antioxidants that allow the prepolymer to cure in air and a diazonaphthaquinone to make it photosensitive. Patterned films have high resolution, and via openings are scum-free without a descum operation. Whether cured in nitrogen or in air, the prepolymer produces a film with optical, electrical, thermal, and mechanical properties desirable for many microelectronic applications, such as packaging applications and as a planarization or insulation layer in display applications
SID Symposium Digest of Technical Papers | 2006
Ying Hung So; Edmund J. Stark; Yongfu Li; Scott Kisting; Albert Achen; Kayla Baranek; Dan Scheck; Jack E. Hetzner; Elvin Beach; Jason Folkenroth
A self-priming and photosensitive aqueous-base-developable benzocyclobutene (BCB)-based dielectric material curable in air is described. Patterned films have high resolution. Whether cured in nitrogen or in air, the formulation produces a film with optical, electrical, thermal, and mechanical properties desirable for many microelectronic applications, such as a planarization layer or insulation layer in display applications.
Journal of Electronic Packaging | 2000
Jang-hi Im; Edward O. Shaffer; Theodore Stokich; Andrew Strandjord; Jack E. Hetzner; James Curphy; Cheryl Karas; Greg Meyers; D. Hawn; Ashok Chakrabarti; Steve Froelicher
Archive | 2004
Kiran K. Baikerikar; Shaoguang Feng; Jack E. Hetzner; John M Maher; Michael E. Mills; Paul J. Popa; Richard J. Strittmatter; Larry R. Wilson
Journal of Polymer Science Part A | 2006
Ying Hung So; Pamela S. Foster; Jang Hi Im; Philip E. Garrou; Jack E. Hetzner; Edmund J. Stark; Kayla Baranek
IEEE Transactions on Advanced Packaging | 2000
Philip Garrou; Dan Scheck; Jang-hi Im; Jack E. Hetzner; Gregory Meyers; D. Hawn; Jiali Wu; Michael Vincent; Ching-Ping Wong
International symposium on microelectronics | 2000
Ying-Hung So; Jang-Hi Im; Philip E. Garrou; Jack E. Hetzner; James Curphy; Britton Lee Kaliszewski; Dan Scheck; John Blackson; Michelle Patterson; Kaoru Ohba; Hideki Akimoto; Masahiko Kohno; Albert Achen
Archive | 2004
Kiran K. Baikerikar; Shaoguang Feng; Jack E. Hetzner; John M Maher; Michael E. Mills; Paul J. Popa; Richard J. Strittmatter; Larry R. Wilson