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Dive into the research topics where Jun Ohtani is active.

Publication


Featured researches published by Jun Ohtani.


custom integrated circuits conference | 2001

A shared built-in self-repair analysis for multiple embedded memories

Jun Ohtani; Tukasa Ooishi; Tomoya Kawagoe; Mitsutaka Niiro; Masanao Maruta; Hideto Hidaka

A shared built-in self-repair analysis scheme (Shared-BISA) for multiple embedded memory cores in the SOC is proposed to realize minimum area penalty independent of the number of embedded memory cores. A compact reconfigurable CAM array in the BISA circuitry realizes a flexible redundancy analysis structure to cope with various memory core and redundancy structures, and a high-speed operation up to 500 MHz.


IEEE Journal of Solid-state Circuits | 1996

A 90-MHz 16-Mb system integrated memory with direct interface to CPU

Katsumi Dosaka; Akira Yamazaki; Naoya Watanabe; Hideaki Abe; Jun Ohtani; Toshiyuki Ogawa; Kazunori Ishihara; Masaki Kumanoya

This paper describes a system integrated memory with direct interface to CPU which integrates an SRAM, a DRAM and control circuitry including a TAG. This system memory realizes a computer system without glue chips. Thus, this system memory brings a computer system which is low cost, low power and compact size with sufficient performance. The maximum operating frequency is 90 MHz and the operating current at cache hit is 156 mA.


Archive | 1994

Clock synchronous semiconductor memory device

Jun Ohtani; Akira Yamazaki; Katsumi Dosaka


Archive | 2001

Semiconductor integrated circuit device capable of self-analyzing redundancy replacement adapting to capacities of plural memory circuits integrated therein

Jun Ohtani; Tsukasa Ooishi; Hideto Hidaka; Tomoya Kawagoe


Archive | 1997

Clock synchronous semiconductor memory device for determining an operation mode

Jun Ohtani; Akira Yamazaki; Katsumi Dosaka


Archive | 1999

Semiconductor device capable of reducing cost of analysis for finding replacement address in memory array

Jun Ohtani; Mitsuhiro Hamada


Archive | 2002

Semiconductor integrated circuit device provided with a self-testing circuit for carrying out an analysis for repair by using a redundant memory cell

Jun Ohtani; Tomoya Kawagoe


Archive | 1999

Memory integrated circuit device including a memory having a configuration suitable for mixture with logic

Jun Ohtani; Akira Yamazaki; Naoto Okumura; Takashi Higuchi


Archive | 1999

Testing apparatus for semiconductor memory device

Mitsuhiro Hamada; Jun Ohtani


Archive | 2001

Semiconductor memory device allowing spare memory cell to be tested efficiently

Jun Ohtani; Katsumi Dosaka

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