Meeta Srivastav
Virginia Tech
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Publication
Featured researches published by Meeta Srivastav.
design, automation, and test in europe | 2012
Xu Guo; Meeta Srivastav; Sinan Huang; Dinesh Ganta; Michael B. Henry; Leyla Nazhandali; Patrick Schaumont
Throughout the NIST SHA-3 competition, in relative order of importance, NIST considered the security, cost, and algorithm and implementation characteristics of a candidate [1]. Within the limited one-year security evaluation period for the five SHA-3 finalists, the cost and performance evaluation may put more weight in the selection of winner. This work contributes to the SHA-3 hardware evaluation by providing timely cost and performance results on the first SHA-3 ASIC in 0.13 μm IBM process using standard cell CMOS technology with measurements of all the five finalists using the latest Round 3 tweaks. This article describes the SHA-3 ASIC design from VLSI architecture implementation to the silicon realization.
field programmable gate arrays | 2013
Kenneth M. Zick; Meeta Srivastav; Wei Zhang; Matthew French
Voltage noise not only detracts from reliability and performance, but has been used to attack system security. Most systems are completely unaware of fluctuations occurring on nanosecond time scales. This paper quantifies the threat to FPGA-based systems and presents a solution approach. Novel measurements of transients on 28nm FPGAs show that extreme activity in the fabric can cause enormous undershoot and overshoot, more than 10× larger than what is allowed by the specification. An existing voltage sensor is evaluated and shown to be insufficient. Lastly, a sensor design using reconfigurable logic is presented; its time-to-digital converter enables sample rates 500× faster than the 28nm Xilinx ADC. This enables quick characterization of transients that would normally go undetected, thereby providing potentially useful data for system optimization and helping to defend against supply voltage attacks.
Microprocessors and Microsystems | 2013
Meeta Srivastav; Xu Guo; Sinan Huang; Dinesh Ganta; Michael B. Henry; Leyla Nazhandali; Patrick Schaumont
This contribution describes our efforts in the design of a 130nm CMOS ASIC that implements Skein, BLAKE, JH, Grostl, and Keccak, the five candidates selected by NIST in the third round SHA-3 competition. The objective of the ASIC is to accurately measure the performance and power dissipation of each candidate when implemented as an ASIC. The design of this ASIC, and its optimization for benchmarking, creates unique problems, related to the integration of five heterogeneous architectures on a single chip. We implemented each algorithm in a separate clock region, and we integrated an on-chip clock generator with flexible testing modes. The chip is further designed to be compatible with SASEBO-R board, a power-analysis and side-channel analysis environment. We report the design flow and test results of the chip, including area, performance and shmoo plot. Furthermore, we compare our ASIC benchmark with an equivalent FPGA benchmark.
digital systems design | 2011
Xu Guo; Meeta Srivastav; Sinan Huang; Dinesh Ganta; Michael B. Henry; Leyla Nazhandali; Patrick Schaumont
The NIST SHA-3 competition aims to select a new secure hash standard. Hardware implementation quality is an important factor in evaluating the SHA-3 finalists. However, a comprehensive methodology to benchmark five final round SHA-3 candidates in ASIC is challenging. Many factors need to be considered, including application scenarios, target technologies and optimization goals. This work describes detailed steps in the silicon implementation of a SHA-3 ASIC. The plan of ASIC prototyping with all the SHA-3 finalists, as an integral part of our SHA-3 ASIC evaluation project, is motivated by our previously proposed methodology, which defines a consistent and systematic approach to move a SHA-3 hardware benchmark process from FPGA prototyping to ASIC implementation. We have designed the remaining five SHA-3 candidates in 0.13
ACM Transactions on Design Automation of Electronic Systems | 2013
Meeta Srivastav; Michael B. Henry; Leyla Nazhandali
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international symposium on quality electronic design | 2012
Meeta Srivastav; Michael B. Henry; Leyla Nazhandali
IBM process using standard-cell CMOS technology. In this paper, we discuss our proposed methodology for SHA-3 ASIC evaluation and report the latest results based on post-layout simulation of the five SHA-3 finalists with Round 3 tweaks.
