Ming Chun Chen | Researchain

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Publication

Featured researches published by Ming Chun Chen.

Archive | 1997

Automatic recipe adjust and download based on process control window

Paul J. Steffan; Ming Chun Chen

Archive | 1997

Dynamic process window control using simulated wet data from current and previous layer data

Ming Chun Chen; Paul J. Steffan

Archive | 1997

Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification

Paul J. Steffan; Ming Chun Chen

Archive | 1997

Automatic defect classification (ADC) reclassification engine

Ming Chun Chen; Paul J. Steffan

Archive | 1997

Automatic defect classification individual defect predicate value retention

Ming Chun Chen; Paul J. Steffan; Steven J. Zika

Archive | 1997

Method to accurately determine classification codes for defects during semiconductor manufacturing

Paul J. Steffan; Ming Chun Chen

Archive | 1997

Disposition tool for factory process control

Paul J. Steffan; Ming Chun Chen

Archive | 1997

Automatic defect reclassification of known propagator defects

Ming Chun Chen; Paul J. Steffan

Archive | 1997

Semiconductor wafer optical scanning system and method using swath-area defect limitation

Paul J. Steffan; Bryan Tracy; Ming Chun Chen

Archive | 1997

System for process data association using LaPlace Everett interpolation

Ming Chun Chen; Paul J. Steffan

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Collaboration

Dive into the Ming Chun Chen's collaboration.

Top Co-Authors

Paul J. Steffan

Advanced Micro Devices

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Top Co-Authors

Bryan Tracy

Advanced Micro Devices

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Top Co-Authors

Steven J. Zika

Advanced Micro Devices

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Archive Network Publication Hotspot Collaboration

Network

Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot

Dive into the research topics where Ming Chun Chen is active.

Publication

Featured researches published by Ming Chun Chen.

Automatic recipe adjust and download based on process control window

Dynamic process window control using simulated wet data from current and previous layer data

Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification

Automatic defect classification (ADC) reclassification engine

Automatic defect classification individual defect predicate value retention

Method to accurately determine classification codes for defects during semiconductor manufacturing

Disposition tool for factory process control

Automatic defect reclassification of known propagator defects

Semiconductor wafer optical scanning system and method using swath-area defect limitation

System for process data association using LaPlace Everett interpolation

Collaboration

Dive into the Ming Chun Chen's collaboration.