Maxim Lisachenko

P‐21: Investigation of Pattern‐Induced Brightness Non‐Uniformity in AMOLED Displays

We found that pattern-induced line type brightness non-uniformity is related to moire patterns that appear when primary grain boundaries in SLS processed poly-Si are aligned over repetitive TFT patterns such as metal lines. We propose a method to diminish the Moire pattern type non-uniformity by adopting black matrix and top emission TFT structure.

P‐19: Development of Microcrystalline Si for TFT Backplanes

A new composite material based on directly deposited microcrystalline Si (μc-Si) was developed, tested and applied as active layer in top-gate coplanar p-type TFTs. The obtained TFTs characteristics demonstrate high quality of developed μc-Si and possibility of using it in TFT backplanes for AMOLED displays.