Michael Melzl
Infineon Technologies
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Publication
Featured researches published by Michael Melzl.
IEEE Transactions on Semiconductor Manufacturing | 2008
Werner Robl; Michael Melzl; Berngard Weidgans; Renate Hofmann; Matthias Stecher
High current-carrying capacity and low resistivity are key parameters for power devices. In this paper a copper based terminal metallurgy scheme for wire- and wedge-bonding is described, which improves these properties. The method of choice for depositing thick copper wires is pattern plating. However the plating process has to be optimized in order to get a homogeneous thickness distribution. An electroless coating of NiP, Pd and Au on top of the Cu layers is used as bond interface. This process provides high reliable gold-wire and aluminum-wedge bonds.
Archive | 2005
Stephen Bradl; Walther Grommes; Werner Kröninger; Michael Melzl; Josef Schwaiger; Thilo Stache
Archive | 2000
Josef Schwaiger; Gerhard Niederhofer; Gerhard Ott; Michael Melzl
Archive | 2010
Markus Hammer; Guenther Ruhl; Andreas Strasser; Michael Melzl; Reinhard Goellner; Doerthe Groteloh
Archive | 2001
Heinz Opolka; Paul-Werner Von Basse; Thomas Scheiter; Rainer Grossmann; Christian Peters; Reinhard Fischbach; Andreas Gaymann; Thomas Rosteck; Domagoj Siprak; Thorsten Sasse; Reinhard Göllner; Justin Bierner; Michael Melzl; Klaus Hammer; Markus Witte
Archive | 2006
Thomas Gutt; Drik Siepe; Thomas Laska; Michael Melzl; Matthias Stecher; Roman Roth
Archive | 2006
Stephan Bradl; Michael Melzl; Josef Schwaiger; Thilo Stache
Archive | 2006
Thomas Gutt; Dirk Siepe; Thomas Laska; Michael Melzl; Matthias Stecher; Roman Roth
Archive | 2006
Thomas Gutt; Thomas Laska; Michael Melzl; Roman Roth; Dirk Siepe; Matthias Stecher
Archive | 2000
Heinz Opolka; Basse Paul-Werner Von; Thomas Scheiter; Rainer Grossmann; Christian Peters; Reinhard Fischbach; Andreas Gaymann; Thomas Rosteck; Domagoj Siprak; Thorsten Sasse; Reinhard Göllner; Justin Bierner; Michael Melzl; Klaus Hammer; Markus Witte