Jee-Soo Mok
Samsung Electro-Mechanics
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Publication
Featured researches published by Jee-Soo Mok.
Circuit World | 2005
Tae Hoon Kim; Jee-Soo Mok; Chang-Kyu Song; Jun-Heyoung Park; KyungO Kim; Ben Sun; Byung-Youl Min
Purpose – To review a newly developed PCB fabrication process based on a parallel lamination technique.Design/methodology/approach – This paper has been written to introduce the SAVIA process, a new parallel lamination technique for PCB fabrication. The basic concept of the SAVIA process has been described along with the individual process steps and the reliability issues. The advantages of SAVIA process have been also discussed in both economical and technological aspects.Findings – It was found that the parallel lamination technique, a key process for SAVIA, was not only highly flexible and reliable but also a cost‐effective fabrication method for high performance PCB. With the SAVIA process, manufacturing lead‐times can be substantially reduced due to the nature of the parallel processing. It was also confirmed that a highly reliable metal alloy interconnection was created between the core and the adhesive layers during the lamination process. The formed metal alloy contacts showed excellent electrical...
Archive | 2008
Jee-Soo Mok; Jun-Heyoung Park
Archive | 2003
Jee-Soo Mok; Jang-Kyu Kang; Chang-Hyun Nam
Archive | 2008
Eung-Suek Lee; Seung-Hyun Baik; Young-Jin Kim; Young-Seok Oh; Jae-Boong Choi; Dae-Woo Suh; Je-Gwang Yoo; Chang-Sup Ryu; Jun-Oh Hwang; Jee-Soo Mok
Archive | 2008
Jee-Soo Mok; Jun-Heyoung Park; Ki-Hwan Kim; Sung-Yong Kim
Archive | 2007
Jee-Soo Mok; Chang-Sup Ryu; Dong-jin Park
Archive | 2004
Jee-Soo Mok; Byung-Kook Sun; Chang-Kyu Song; Jun-Heyoung Park; Duck-Young Maeng; Tae Hoon Kim
Archive | 2008
Eung-Suek Lee; Je-Gwang Yoo; Chang-Sup Ryu; Jun-Oh Hwang; Tae-Eun Chang; Jee-Soo Mok
Archive | 2003
Jee-Soo Mok; Byung-Kook Sun; Chang-Kyu Song; Geum-Hee Yun; Tae Hoon Kim
Archive | 2008
Jee-Soo Mok; Chang-Sup Ryu; Eung-Suek Lee; Youn-Soo Seo; Hee-Bum Shin; Yoong Oh; Byung-Bae Seo; Tae Kyoung Kim; Dong-jin Park