Jong-Won Hong
Samsung
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Jong-Won Hong.
advanced semiconductor manufacturing conference | 2008
B.J. Hwang; Jang-Ho Park; So-wi Jin; Minjeong Kim; Jaesuk Jung; Byungho Kwon; Jong-Won Hong; Jeehoon Han; Dong-Hwa Kwak; Jae-Kwan Park; Jung-Dai Choi; Won-Seong Lee
In order to develop high density NAND flash device, the increased number of cell strings for 1 page buffer forces to form a long bit-line with low sheet resistance, as well as low parasitic capacitance between bit-lines. In this paper, we secured a copper damascene process to form 38 nm bit-lines with 76 nm pitch using SADP (self-aligned double patterning) process. The methods to minimize the sheet resistance and to suppress the parasitic capacitance were explained on NAND flash device with 38 nm node technology.
international conference on vacuum microelectronics | 1997
Jong-Won Hong; J.E. Jang; Y.W. Jin; J.E. Jung; Y.S. Ryu; H.W. Lee; J. M. Kim
Low voltage phosphors for the application to prototype 4-inch full color field emission display devices was successfully deposited on indium-tin oxide (ITO) glasses by utilizing an electrophoretic method. The electrophoretic suspension used consisted of each color phosphor of 1 -3um size, isopropyl alcohol (IPA), charger and binder. The deposition rate of each color phosphor was systematically investigated by changing deposition time and applied voltages under conditions of various nitrate salts, such as Mg(N03)2, La(NO3)2 and AI(N03)2. The brightness of each deposited phosphor were analyzed both in the vacuum chamber and in fully-sealed environment. Experimental results significantly exhibit uniform thickness of about 4-9um thickness over the whole 4 inch glass plate, depending on electrical properties of each color phosphor.
international conference on vacuum microelectronics | 1997
Andrei Zoulkarneev; N.S. Park; Jong-Won Hong; J.M. Kim
Vacuum properties of a field emission display (FED) device are calculated using a MonteCarlo method, The calculation is based on molecular flow conductance inside the FED panel with the exhausting pipe. This simulation result exhibits extremely low value of the conductance, resulting in pressure increase inside the panel by several orders of magnitude, even though large separation distance of the exhausting pipe is allowed, like few centimeters.
Archive | 2010
Byoung-Keon Park; Tae-Hoon Yang; Jin-Wook Seo; Ki-Yong Lee; Maxim Lisachenko; Bo-Kyung Choi; Dae-Woo Lee; Kil-won Lee; Dong-Hyun Lee; Jong-Ryuk Park; Ji-Su Ahn; Young-dae Kim; Heung-Yeol Na; Min-Jae Jeong; Yun-Mo Chung; Jong-Won Hong; Eu-Gene Kang; Seok-rak Chang; Jae-Wan Jung; Sang-Yon Yoon
Archive | 2010
Yong Sup Choi; Myeng-Woo Nam; Jong-Won Hong; Seok-rak Chang; Eun-Sun Choi
Archive | 2012
Seok-rak Chang; Myeng-Woo Nam; Hee-Cheol Kang; Jong-Heon Kim; Jong-Won Hong; Uno Chang
Archive | 2008
Jong-Won Hong; Eu-Gene Kang; Si-Young Park
Archive | 2011
Jong-Won Hong; Geumjung Seong; Jong-Myeong Lee; Hyun-Bae Lee; Bonghyun Choi
Archive | 2008
Kyung-In Choi; Hyun-Bae Lee; Gil-heyun Choi; Jong-Myeong Lee; Jong-Won Hong
Archive | 2008
Kyung-In Choi; Gil-heyun Choi; Hyun-Bae Lee; Jong-Won Hong; Jong-Myeong Lee