Kim Kiekens
Katholieke Universiteit Leuven
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Featured researches published by Kim Kiekens.
Measurement Science and Technology | 2014
Ye Tan; Kim Kiekens; Frank Welkenhuyzen; Jais Andreas Breusch Angel; L. De Chiffre; Jean-Pierre Kruth; Wim Dewulf
Industrial x-ray computed tomography (CT) systems are being increasingly used as dimensional measuring machines. However, micron level accuracy is not always achievable, as of yet. The measurement accuracy is influenced by many factors, such as the workpiece properties, x-ray voltage, filter, beam hardening, scattering and calibration methods (Kruth et al 2011 CIRP Ann. Manuf. Technol. 60 821–42, Bartscher et al 2007 CIRP Ann. Manuf. Technol. 56 495–8, De Chiffre et al 2005 CIRP Ann. Manuf. Technol. 54 479–82, Schmitt and Niggemann 2010 Meas. Sci. Technol. 21 054008). Since most of these factors are mutually correlated, it remains challenging to interpret measurement results and to identify the distinct error sources. Since simulations allow isolating the different affecting factors, they form a useful complement to experimental investigations. Dewulf et al (2012 CIRP Ann. Manuf. Technol. 61 495–8) investigated the influence of beam hardening correction parameters on the diameter of a calibrated steel pin in different experimental set-ups. It was clearly shown that an inappropriate beam hardening correction can result in significant dimensional errors. This paper confirms these results using simulations of a pin surrounded by a stepped cylinder: a clear discontinuity in the measured diameter of the inner pin is observed where it enters the surrounding material. The results are expanded with an investigation of the beam hardening effect on the measurement results for both inner and outer diameters of the surrounding stepped cylinder. Accuracy as well as the effect on the uncertainty determination is discussed. The results are compared with simulations using monochromatic beams in order to have a benchmark which excludes beam hardening effects and x-ray scattering. Furthermore, based on the above results, the authors propose a case-dependent calibration artefact for beam hardening correction and edge offset determination. In the final part of the paper, the investigations are expanded with experiments of a new set-up that includes non-cylindrical features; the effectiveness of the proposed calibration artefact is also studied.
Measurement Science and Technology | 2011
Kim Kiekens; Frank Welkenhuyzen; Ye Tan; Philip Bleys; André Voet; Jean-Pierre Kruth; Wim Dewulf
Cirp Annals-manufacturing Technology | 2013
Wim Dewulf; Kim Kiekens; Ye Tan; Frank Welkenhuyzen; Jean-Pierre Kruth
Cirp Annals-manufacturing Technology | 2012
Wim Dewulf; Ye Tan; Kim Kiekens
Proceedings of the 4th International Conference on Optical Measurement Techniques for Structures and Systems: Optimess2009 | 2009
Frank Welkenhuyzen; Kim Kiekens; Mieke Pierlet; Wim Dewulf; Philip Bleys; Jean-Pierre Kruth; André Voet
DGZFP-Proceedings BB 128-CD | 2011
Ye Tan; Kim Kiekens; Jean-Pierre Kruth; André Voet; Wim Dewulf
Archive | 2012
Ye Tan; Kim Kiekens; Frank Welkenhuyzen; Jean-Pierre Kruth; Wim Dewulf
Archive | 2010
Kim Kiekens; Frank Welkenhuyzen; Ye Tan; Philip Bleys; André Voet; Wim Dewulf; Jean-Pierre Kruth
Archive | 2012
Kim Kiekens; Ye Tan; Frank Welkenhuyzen; Jean-Pierre Kruth; Wim Dewulf
Proceedings of the International Symposium on Digital Industrial Radiology and Computed Tomography | 2011
Kim Kiekens; Ye Tan; Jean-Pierre Kruth; André Voet; Wim Dewulf