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Dive into the research topics where Michael S. Bakeman is active.

Publication


Featured researches published by Michael S. Bakeman.


Archive | 2013

Metrology Tool With Combined X-Ray And Optical Scatterometers

Michael S. Bakeman; Andrei V. Shchegrov


Archive | 2013

Optical metrology using targets with field enhancement elements

Jonathan M. Madsen; Andrei V. Shchegrov; Michael S. Bakeman; Thaddeus Gerard Dziura; Alexander Kuznetsov; Bin-Ming (Benjamin) Tsai


Archive | 2013

Combined x-ray and optical metrology

Kevin Peterlinz; Andrei V. Shchegrov; Michael S. Bakeman; Thaddeus Gerard Dziura


Archive | 2013

Model building and analysis engine for combined x-ray and optical metrology

Michael S. Bakeman; Andrei V. Shchegrov; Qiang Zhao; Zhengquan Tan


Archive | 2014

SMALL-ANGLE SCATTERING X-RAY METROLOGY SYSTEMS AND METHODS

Michael S. Bakeman; Andrei V. Shchegrov; Ady Levy; Guorong V. Zhuang; John J. Hench


Archive | 2014

METHODS AND APPARATUS FOR MEASURING SEMICONDUCTOR DEVICE OVERLAY USING X-RAY METROLOGY

Andrei Veldman; Michael S. Bakeman; Andrei V. Shchegrov; Walter D. Mieher


Archive | 2014

Metrology Tool With Combined XRF And SAXS Capabilities

Michael S. Bakeman; Andrei V. Shchegrov; Kevin Peterlinz; Thaddeus Gerard Dziura


Archive | 2015

Scatterometry-Based Imaging and Critical Dimension Metrology

Abdurrahman Sezginer; John J. Hench; Michael S. Bakeman


Archive | 2017

Confined illumination for small spot size metrology

Derrick Shaughnessy; Michael S. Bakeman; Guorong V. Zhuang; Andrei V. Shchegrov; Leonid Poslavsky


Archive | 2016

Computationally Efficient X-ray Based Overlay Measurement

John J. Hench; Andrei V. Shchegrov; Michael S. Bakeman

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