Tae-Hoon Yang
Samsung
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Tae-Hoon Yang.
SID Symposium Digest of Technical Papers | 2006
Kyoung-Bo Kim; Hye-Hyang Park; Oh-Seob Kwon; Kil-won Lee; Ki-Yong Lee; Jisu Ahn; Jin-Wook Seo; Su‐Bin Song; Moojin Kim; Tae-Hoon Yang; Byoung Keon Park; Maxim Lisachenko; Seihwan Jung; Daechul Choi; Byoung Lyong Choi; Hye-Dong Kim; Ho-Kyoon Chung
We found that pattern-induced line type brightness non-uniformity is related to moire patterns that appear when primary grain boundaries in SLS processed poly-Si are aligned over repetitive TFT patterns such as metal lines. We propose a method to diminish the Moire pattern type non-uniformity by adopting black matrix and top emission TFT structure.
Archive | 2013
Byoung-Keon Park; Tae-Hoon Yang; Jin-Wook Seo; Soo-beom Jo; Dong-Hyun Lee; Kil-won Lee; Maxim Lisachenko; Yun-Mo Chung; Bo-Kyung Choi; Jong-Ryuk Park; Ki-Yong Lee
Archive | 2010
Byoung-Keon Park; Tae-Hoon Yang; Jin-Wook Seo; Ki-Yong Lee; Maxim Lisachenko; Bo-Kyung Choi; Dae-Woo Lee; Kil-won Lee; Dong-Hyun Lee; Jong-Ryuk Park; Ji-Su Ahn; Young-dae Kim; Heung-Yeol Na; Min-Jae Jeong; Yun-Mo Chung; Jong-Won Hong; Eu-Gene Kang; Seok-rak Chang; Jae-Wan Jung; Sang-Yon Yoon
Archive | 2012
Byoung-Keon Park; Jin-Wook Seo; Tae-Hoon Yang; Kil-won Lee; Ki-Yong Lee
Archive | 2004
Byoung-Keon Park; Jin-Wook Seo; Tae-Hoon Yang; Ki-Yong Lee
Archive | 2009
Dong-Hyun Lee; Ki-Yong Lee; Jin-Wook Seo; Tae-Hoon Yang; Byoung-Keon Park; Kil-won Lee; Maxim Lisachenko; Jae-Wan Jung
Archive | 2008
Tae-Hoon Yang; Byoung-Keon Park; Jin-Wook Seo; Ki-Yong Lee; Kil-won Lee
Archive | 2008
Byoung-Keon Park; Jin-Wook Seo; Tae-Hoon Yang; Kil-won Lee
Archive | 2010
Byoung-Keon Park; Tae-Hoon Yang; Jin-Wook Seo; Seihwan Jung; Ki-Yong Lee; Maxim Lisachenko
Archive | 2008
Tae-Hoon Yang; Ki-Yong Lee; Jin-Wook Seo; Byoung-Keon Park
