Jun Yamawaku
Tokyo Electron
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Publication
Featured researches published by Jun Yamawaku.
international symposium on semiconductor manufacturing | 2006
Tsuyoshi Moriya; Jun Yamawaku; Yoshitaka Ryu; Hiroshi Nagaike; Hideaki Yakushiji
New type defects which are nanometer-thickness stellar shape defects called as the stellar defects are reported. Since the stellar defects need the center particle and the water to form, we successfully have reduced the stellar defects by reducing the particles and humidity in the chamber. These very thin defects must be key issues in the processes that we have to control nanometer thickness.
international symposium on semiconductor manufacturing | 2007
Jun Yamawaku; Tsuyoshi Moriya; Yoshitaka Ryu; Kazumasa Abe; Hideki Yakushiji; Yuki Hosaka; Chie Kato
Water residues become a serious problem in semiconductor manufacturing systems. In this paper, one of the methods to dehumidify in process chamber is proposed and demonstrated. With this technique, conventional evacuation time can be improved by 2times to 3times. We also demonstrated influence of water adsorbed on wafer.
Archive | 2013
Jun Yamawaku; Chishio Koshimizu; Mitsuhiro Tachibana; Hitoshi Kato; Takeshi Kobayashi; Shigehiro Miura; Takafumi Kimura
Archive | 2010
Chishio Koshimizu; Jun Yamawaku; Tatsuo Matsudo; Masashi Saito
Archive | 2008
Jun Yamawaku; Tsuyoshi Moriya
Archive | 2011
Jun Yamawaku; Chishio Koshimizu; Tatsuo Matsudo
Archive | 2013
Jun Yamawaku; Chishio Koshimizu; Yohei Yamazawa; Mitsuhiro Tachibana; Hitoshi Kato; Takeshi Kobayashi; Shigehiro Miura; Takafumi Kimura
Archive | 2012
Jun Yamawaku; Chishio Koshimizu; Tatsuo Matsudo
Archive | 2010
Jun Yamawaku; Junji Oikawa; Hiroyuki Nakayama
Archive | 2010
Osamu Akiyama; Masashi Akimoto; Tsuyoshi Moriya; Jun Yamawaku