Kook-Hwan Kwon

Precharge system for a semiconductor memory device

Data output related circuit which is suitable for semiconductor memory device for high -speed operation

Semiconductor memory device having a burn-in control circuit and burn-in test method thereof

High-speed synchronous semiconductor memory having multi-stage pipeline structure and operating method

Data output buffer for multiple power supplies

High speed semiconductor memory device

Internal clock generating circuit of synchronous type semiconductor memory device and method thereof

Electrostatic discharge protection transistor for a semiconductor chip

Integrated circuit devices with reliable fuse-based mode selection capability and methods of operating same

Clock monitor circuit and synchronous semiconductor memory device utilizing the circuit