Juan Carlos Baraza
Polytechnic University of Valencia
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Publication
Featured researches published by Juan Carlos Baraza.
defect and fault tolerance in vlsi and nanotechnology systems | 2001
Joaquin Gracia; Juan Carlos Baraza; Daniel Gil; Pedro J. Gil
Compares different VHDL-based fault injection techniques: simulator commands, saboteurs and mutants for the validation of fault tolerant systems. Some extensions and implementation designs of these techniques have been introduced. Also, a wide set of non-usual fault models have been implemented. As an application, a fault tolerant microcomputer system has been validated. Faults have been injected using an injection tool developed by the GSTF. We have injected both transient and permanent faults on the system model, using two different workloads. We have studied the pathology of the propagated errors, measured their latencies, and calculated both detection and recovery coverages. Preliminary results show that coverages for transient faults can be obtained quite accurately with any of the three techniques. This enables the use of different abstraction level models for the same system. We have also verified significant differences in implementation and simulation cost between the studied injection techniques.
Journal of Systems Architecture | 2002
Juan Carlos Baraza; Joaquin Gracia; Daniel Gil; Pedro J. Gil
This paper presents the prototype of an automatic and model-independent fault injection tool, to be used on an IBM-PC (or compatible) platform. The tool has been built around a commercial VHDL simulator and it is thought to implement different fault injection techniques. With this tool, a wide range of transient and permanent faults can be injected into medium-complexity models. Another remarkable aspect of the tool is the fact that it can analyse the results obtained from injection campaigns, in order to study the Error Syndrome of the system model and/or validate its fault-tolerance mechanisms. Some results of various fault injection campaigns carried out to validate the Dependability of a fault-tolerant microcomputer system are shown. We have analysed the pathology of the propagated errors, measured their latencies, and calculated both error detection and recovery latencies and coverages.
high level design validation and test | 2005
Juan Carlos Baraza; Joaquin Gracia; Daniel Gil; Pedro J. Gil
Fault injection techniques based on the use of VHDL as design language offer important advantages with regard to other fault injection techniques. First, as they can be applied during the design phase of the system, they allow reducing the time-to-market. Second, this type of techniques presents high controllability and reachability. Among the different techniques, those based on the use of saboteurs and mutants are especially attractive due to their high capability of fault modeling. However, it is difficult to implement automatically these techniques in a fault injection tool, mainly the insertion of saboteurs and the generation of mutants. In this paper, we present new models of saboteurs and mutants that can be easily applicable in VFIT, a fault injection tool developed by the Fault-Tolerant Systems Research Group (GSTF) of the Technical University of Valencia.
european dependable computing conference | 1999
Daniel Gil; Rafael J. Martínez; Jose Vicente Busquets; Juan Carlos Baraza; Pedro J. Gil
This work presents a campaign of fault injection to validate the dependability of a fault tolerant microcomputer system. The system is duplex with cold stand-by sparing, parity detection and a watchdog timer. The faults have been injected on a chip-level VHDL model, using an injection tool designed with this purpose. We have carried out a set of injection experiments (with 3000 injections each), injecting transient and permanent faults of types stuck-at, open-line and indetermination on both the signals and variables of the system, running a workload. We have analysed the pathology of the propagated errors, measured their latency, and calculated both detection and recovery coverage. We have also studied the influence with the fault duration and fault distribution. For instance, system detection coverage (including noneffective faults) is 98% and the system recovery coverage is 95% for short transient faults (0.1 clock cycles).
international on-line testing symposium | 2000
Daniel Gil; Joaquin Gracia; Juan Carlos Baraza; Pedro J. Gil
This work presents a campaign of fault injection to validate the dependability of a fault tolerant microcomputer system. The system is duplex with cold stand-by sparing, parity detection and a watchdog timer. The faults have been injected on a chip-level VHDL model, using an injection tool designed for this purpose. We have carried out a set of injection experiments (with 3000 injections each), injecting transient faults of types stuck-at, bit-flip, indetermination and delay on both the signals and variables of the system, running two different workloads. We have analysed the pathology of the propagated errors, measured their latency, and calculated both detection and recovery coverage. For instance, system detection coverages (including non-effective errors) up to 98%, and system recovery coverage up to 94% have been obtained for short transient faults.
