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Dive into the research topics where Frank Welkenhuyzen is active.

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Featured researches published by Frank Welkenhuyzen.


Measurement Science and Technology | 2011

A test object with parallel grooves for calibration and accuracy assessment of industrial computed tomography (CT) metrology

K Kiekens; Frank Welkenhuyzen; Y Tan; Ph Bleys; A Voet; J-P Kruth; W Dewulf

While computed tomography (CT) has long been used for medical applications and material inspection, its application field has recently been broadened to include industrial dimensional metrology. However, the accuracy of CT-based measurements remains yet largely uncertain. Not only are the measurements influenced by a number of factors and parameters like e.g. workpiece orientation, magnification, edge detection and so on, but also the calibration method matters greatly. This paper investigates the influence of these factors and parameters and the calibration method (rescaling and correction) on accuracy and repeatability of the measurements, using a test object with parallel grooves. The test object is also used to illustrate how more accurate CMM measurements can be used to calibrate CT measurements and to compare different calibration and compensation strategies.


Measurement Science and Technology | 2014

Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology

Ye Tan; Kim Kiekens; Frank Welkenhuyzen; Jais Andreas Breusch Angel; L. De Chiffre; Jean-Pierre Kruth; Wim Dewulf

Industrial x-ray computed tomography (CT) systems are being increasingly used as dimensional measuring machines. However, micron level accuracy is not always achievable, as of yet. The measurement accuracy is influenced by many factors, such as the workpiece properties, x-ray voltage, filter, beam hardening, scattering and calibration methods (Kruth et al 2011 CIRP Ann. Manuf. Technol. 60 821–42, Bartscher et al 2007 CIRP Ann. Manuf. Technol. 56 495–8, De Chiffre et al 2005 CIRP Ann. Manuf. Technol. 54 479–82, Schmitt and Niggemann 2010 Meas. Sci. Technol. 21 054008). Since most of these factors are mutually correlated, it remains challenging to interpret measurement results and to identify the distinct error sources. Since simulations allow isolating the different affecting factors, they form a useful complement to experimental investigations. Dewulf et al (2012 CIRP Ann. Manuf. Technol. 61 495–8) investigated the influence of beam hardening correction parameters on the diameter of a calibrated steel pin in different experimental set-ups. It was clearly shown that an inappropriate beam hardening correction can result in significant dimensional errors. This paper confirms these results using simulations of a pin surrounded by a stepped cylinder: a clear discontinuity in the measured diameter of the inner pin is observed where it enters the surrounding material. The results are expanded with an investigation of the beam hardening effect on the measurement results for both inner and outer diameters of the surrounding stepped cylinder. Accuracy as well as the effect on the uncertainty determination is discussed. The results are compared with simulations using monochromatic beams in order to have a benchmark which excludes beam hardening effects and x-ray scattering. Furthermore, based on the above results, the authors propose a case-dependent calibration artefact for beam hardening correction and edge offset determination. In the final part of the paper, the investigations are expanded with experiments of a new set-up that includes non-cylindrical features; the effectiveness of the proposed calibration artefact is also studied.


International journal of automation technology | 2015

Determination of Aspect Ratio Limitations, Accuracy and Repeatability of a Laser Line Scanning CMM Probe

Bart Boeckmans; Min Zhang; Frank Welkenhuyzen; Jean-Pierre Kruth

Coordinate measurement machine (CMM) probing techniques can involve direct mechanical contact (e.g., tactile probing) or diverse non-contact principles (e.g., laser line scan probing). For some applications, contact methods are not capable of measuring fast enough to ensure 100% quality controlled parts. A laser line scanning probe uses a laser triangulation-based method to acquire 3D measurement points on a workpiece relative to a sensor. Mounting the sensor in a 3D coordinate frame, e.g., in a CMM provides enough information to fully examine the workpiece. These techniques are most commonly exploited in medical industry and industries involving plate materials. A high data density and measurement speed are significant advantages when measuring free-form surfaces by laser line scanning, making the process much more time-efficient. However, high-precision geometrical features (such as cylinders, spheres, etc.) must be measured for locating and aligning the free-form shapes. The accuracy of the equipment therefore has to be assessed. Probe Maximum Permissible Error (MPEP) values below 10 μ m have been reported for cutting-edge laser line scanners. This paper compares the major influences on measurements on cylindrical features. First, the aspect-ratio limitations are considered by comparing two inherently different techniques. The stable inspection of reference features is important, while trying to maximize the spatial extent of the measured features. Second, the measurement method is analyzed in two ways: by using a limited sample of the features to increase stability and eliminate interference from neighboring features; by varying the number of scan tracks, which greatly affects the measurement time.


International Journal of Precision Technology | 2011

Influence of feature form deviations on CMM measurement uncertainties

Nick Van Gestel; Philip Bleys; Frank Welkenhuyzen; Jean Pierre Kruth

Dimensional quality inspections of high precision parts are often performed by coordinate measuring machines (CMMs) equipped with touch-trigger probes. Features of these parts are then measured with a limited set of points, due to time constraints. This limited sampling has an important influence on the measurement uncertainty because the form deviation of the feature can not be completely assessed. It will not only affect the measurement uncertainty of the form deviation, but also the measurement uncertainties of other feature parameters like size, position and orientation. The quantification of this influence is difficult since the true form deviation is unknown. This paper describes a method, based on Monte Carlo simulations, that allows to determine these measurement uncertainties based on an estimate of the form deviation using a limited set of points. The method is illustrated for circles with theoretical shapes of form deviations, as well as measured shapes.


Measurement Science and Technology | 2011

A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology

Kim Kiekens; Frank Welkenhuyzen; Ye Tan; Philip Bleys; André Voet; Jean-Pierre Kruth; Wim Dewulf


Cirp Annals-manufacturing Technology | 2013

Uncertainty determination and quantification for dimensional measurements with industrial computed tomography

Wim Dewulf; Kim Kiekens; Ye Tan; Frank Welkenhuyzen; Jean-Pierre Kruth


Cirp Annals-manufacturing Technology | 2009

Uncertainty determination for CMMs by Monte Carlo simulation integrating feature form deviations

Jean-Pierre Kruth; Nick Van Gestel; Philip Bleys; Frank Welkenhuyzen


Proceedings of the 4th International Conference on Optical Measurement Techniques for Structures and Systems: Optimess2009 | 2009

Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies

Frank Welkenhuyzen; Kim Kiekens; Mieke Pierlet; Wim Dewulf; Philip Bleys; Jean-Pierre Kruth; André Voet


Archive | 2012

Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications

Ye Tan; Kim Kiekens; Frank Welkenhuyzen; Jean-Pierre Kruth; Wim Dewulf


Archive | 2010

A test object for calibration and accuracy assessment in X-ray CT metrology

Kim Kiekens; Frank Welkenhuyzen; Ye Tan; Philip Bleys; André Voet; Wim Dewulf; Jean-Pierre Kruth

Collaboration


Dive into the Frank Welkenhuyzen's collaboration.

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Jean-Pierre Kruth

Katholieke Universiteit Leuven

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Kim Kiekens

Katholieke Universiteit Leuven

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Philip Bleys

Katholieke Universiteit Leuven

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Ye Tan

International University

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Bart Boeckmans

Katholieke Universiteit Leuven

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Nick Van Gestel

Katholieke Universiteit Leuven

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Min Zhang

Katholieke Universiteit Leuven

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Wim Dewulf

International University

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Jun Qian

Katholieke Universiteit Leuven

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Karolien Kempen

Katholieke Universiteit Leuven

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