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Dive into the research topics where Kevin Peterlinz is active.

Publication


Featured researches published by Kevin Peterlinz.


Archive | 2012

Dynamically Adjustable Semiconductor Metrology System

David Y. Wang; Guorong Vera Zhuang; Johannes D. De Veer; Kevin Peterlinz; Shankar Krishnan


Archive | 2014

METHOD OF ELECTROMAGNETIC MODELING OF FINITE STRUCTURES AND FINITE ILLUMINATION FOR METROLOGY AND INSPECTION

Alexander Kuznetsov; Kevin Peterlinz; Andrei V. Shchegrov; Leonid Poslavsky; Xuefeng Liu


Archive | 2013

Combined x-ray and optical metrology

Kevin Peterlinz; Andrei V. Shchegrov; Michael S. Bakeman; Thaddeus Gerard Dziura


Archive | 2012

Optical metrology tool equipped with modulated illumination sources

Andrei V. Shchegrov; Lawrence D. Rotter; David Y. Wang; Andrei Veldman; Kevin Peterlinz; Gregory Brady; Derrick Shaughnessy


Archive | 2014

Measurement Of Multiple Patterning Parameters

Andrei V. Shchegrov; Shankar Krishnan; Kevin Peterlinz; Thaddeus Gerard Dziura; Noam Sapiens; Stilian Ivanov Pandev


Archive | 2013

Apparatus And Method Of Measuring Roughness And Other Parameters Of A Structure

Andrei V. Shchegrov; Gregory Brady; Kevin Peterlinz


Archive | 2014

Metrology Tool With Combined XRF And SAXS Capabilities

Michael S. Bakeman; Andrei V. Shchegrov; Kevin Peterlinz; Thaddeus Gerard Dziura


Archive | 2017

Spectroscopic beam profile overlay metrology

Jiyou Fu; Noam Sapiens; Kevin Peterlinz; Stilian Ivanov Pandev


Archive | 2018

Spectral Reflectometry For In-Situ Process Monitoring And Control

Prateek Jain; Daniel Wack; Kevin Peterlinz; Andrei V. Shchegrov; Shankar Krishnan


Archive | 2018

RÉFLECTOMÉTRIE SPECTRALE POUR SURVEILLANCE ET RÉGULATION IN SITU DE PROCESSUS

Prateek Jain; Daniel Wack; Kevin Peterlinz; Andrei V. Shchegrov; Shankar Krishnan

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