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Mark J. Williamson

Micron Technology

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Publication

Featured researches published by Mark J. Williamson.

Archive | 2010

Electron beam processing device and method using carbon nanotube emitter

Neal R. Rueger; Mark J. Williamson; Gurtej S. Sandhu

Archive | 2006

ELECTRON INDUCED CHEMICAL ETCHING FOR MATERIALS CHARACTERIZATION

Mark J. Williamson; Gurtej S. Sandhu; Justin R. Arrington; Neal R. Rueger

Archive | 2006

Electron induced chemical etching for device level diagnosis

Mark J. Williamson; Gurtej S. Sandhu; Justin R. Arrington

Archive | 2006

Electron beam etching device and method

Neal R. Rueger; Mark J. Williamson; Gurtej S. Sandhu

Archive | 2006

Electron induced chemical etching/deposition for enhanced detection of surface defects

Mark J. Williamson; Paul M. Johnson; Shawn D. Lyonsmith; Gurtej S. Sandhu; Justin R. Arrington

Archive | 2006

Plasma and electron beam etching device and method

Neal R. Rueger; Mark J. Williamson; Gurtej S. Sandhu

Archive | 2010

Profiling solid state samples

Neal R. Rueger; Mark J. Williamson; Gurtej S. Sandhu; Justin R. Arrington

Archive | 2007

Integrated circuit chips, apparatuses for obtaining backscatter data from samples, methods of backscatter analysis, and methods of forming alpha particle emission and detection systems

Mark J. Williamson; Gurtej S. Sandhu

Archive | 2010

Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging

Mark J. Williamson; Paul M. Johnson; Shawn D. Lyonsmith; Gurtej S. Sandhu; Justin R. Arrington

Archive | 2011

APPARATUS AND SYSTEMS FOR INTEGRATED CIRCUIT DIAGNOSIS

Mark J. Williamson; Gurtej S. Sandhu; Justin R. Arrington

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Collaboration

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Gurtej S. Sandhu

Micron Technology

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Justin R. Arrington

Micron Technology

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Neal R. Rueger

Micron Technology

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Paul M. Johnson

Micron Technology

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Shawn D. Lyonsmith

Micron Technology

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