design automation conference | 2011
Michael B. Henry; Meeta Srivastav; Leyla Nazhandali
Voltage scaling has been a prevalent method of saving energy for energy-constrained applications. However, current technology trends which shrink transistors sizes exacerbate process variation effects in voltage-scaled systems. Large variations in transistor parameters result in high variation in performance and power across the chip. These effects, if ignored at the design, stage, will result in unpredictable behavior when deployed in the field. In this article, we leverage the benefits of voltage scaling methodology for obtaining energy efficiency and compensate for the loss in throughput by exploiting parallelism present in the various DSP designs. We show that such a hybrid method consumes 8%--77% less power, compared to simple dynamic voltage scaling over different throughputs. We study this system architecture in two different workload environments: static and dynamic. We show that to achieve the highest level of energy efficiency, the number of cores and the operating voltages vary widely between a BASE design versus a process variation-aware (PVA) design. We further demonstrate that the PVA design enjoys an average of 26.9% and 51.1% reduction in energy consumption for the static and dynamic designs, respectively. Since different cores will have a wide range of speeds at operating voltages close to near/sub-thresholds due to process variation, we gather characteristic behavior of each core. With knowledge of the core speeds, we can further increase the energy efficiency. Furthermore, in this article, we show that of this methodology will be 49.3% more energy efficient, compared to that building the system with no knowledge about the characteristics of each core.
ACM Transactions on Design Automation of Electronic Systems | 2015
Meeta Srivastav; Mohammed Ehteshamuddin; Kyle Stegner; Leyla Nazhandali
Voltage scaling has been a prevalent method of saving energy for energy constrained applications. However, voltage scaling along with shrinking process technologies exacerbate process variation effects on transistor. Large variation in transistor parameters, result in high variation in performance and power across the chip. These effects if ignored at the stage of designing will result into unpredictable behavior when deployed in the actual field. In this paper, we leverage the benefits of voltage scaling methodology for obtaining energy efficiency and compensate for the loss in throughput by exploiting parallelism present in the various DSP designs. To achieve scalable throughput, we depend on both dynamic voltage scaling with a few operating voltage options and active unit scaling, where the number of active parallel units is reduced using power gating. We show that such hybrid method consumes 8%-77% less power compared to simple dynamic voltage scaling over different throughputs. We study this system architecture in two different workload environments, one static and one dynamic. In the former, the desired target throughput is predetermined and fixed and in the latter, it can be changed dynamically. We show that to achieve highest level of energy efficiency, the number of cores and the operating voltages vary widely between a base designs versus a process variation aware (PVA) design. We further show that the PVA design enjoys an average of 26.9% and 51.1% reduction in energy consumption for the static and dynamic designs respectively over six different DSP applications. This is because the base design needs to compensate for the effects of process variation as an after fact, while the PVA is able to make suitable decisions at the time of the design.
great lakes symposium on vlsi | 2013
Meeta Srivastav; Yongbo Zuo; Xu Guo; Leyla Nazhandali; Patrick Schaumont
This paper presents a case for using Nano-Electro-Mechanical-System switches for power gating idle functional units of an embedded microprocessor. We achieve an average of 26% total energy savings, with a worst-case 5% increase in cycles. Our work includes detailed comparison with transistor switches, actuation circuitry design, identification of desired switch parameters, and device lifetime analysis
international conference on electronics, circuits, and systems | 2012
Meeta Srivastav; Leyla Nazhandali
We propose a system-level solution in designing process variation aware (PVA) scalable-throughput many-core systems for energy constrained applications. In our proposed methodology, we leverage the benefits of voltage scaling for obtaining energy efficiency while compensating for the loss in throughput by exploiting parallelism present in various DSP designs. We demonstrate that such a hybrid method consumes 6.27%- 28.15% less power as compared to simple dynamic voltage scaling over different workload environments. Design details of a prototype chip fabricated on 90nm technology node and its findings are presented. Chip consists of 8 homogeneous FIR cores, which are capable of running from near-threshold to nominal voltages. In our 20 chip population, we observe 7% variation in speed among the cores at nominal voltage (0.9V) and 26% at near threshold voltage (0.55V). We also observe 54% variation in power consumption of the cores. For any desired throughput, the optimum number of cores and their optimum operating voltage is chosen based on the speed and power characteristics of the cores present inside the chip. We will also present analysis on energy-efficiency of such systems based on changes in ambient temperature.