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Dive into the research topics where Philip Bleys is active.

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Featured researches published by Philip Bleys.


CIRP Annals | 2002

Real-time Tool Wear Compensation in Milling EDM

Philip Bleys; Jean-Pierre Kruth; Bert Lauwers; A Zryd; R Delpretti; C Tricarico

Abstract Accurate machining by milling EDM (i.e. CNC contouring EDM with a rotating cylindrical or tubular electrode) necessitates compensation of the tool electrode wear. Existing anticipated wear compensation is based on off-line tool wear simulation prior to machining. This can be combined with corrections based on periodical measurements of tool length during machining. Anticipated wear compensation involves an important restriction: an exact model of the blank geometry must be available in order to perform the tool wear simulation. This paper presents a new method of wear compensation. On-line estimation of tool wear is used for combining anticipated compensation with real-time compensation. This extends the scope of milling EDM to the machining of blanks of which the exact shape is not known in advance.


International Journal of Precision Technology | 2011

Influence of feature form deviations on CMM measurement uncertainties

Nick Van Gestel; Philip Bleys; Frank Welkenhuyzen; Jean Pierre Kruth

Dimensional quality inspections of high precision parts are often performed by coordinate measuring machines (CMMs) equipped with touch-trigger probes. Features of these parts are then measured with a limited set of points, due to time constraints. This limited sampling has an important influence on the measurement uncertainty because the form deviation of the feature can not be completely assessed. It will not only affect the measurement uncertainty of the form deviation, but also the measurement uncertainties of other feature parameters like size, position and orientation. The quantification of this influence is difficult since the true form deviation is unknown. This paper describes a method, based on Monte Carlo simulations, that allows to determine these measurement uncertainties based on an estimate of the form deviation using a limited set of points. The method is illustrated for circles with theoretical shapes of form deviations, as well as measured shapes.


Measurement Science and Technology | 2011

A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology

Kim Kiekens; Frank Welkenhuyzen; Ye Tan; Philip Bleys; André Voet; Jean-Pierre Kruth; Wim Dewulf


Journal of Materials Processing Technology | 2004

Investigation of material removal mechanisms in EDM of composite ceramic materials

Bert Lauwers; Jean-Pierre Kruth; Weidong Liu; Wesley Eeraerts; Benny Schacht; Philip Bleys


Journal of Materials Processing Technology | 2004

Sensing and compensation of tool wear in milling EDM

Philip Bleys; Jean-Pierre Kruth; Bert Lauwers


Measurement | 2012

Automated dimensional inspection planning using the combination of laser scanner and tactile probe

Haibin Zhao; Jean-Pierre Kruth; Nick Van Gestel; Bart Boeckmans; Philip Bleys


Cirp Annals-manufacturing Technology | 2009

Uncertainty determination for CMMs by Monte Carlo simulation integrating feature form deviations

Jean-Pierre Kruth; Nick Van Gestel; Philip Bleys; Frank Welkenhuyzen


Optics and Lasers in Engineering | 2011

Accuracy improvement of laser line scanning for feature measurements on CMM

Igor Bešić; Nick Van Gestel; Jean-Pierre Kruth; Philip Bleys; Janko Hodolic


Proceedings of the 4th International Conference on Optical Measurement Techniques for Structures and Systems: Optimess2009 | 2009

Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies

Frank Welkenhuyzen; Kim Kiekens; Mieke Pierlet; Wim Dewulf; Philip Bleys; Jean-Pierre Kruth; André Voet


International journal of electrical machining | 2000

Measuring residual stress caused by wire EDM of tool steel

Jean-Pierre Kruth; Philip Bleys

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Jean-Pierre Kruth

Katholieke Universiteit Leuven

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Nick Van Gestel

Katholieke Universiteit Leuven

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Frank Welkenhuyzen

Katholieke Universiteit Leuven

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Bert Lauwers

The Catholic University of America

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Benny Schacht

Katholieke Universiteit Leuven

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Bert Lauwers

The Catholic University of America

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Kim Kiekens

Katholieke Universiteit Leuven

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Koen Van Caekenberghe

Katholieke Universiteit Leuven

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Steven Cuypers

Katholieke Universiteit Leuven

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Tom Craeghs

Katholieke Universiteit Leuven

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