Jan Thim

Limitation of a Line-of-Light Online Paper Surface Measurement System

A new prototype device has been developed based on a laser triangulation principle to measure online surface topography in the paper and paperboard industries. It characterizes the surface in a wide spatial scale of topography from 0.09-10 mm. The prototypes technique projects a narrow lineof-light perpendicularly onto the moving paper-Web surface and scattered reflected light is collected at a low angle, low specular, and reduced coherent length onto the CCD sensors synchronized with the laser sources. The scattering phenomenon determines surface deviations in the z-direction. The full-width, at half-maximum of a laser line in cross section is sensitive in computation of the surface topography. The signal processing aspect of the image processing, for example, threshold and filtering algorithms are also sensitive in estimating the accurate surface features. Moreover, improper light illumination, intensity, reflection, occlusion, surface motion, and noise in the imaging sensor, and so forth, all contribute to deteriorate the measurements. Optical techniques measure the surface indirectly and, in general, an evaluation of the performance and the limitations of the technique are both essential and challenging. The paper describes the accuracy, uncertainty, and limitations of the developed technique in the raw profiles and in terms of the rms roughness. The achieved image subpixel resolution is 0.01 times a pixel. Statistically estimated uncertainty (2σ) in the laboratory environment was found 0.05 μm for a smooth sample, which provides a 95% confidence level in the rms roughness results. The depth of field of the prototype is ~2.4 mm.

Real Time Surface Measurement Technique in a Wide Range of Wavelengths Spectrum

Real time surface topography measurement in the paper and paperboard industries is a challenging research field. The existing online techniques measure only a small area of paper surface and estimate topographical irregularities in a narrow scale as a single predictor. Considering the limitations and complications in measuring the surface at high speed, a laser line triangulation technique is explored to measure surface topography in a wide scale. The developed technique is new for the paper and paperboard application that scans a line onto the paper-web surface up to 210 mm in length in the cross machine direction. The combination of a narrow laser linewidth imaging, a subpixel resolution, and the selection of a unique measurement location has made it possible to measure roughness and simultaneously characterize paper surface topography from 0.1 to 30 mm spatial wavelength. This spatial range covers wide scale surface properties such as roughness, cockling, and waviness. The technique clearly distinguishes and characterizes the surface of newspaper, and lightweight coated, coated, and uncoated paperboard in real time during the paper manufacturing process. The system temporal noise for the average roughness is estimated as 37 dB. The signal to noise ratio found is from 5.4 to 8.1 in the short spatial wavelength up to 1 mm, whereas it is more than 75 in the long spatial wavelength from 5 to 10 mm.

Investigation on the directional dark-field signals from paperboards using a grating interferometer

Recent advancements in the grating interferometer based Phase Contrast X-ray Imaging (PCXI) technique enables high quality dark-field images to be obtained using conventional X-ray tubes. The dark-field images map the scattering inhomogeneities inside objects. Since, the dark-field image is constructed by considering only those photons which are scattered while passing through the objects, it can reveal useful information about the object inner structures, such as, the fibre structures inside paperboards. The end-use performance of paperboards, such as the printing quality and the stiffness depends on the uniformity in the thickness and the structures of the coating layer of the paperboards. The uniformity in the coating layer is determined by the coating techniques, the coating materials and the topography of the base sheet. In this article, the dark-field signals from four paperboard samples with different quality indices are analysed. The isotropic and the anisotropic scattering coefficients for all of the samples have been calculated. Based on the correlation between the isotropic coefficients and the quality indices of the paperboards, a new method for paperboard quality measurement has been suggested.

Non-Destructive Method to Resolve the Core and the Coating on Paperboard by Spectroscopic X-ray Imaging

Quality control is an important issue in the paperboard industry. A typical sheet of paperboard contains a core of cellulose fibers [C6H10O5], coated on one or both sides with layers of calcium car ...

Suitable Post Processing Algorithms for X-Ray Imaging using Oversampled Displaced Multiple Images

X-ray imaging systems such as photon counting pixel detectors have a limited spatial resolution of the pixels, based on the complexity and processing technology of the readout electronics. For X-ray imaging situations where the features of interest are smaller than the imaging system pixel size, and the pixel size cannot be made smaller in the hardware, alternative means of resolution enhancement require to be considered. Oversampling with the usage of multiple displaced images, where the pixels of all images are mapped to a final resolution enhanced image, has proven a viable method of reaching a sub-pixel resolution exceeding the original resolution. The effectiveness of the oversampling method declines with the number of images taken, the sub-pixel resolution increases, but relative to a real reduction of imaging pixel sizes yielding a full resolution image, the perceived resolution from the sub-pixel oversampled image is lower. This is because the oversampling method introduces blurring noise into the mapped final images, and the blurring relative to full resolution images increases with the oversampling factor. One way of increasing the performance of the oversampling method is by sharpening the images in post processing. This paper focus on characterizing the performance increase of the oversampling method after the use of some suitable post processing filters, for digital X-ray images specifically. The results show that spatial domain filters and frequency domain filters of the same type yield indistinguishable results, which is to be expected. The results also show that the effectiveness of applying sharpening filters to oversampled multiple images increase with the number of images used (oversampling factor), leaving 60-80% of the original blurring noise after filtering a 6 x 6 mapped image (36 images taken), where the percentage is depending on the type of filter. This means that the effectiveness of the oversampling itself increase by using sharpening filters, and more images taken can be considered worth the effort.

X-ray imaging of high velocity moving objects by scanning summation using a single photon processing system

X-ray imaging has been used extensively in the manufacturing industry. In the paper and paperboard industry X-ray imaging has been used for measuring parameters such as coat weight, using mean values of X-ray absorption inline in the manufacturing machines. Recently, an interest has surfaced to image paperboard coating with pixel resolved images showing material distribution in the coating on the paperboard, and to do this inline in the paper machine. Naturally, imaging with pixel resolution in an application where the paperboard web travels with velocities in the order of 10 m/s sets harsh demands on the X-ray source and the detector system to be used. This paper presents a scanning imaging method for single photon imaging systems that lower the demands on the source flux by hundreds of times, enabling a system to be developed for high velocity industrial measurement applications. The paper presents the imaging method, a discussion of system limitations, simulations and real measurements in a laboratory environment with a moving test object of low velocity, all to verify the potential and limits of the proposed method.

Smart dosimetry by pattern recognition using a single photon counting detector system in time over threshold mode

The function of a dosimeter is to determine the absorbed dose of radiation, for those cases in which, generally, the particular type of radiation is already known. Lately, a number of applications have emerged in which all kinds of radiation are absorbed and are sorted by pattern recognition, such as the Medipix2 application in [1]. This form of smart dosimetry enables measurements where not only the total dosage is measured, but also the contributions of different types of radiation impacting upon the detector surface. Furthermore, the use of a photon counting system, where the energy deposition can be measured in each individual pixel, ensures measurements with a high degree of accuracy in relation to the pattern recognition. In this article a Timepix [2] detector system has been used in the creation of a smart dosimeter for Alpha, Beta and Gamma radiation. When a radioactive particle hits the detector surface it generates charge clusters and those impacting upon the detector surface are read out and image processing algorithms are then used to classify each charge cluster. The individual clusters are calculated and as a result, the dosage for each type of radiation is given. In some cases, several particles can impact in roughly the same place, forming overlapping clusters. In order to handle this problem, a cluster separation method has been added to the pattern recognition algorithm. When the clusters have been separated, they are classified by shape and sorted into the correct type of radiation. The algorithms and methods used in this dosimeter have been developed so as to be simple and computationally effective, in order to enable implementation on a portable device.