Archive | 2003
Daniel Gil; Juan Carlos Baraza; Joaquin Gracia; Pedro J. Gil
This chapter presents an overview of some principal VHDL simulation-based fault injection techniques. Significant designs and tools, as well as their advantages and drawbacks, are shown. Also, VFIT, a VHDL simulation-based fault injection tool developed by the GSTF (Fault Tolerant Systems Group — Polytechnic University of Valencia) to run on a PC platform, is described. Finally, an example of application of VFIT to validate the dependability of a fault-tolerant microcomputer system is shown. We have studied the pathology of the propagated errors, measured their latencies, and calculated both detection and recovery coverages.
Microelectronics Journal | 2003
Daniel Gil; Joaquin Gracia; Juan Carlos Baraza; Pedro J. Gil
In this work different VHDL-based fault injection techniques (simulator commands, saboteurs and mutants) have been compared and applied in the validation of a fault-tolerant system. Some extensions and implementation designs of these techniques have been introduced. As a complement of these injection techniques, a wide set of fault models (including several non-usual models) have been implemented. We have injected both transient and permanent faults on the system model, using two different workloads, with the help of a fault injection tool that we have developed. We have studied the pathology of the propagated errors, measured their latencies, and calculated both detection and recovery coverages. Results show that coverages for transient faults can be obtained quite accurately with any of the three techniques. This enables the use of different abstraction level models for the same system. We have also verified significant differences in implementation and simulation cost between the studied injection techniques. q 2002 Elsevier Science Ltd. All rights reserved.
defect and fault tolerance in vlsi and nanotechnology systems | 2000
Juan Carlos Baraza; Joaquin Gracia; Daniel Gil; Pedro J. Gil
This paper presents the prototype of an automatic and model-independent fault injection tool, to use on an IBM-PC (or compatible) platform. The tool has been built around a commercial VHDL simulator. With this tool, both transient and permanent faults, of a wide range of types, can be injected into medium-complexity models. Another remarkable aspect of the tool is the fact that it is able to analyse the results obtained from the injection campaigns, in order to study the error syndrome of the system model and/or validate its fault-tolerance mechanisms. Some results of a fault injection campaign carried out to validate the dependability of a fault tolerant microcomputer system are shown. We have analysed the pathology of the propagated errors, measured their latencies, and calculated both error detection and recovery latencies and coverages.
dependable systems and networks | 2010
Joaquín Gracia-Morán; Daniel Gil-Tomás; Luis J. Saiz-Adalid; Juan Carlos Baraza; Pedro J. Gil-Vicente
As technologies shrink, new kinds of faults arise. Intermittent faults are part of these new faults. They are expected to be an increasing challenge in modern VLSI circuits. Up to now, transient and permanent faults used to be injected for the experimental validation of fault tolerance mechanisms. The main objective of this work is to improve the dependability assessment by injecting also intermittent faults. Furthermore, we have compared intermittent faults impact with the influence of transient and permanent faults. To carry out this study, we have injected bursts of intermittent faults in a fault-tolerant microcomputer system with some well known fault detection and recovery mechanisms. The methodology used lies in VHDL-Based Fault Injection technique, which allows a systematic and exhaustive analysis. Results show that intermittent faults have a notable impact on recovery mechanisms. They must be taken into account besides permanent and transient faults to implement an accurate dependability assessment.
european dependable computing conference | 2005
Daniel Gil; Joaquin Gracia; Juan Carlos Baraza; Pedro J. Gil
This work shows that faults affecting the combinational logic embedded in a microcontroller can propagate to register elements and may have an important impact over applications, even in the most favourable case of short transient faults. Using VHDL-based fault injection techniques, we have experienced that the percentage of propagated faults, and thus their influence in the microcontroller upper layers, increases as clock frequencies rise. Experiments confirm that single faults can corrupt a number of registers at a time, this number being greater as the duration of the fault increases. From the application viewpoint, results show that, in some cases, faults can lead applications to fail in more than 80% of the cases, which suggests the need of improving the error detection and recovery mechanisms of existing commercial microcontrollers.