Matthias Ilg
Lam Research
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Publication
Featured researches published by Matthias Ilg.
Journal of Vacuum Science and Technology | 1996
Christoph Werner; Matthias Ilg; Kevin J. Uram
Three‐dimensional (3D) numerical equipment modeling using the simulator PHOENICS‐CVD was used to investigate a low pressure chemical vapor deposition process for boron and phosphorus doped silicon glass deposition from TEOS, PH3, O2, and TEB gas sources. The simulation allows the 3D visualization of gas flow, temperature, and chemical concentration profiles in the reactor, as well as the calculation of the deposition rate as a function of position. Mixing of gases from different inlets and deposition uniformity due to reactive gas depletion were studied as a function of pressure, gas flow velocity, and reactor geometry. Comparison with experimental deposition rate data shows that published chemical models can well describe the undoped deposition, while additional chemical reactions seem to become important when PH3 is introduced in the reactor for phosphorus doped glass deposition.
Archive | 1995
Kevin J. Uram; John K. Shugrue; Nathan P. Sandler; Son Van Nguyen; Matthias Ilg
Archive | 1996
Kevin J. Uram; John K. Shugrue; Nathan P. Sandler; Son Van Nguyen; Matthias Ilg
Archive | 1997
Matthias Ilg; Son Van Nguyen; Kevin J. Uram; ケヴィン・ジェイ・アーラム; サン・ヴァン・グーイェン; マティアス・イルグ
Archive | 1998
Ashima Hopewell Junction Chakravarti; Matthias Ilg; Markus Kirchhof; Kevin A. Mckinley; Son Van Nguyen; Michael J. Shapiro
Archive | 1998
Ashima B. Chakravarti; Matthias Ilg; Markus Kirchhof; Kevin A. Mckinley; Son Van Nguyen; Michael J. Shapiro
Archive | 1998
Markus Kirchhof; Ashima B. Chakravarti; Matthias Ilg; Kevin A. Mckinley; Son Van Nguyen; Michael J. Shapiro
Archive | 1997
Matthias Ilg; Markus Kirchoff; Christoph Werner
Archive | 1997
Matthias Ilg; Markus Kirchoff; Christoph Werner
Archive | 1997
Matthias Ilg; Markus Kirchoff; Christoph Werner