Miron Abramovici

On-line BIST and diagnosis of FPGA interconnect using roving STARs

Presents the first on-line BIST and BIST-based diagnostic approach for the programmable interconnect resources in FPGAs. This interconnect BIST is used in the roving STARs approach. The technique provides a complete BIST of the programmable interconnect followed by high-resolution diagnostics to support reconfiguration around the fault for fault-tolerant applications. We have successfully implemented this BIST approach on the ORCA 2C series FPGA and present the results of testing and diagnosing known defective FPGAs.

Selecting built-in self-test configurations for field programmable gate arrays

In our previous work, we have described a built-in self-test (BIST) approach for RAM-based field programmable gate arrays (FPGAs), which exploits the reprogrammability of the FPGA to create BIST logic only during off-line testing. The cost is additional external memory required to store the BIST reconfiguration data, leaving all FPGA logic resources available for system functions. In this paper, the memory requirements as well as the testing time are minimized by selecting a few BIST configurations which provide high fault coverage for inspection tests at board and system manufacturing as well as for efficient system diagnostics and field testing.