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Dive into the research topics where Kim Kiekens is active.

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Featured researches published by Kim Kiekens.


Measurement Science and Technology | 2014

Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology

Ye Tan; Kim Kiekens; Frank Welkenhuyzen; Jais Andreas Breusch Angel; L. De Chiffre; Jean-Pierre Kruth; Wim Dewulf

Industrial x-ray computed tomography (CT) systems are being increasingly used as dimensional measuring machines. However, micron level accuracy is not always achievable, as of yet. The measurement accuracy is influenced by many factors, such as the workpiece properties, x-ray voltage, filter, beam hardening, scattering and calibration methods (Kruth et al 2011 CIRP Ann. Manuf. Technol. 60 821–42, Bartscher et al 2007 CIRP Ann. Manuf. Technol. 56 495–8, De Chiffre et al 2005 CIRP Ann. Manuf. Technol. 54 479–82, Schmitt and Niggemann 2010 Meas. Sci. Technol. 21 054008). Since most of these factors are mutually correlated, it remains challenging to interpret measurement results and to identify the distinct error sources. Since simulations allow isolating the different affecting factors, they form a useful complement to experimental investigations. Dewulf et al (2012 CIRP Ann. Manuf. Technol. 61 495–8) investigated the influence of beam hardening correction parameters on the diameter of a calibrated steel pin in different experimental set-ups. It was clearly shown that an inappropriate beam hardening correction can result in significant dimensional errors. This paper confirms these results using simulations of a pin surrounded by a stepped cylinder: a clear discontinuity in the measured diameter of the inner pin is observed where it enters the surrounding material. The results are expanded with an investigation of the beam hardening effect on the measurement results for both inner and outer diameters of the surrounding stepped cylinder. Accuracy as well as the effect on the uncertainty determination is discussed. The results are compared with simulations using monochromatic beams in order to have a benchmark which excludes beam hardening effects and x-ray scattering. Furthermore, based on the above results, the authors propose a case-dependent calibration artefact for beam hardening correction and edge offset determination. In the final part of the paper, the investigations are expanded with experiments of a new set-up that includes non-cylindrical features; the effectiveness of the proposed calibration artefact is also studied.


Measurement Science and Technology | 2011

A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology

Kim Kiekens; Frank Welkenhuyzen; Ye Tan; Philip Bleys; André Voet; Jean-Pierre Kruth; Wim Dewulf


Cirp Annals-manufacturing Technology | 2013

Uncertainty determination and quantification for dimensional measurements with industrial computed tomography

Wim Dewulf; Kim Kiekens; Ye Tan; Frank Welkenhuyzen; Jean-Pierre Kruth


Cirp Annals-manufacturing Technology | 2012

Sense and non-sense of beam hardening correction in CT metrology

Wim Dewulf; Ye Tan; Kim Kiekens


Proceedings of the 4th International Conference on Optical Measurement Techniques for Structures and Systems: Optimess2009 | 2009

Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies

Frank Welkenhuyzen; Kim Kiekens; Mieke Pierlet; Wim Dewulf; Philip Bleys; Jean-Pierre Kruth; André Voet


DGZFP-Proceedings BB 128-CD | 2011

Material Dependent Thresholding for Dimensional X-ray Computed Tomography

Ye Tan; Kim Kiekens; Jean-Pierre Kruth; André Voet; Wim Dewulf


Archive | 2012

Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications

Ye Tan; Kim Kiekens; Frank Welkenhuyzen; Jean-Pierre Kruth; Wim Dewulf


Archive | 2010

A test object for calibration and accuracy assessment in X-ray CT metrology

Kim Kiekens; Frank Welkenhuyzen; Ye Tan; Philip Bleys; André Voet; Wim Dewulf; Jean-Pierre Kruth


Archive | 2012

Uncertainty Determination for Dimensional Measurements with Computed Tomography

Kim Kiekens; Ye Tan; Frank Welkenhuyzen; Jean-Pierre Kruth; Wim Dewulf


Proceedings of the International Symposium on Digital Industrial Radiology and Computed Tomography | 2011

Parameter dependent thresholding for dimensional X-ray computed tomography

Kim Kiekens; Ye Tan; Jean-Pierre Kruth; André Voet; Wim Dewulf

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Jean-Pierre Kruth

Katholieke Universiteit Leuven

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Ye Tan

Katholieke Universiteit Leuven

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Frank Welkenhuyzen

Katholieke Universiteit Leuven

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Philip Bleys

Katholieke Universiteit Leuven

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Wim Dewulf

International University

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Bart Boeckmans

Katholieke Universiteit Leuven

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L. De Chiffre

Technical University of Denmark

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