Joerg Appenzeller

High Performance Multilayer MoS2 Transistors with Scandium Contacts

While there has been growing interest in two-dimensional (2-D) crystals other than graphene, evaluating their potential usefulness for electronic applications is still in its infancy due to the lack of a complete picture of their performance potential. The focus of this article is on contacts. We demonstrate that through a proper understanding and design of source/drain contacts and the right choice of number of MoS(2) layers the excellent intrinsic properties of this 2-D material can be harvested. Using scandium contacts on 10-nm-thick exfoliated MoS(2) flakes that are covered by a 15 nm Al(2)O(3) film, high effective mobilities of 700 cm(2)/(V s) are achieved at room temperature. This breakthrough is largely attributed to the fact that we succeeded in eliminating contact resistance effects that limited the device performance in the past unrecognized. In fact, the apparent linear dependence of current on drain voltage had mislead researchers to believe that a truly Ohmic contact had already been achieved, a misconception that we also elucidate in the present article.

Vertical scaling of carbon nanotube field-effect transistors using top gate electrodes

We have fabricated single-wall carbon nanotube field-effect transistors (CNFETs) in a conventional metal–oxide–semiconductor field-effect transistor (MOSFET) structure, with gate electrodes above the conduction channel separated from the channel by a thin dielectric. These top gate devices exhibit excellent electrical characteristics, including steep subthreshold slope and high transconductance, at gate voltages close to 1 V—a significant improvement relative to previously reported CNFETs which used the substrate as a gate and a thicker gate dielectric. Our measured device performance also compares very well to state-of-the-art silicon devices. These results are observed for both p- and n-type devices, and they suggest that CNFETs may be competitive with Si MOSFETs for future nanoelectronic applications.

Carbon nanotube electronics

We briefly review the electronic properties of carbon nanotubes (CNTs) and present results on the fabrication and characteristics of carbon nanotube field-effect transistors (CNTFETs) and simple integrated circuits. A novel approach allowing the catalyst-free synthesis of oriented CNTs is also presented.

Controlling doping and carrier injection in carbon nanotube transistors

Carbon nanotube field-effect transistors (CNTFETs) fabricated out of as-grown nanotubes are unipolar p-type devices. Two methods for their conversion from p- to n-type devices are presented. The first method involves conventional doping with an electron donor, while the second consists of annealing the contacts in vacuum to remove adsorbed oxygen. A comparison of these methods shows fundamental differences in the mechanism of the transformation. The key finding is that the main effect of oxygen adsorption is not to dope the bulk of the tube, but to modify the barriers at the metal–semiconductor contacts. The oxygen concentration and the level of doping of the nanotube are therefore complementary in controlling the CNTFET characteristics. Finally, a method of controlling individually the contact barriers by local heating is demonstrated.

An Integrated Logic Circuit Assembled on a Single Carbon Nanotube

Single-walled carbon nanotubes (SWCNTs) have been shown to exhibit excellent electrical properties, such as ballistic transport over several hundred nanometers at room temperature. Field-effect transistors (FETs) made from individual tubes show dc performance specifications rivaling those of state-of-the-art silicon devices. An important next step is the fabrication of integrated circuits on SWCNTs to study the high-frequency ac capabilities of SWCNTs. We built a five-stage ring oscillator that comprises, in total, 12 FETs side by side along the length of an individual carbon nanotube. A complementary metal-oxide semiconductor‐type architecture was achieved by adjusting the gate work functions of the individual p-type and n-type FETs used.

High-performance carbon nanotube field-effect transistor with tunable polarities

State-of-the-art carbon nanotube field-effect transistors (CNFETs) behave as Schottky-barrier-modulated transistors. It is known that vertical scaling of the gate oxide significantly improves the performance of these devices. However, decreasing the oxide thickness also results in pronounced ambipolar transistor characteristics and increased drain leakage currents. Using a novel device concept, we have fabricated high-performance enhancement-mode CNFETs exhibiting n- or p-type unipolar behavior, tunable by electrostatic and/or chemical doping, with excellent OFF-state performance and a steep subthreshold swing (S=63 mV/dec). The device design allows for aggressive oxide thickness and gate-length scaling while maintaining the desired device characteristics.

Carbon Nanotubes for High-Performance Electronics—Progress and Prospect

Carbon nanotube devices offer intrinsic advantages for high-performance logic device applications. The ultrasmall body of a carbon nanotube-the tube diameter-is the key feature that should allow aggressive channel length scaling, while the intrinsic transport properties of the nanotube ensure at the same time high on-currents. In addition, the narrowness of the tube is critical to implementation of novel device concepts like the tunneling transistor. By understanding the unique capabilities of carbon nanotubes and using them in unconventional designs, novel nanoelectronic applications may become feasible. However, much better control of materials quality must be obtained, and new fabrication processes must be developed before such applications can be realized.

Toward Nanowire Electronics

This paper discusses the electronic transport properties of nanowire field-effect transistors (NW-FETs). Four different device concepts are studied in detail: Schottky-barrier NW-FETs with metallic source and drain contacts, conventional-type NW-FETs with doped NW segments as source and drain electrodes, and, finally, two new concepts that enable steep turn-on characteristics, namely, NW impact ionization FETs and tunnel NW-FETs. As it turns out, NW-FETs are, to a large extent, determined by the device geometry, the dimensionality of the electronic transport, and the way of making contacts to the NW. Analytical as well as simulation results are compared with experimental data to explain the various factors impacting the electronic transport in NW-FETs.

Screening and Interlayer Coupling in Multilayer Graphene Field-Effect Transistors

With the motivation of improving the performance and reliability of aggressively scaled nanopatterned graphene field-effect transistors, we present the first systematic experimental study on charge and current distribution in multilayer graphene field-effect transistors. We find a very particular thickness dependence for I(on), I(off), and the I(on)/I(off) ratio and propose a resistor network model including screening and interlayer coupling to explain the experimental findings. In particular, our model does not invoke modification of the linear energy-band structure of graphene for the multilayer case. Noise reduction in nanoscale few-layer graphene transistors is experimentally demonstrated and can be understood within this model as well.

WSe2 field effect transistors with enhanced ambipolar characteristics

One of the most relevant features that a semiconducting channel material can offer when used in a field-effect transistor (FET) layout is its capability to enable both electron transport in the conduction band and hole transport in the valence band. In this way, complementary metal-oxide-semiconductor type applications become feasible once similar electron and hole drive current densities are achieved, and the threshold voltages are properly adjusted. In this article, we demonstrate pronounced ambipolar device characteristics of multilayer WSe2 FETs using different contact electrodes. Our study reveals that nickel electrodes facilitate electron injection while palladium electrodes are more efficient for hole injection. We also show, as an interesting demonstration, that by using nickel as the source contact electrode and palladium as the drain contact electrode, ambipolar device characteristics with similar on-state performance for both the electron and the hole branch can be achieved in WSe2 FETs. Finall...