Kakutaro Suda
Mitsubishi
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Publication
Featured researches published by Kakutaro Suda.
IEEE Journal of Solid-state Circuits | 1996
Kiniio Ueda; Hiroaki Suzuki; Kakutaro Suda; Hirofumi Shinohara; Koichiro Mashiko
This paper describes a 64-bit two-stage carry look ahead adder utilizing pass transistor BiCMOS gate. The new pass transistor BiCMOS gate has a smaller intrinsic delay time than conventional BiCMOS gates. Furthermore, this gate has a rail-to-rail output voltage. Therefore the next gate does not have a large degradation of its driving capability. The exclusive OR and NOR gate using the pass transistor BiCMOS gate shows a speed advantage over CMOS gates under a wide variance in load capacitance. The pass transistor BiCMOS gates were applied to full adders, carry path circuits, and carry select circuits. In consequence, a 64-bit two-stage carry look ahead adder was fabricated using a 0.5 /spl mu/m BiCMOS process with single polysilicon and double-metal interconnections. A critical path delay time of 3.5 ns was observed at a supply voltage of 3.3 V. This is 25% better than the result of the adder circuit using CMOS technology. Even at the supply voltage of 2.0 V, this adder is faster than the CMOS adder.
IEEE Journal of Solid-state Circuits | 1991
Yasunobu Nakase; Kakutaro Suda; Koichiro Mashiko; Tatsuhiko Ikeda; S. Kayano
A reduced word-line voltage swing (RWS) circuit configuration that results in a high-speed bipolar ECL (emitter coupled logic) RAM is proposed. The write operation can be performed with the configuration in the condition of reduced word-line voltage swing, which causes write operation error in conventional circuit configurations. The proposed configuration cuts off the hold current of the selected memory cell, and then the low-voltage node is charged up through the load p-n-p transistor. A 16-kb ECL RAM with a p-n-p loaded memory cell was fabricated by advanced silicide-base transistor (ASBT) process technology. A 2-ns access time was obtained with 1.8-W power consumption in which the word-line voltage swing was reduced by 0.7 V from a conventional case. Simulation results show that the access time is improved by 25% compared with a conventional case. Simulation results also show that writing time becomes comparable with the conventional time of 1.7 ns when the load p-n-p transistor has a saturation current of 5.0* 10/sup 17/ A and a current gain of 1.0. The saturation current is 5 times larger and the current gain is 5 times smaller than those of the standard lateral p-n-p transistor. >
Archive | 1986
Kakutaro Suda; Tadashi Hirao
Archive | 1986
Kakutaro Suda; Tadashi Hirao
Archive | 2001
Yuichi Sakai; Hiroyuki Chibahara; Masanobu Iwasaki; Kakutaro Suda
Archive | 1987
Kakutaro Suda
Archive | 1997
Takayuki Igarashi; Kakutaro Suda; Yoshitaka Ohtsu
Archive | 1990
Toru Shiomi; Kakutaro Suda; Tetsuo Higuchi
Archive | 2001
Kakutaro Suda
Archive | 1989
Kakutaro Suda