Is this you? Create Your Porfile
Avatar

Michael J. Van Riet

KLA-Tencor

Network

Latest external collaboration on country level. Dive into details by clicking on the dots.

Explore More

Hotspot

Dive into the research topics where Michael J. Van Riet is active.

Explore More

Publication

Featured researches published by Michael J. Van Riet.

Archive | 2010

Selecting one or more parameters for inspection of a wafer

Chris W. Lee; Lisheng Gao; Tao Luo; Kenong Wu; Tommaso Torelli; Michael J. Van Riet; Brian Duffy

Archive | 2008

Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm

Hong Chen; Michael J. Van Riet; Chien Huei Chen; Jason Z. Lin; Chris Maher; Michael Kowalski; Barry Becker; Stephanie Chen; Subramanian Balakrishnan; Suryanarayana Tummala

Archive | 2012

Determining design coordinates for wafer defects

Ellis Chang; Michael J. Van Riet; Allen Park; Khurram Zafar; Santosh Bhattacharyya

Archive | 2007

Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe

Chien-Huei (Adam) Chen; Barry Becker; Hong Chen; Michael J. Van Riet; Chris Maher; Stephanie Chen; Suryanarayana Tummala; Yong Zhang

Archive | 2010

Scanner Performance Comparison And Matching Using Design And Defect Data

Allen Park; Ellis Chang; Masami Aoki; Chris Young; Martin Plihal; Michael J. Van Riet

Archive | 2005

Apparatus and methods for analyzing defects on a sample

Kris Bhaskar; Ardis Liang; Michael J. Van Riet

Archive | 2012

CONTOUR-BASED DEFECT DETECTION USING AN INSPECTION APPARATUS

Chien-Huei (Adam) Chen; Peter White; Michael J. Van Riet; Sankar Venkataraman; Hai Jiang; Hedong Yang; Ajay Gupta

Archive | 2012

Selecting Parameters for Defect Detection Methods

Kenong Wu; Chris W. Lee; Michael J. Van Riet; Yi Liu

Archive | 2012

Systems and methods for preparation of samples for sub-surface defect review

Cecelia Campochiaro; Hong Xiao; Michael J. Van Riet; Benjamin James Thomas Clarke; Harsh Sinha

Archive | 2005

ANALYZER AND METHOD FOR ANALYZING DEFECT ON SAMPLE

Kris Bhasker; Ardis Liang; Michael J. Van Riet; アーディス・リァン; クリス・バスカー; リート マイケル・ジェイ．・バン

Explore More

Collaboration

Dive into the Michael J. Van Riet's collaboration.

Top Co-Authors
Avatar

Chris Maher

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Ajay Gupta

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Allen Park

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Ardis Liang

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Barry Becker

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Chien-Huei (Adam) Chen

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Chris W. Lee

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Ellis Chang

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Hedong Yang

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Hong Chen

KLA-Tencor

View shared research outputs
Explore More
Researchain Logo
Decentralizing Knowledge