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Dive into the research topics where Marc Aoulaiche is active.

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Featured researches published by Marc Aoulaiche.


Microelectronics Reliability | 2014

Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation

Maria Glória Caño de Andrade; Joao Antonio Martino; Marc Aoulaiche; Nadine Collaert; Eddy Simoen; Cor Claeys

Abstract In this paper, the influence of proton irradiation is experimentally studied in triple-gate Bulk FinFETs with and without Dynamic Threshold MOS configuration (DTMOS). The drain current, transconductance, Drain Induced Barrier Lowering (DIBL) and the important figures of merit for the analog performance such as transconductance-over-drain current, output conductance and intrinsic voltage gain will be compared. Furthermore, the Low-Frequency (LF) noise will be also analyzed in the DT mode and the standard biasing configuration. The results indicate that the better electrical characteristics and analog performance of DTMOS FinFETs make them very competitive candidates for low-noise RF analog applications in a radiation environment.


8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI | 2012

Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise

A. Luque Rodríguez; Gloria Cano de Andrade; Marc Aoulaiche; Luciano M. Almeida; Cor Claeys; J. A. Jiménez Tejada; M. Jurczak; Eddy Simoen


ECS Transactions | 2013

(Invited) Transistor-Based Extraction of Carrier Lifetime and Interface Traps Densities in Silicon-on-Insulator Materials

Joao Antonio Martino; Victor Sonnenberg; M Galeti; Marc Aoulaiche; Eddy Simoen; C. Claeys


Journal of Integrated Circuits and Systems | 2013

On the variability of the low-frequency noise in UTBOX SOI nMOSFETs

Eddy Simoen; Maria Glória Caño de Andrade; Luciano M. Almeida; Marc Aoulaiche; Christian Caillat; M. Jurczak; Cor Claeys


Microelectronics and Solid State Electronics | 2012

Reliability and Retention of Floating Body RAM on Bulk FinFET

Marc Aoulaiche; Eddy Simoen; Christian Caillat; Nadine Collaert; Guido Groeseneken; M. Jurczak


228th ECS Meeting (October 11-15, 2015) | 2015

Increase in Oxide Trap Density Due to the Implementation of High-k and Al2O3 Cap Layers in Thick-Oxide Input-Output Transistors for DRAM Applications

Eddy Simoen; Romain Ritzenthaler; Moon Ju Cho; Tom Schram; Naoto Horiguchi; Marc Aoulaiche; Alessio Spessot; Pierre C. Fazan; Cor Claeys


Journal of Integrated Circuits and Systems | 2014

Observation of the Two-Sided Read Window on UTBOX SOI 1T-DRAM: Measurement Setup, Numerical and Empirical Results

Albert Nissimoff; Katia R. A. Sasaki; Marc Aoulaiche; Joao Antonio Martino; Eddy Simoen; Cor Claeys


10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI | 2014

Low temperature noise spectroscopy of p-channel SOI FinFETs

H Achour; Bogdan Cretu; Eddy Simoen; Jean-Marc Routoure; Regis Carin; R Talmat; A Benfdila; Marc Aoulaiche; Cor Claeys


SEMINATEC | 2013

Floating body retention analysis for 1T-DRAM

Marc Aoulaiche; Eddy Simoen; Liesbeth Witters; Cor Claeys; M. Jurczak; Talitha Nicoletti; Sara dos Santos; Jao Martino Martino; Christian Caillat; Pierre C. Fazan


Atomic Layer Deposition Applications 9 | 2013

Advanced Dielectrics Targeting 2X nm DRAM MIM Capacitors

Mihaela Ioana Popovici; Johan Swerts; Marc Aoulaiche; Augusto Redolfi; Ben Kaczer; Min-Soo Kim; Bastien Douhard; Annelies Delabie; Sergiu Clima; M. Jurczak; S. Van Elshocht

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Cor Claeys

University of Newcastle

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Nadine Collaert

Katholieke Universiteit Leuven

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Joao Antonio Martino

Centro Universitário da FEI

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M Galeti

University of São Paulo

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J.A Martino

University of São Paulo

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