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Dive into the research topics where Noriaki Maeda is active.

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Featured researches published by Noriaki Maeda.


international solid-state circuits conference | 2005

Low-power embedded SRAM modules with expanded margins for writing

Masanao Yamaoka; Noriaki Maeda; Yoshihiro Shinozaki; Yasuhisa Shimazaki; Koji Nii; Shigeru Shimada; Kazumasa Yanagisawa; Takayuki Kawahara

A low-power embedded SRAM module implements a writing margin expansion for low-voltage operation, a write replica circuit for low-power operation and a low-leakage structure. The replica circuit reduces active power by 18%, and a 512kB module operates at 450MHz, has 7.8 /spl mu/A leakage in standby, and a minimum V/sub DD/ of 0.8V.


international solid-state circuits conference | 2008

65nm Low-Power High-Density SRAM Operable at 1.0V under 3σ Systematic Variation Using Separate V th Monitoring and Body Bias for NMOS and PMOS

Masanao Yamaoka; Noriaki Maeda; Yasuhisa Shimazaki; Kenichi Osada

We design a technique to separately measure the Vth of NMOS and PMOS. This technique is used to determine the body bias of NMOS and PMOS individually. Prototype chips with 1Mb 0.51 mm2 high-density SRAM cells using a 65 nm low-power process are fabricated and achieve 1.0 V operation, even when considering actual Vth variation.


custom integrated circuits conference | 2009

A 40-nm low-power SRAM with multi-stage replica-bitline technique for reducing timing variation

Shigenobu Komatsu; Masanao Yamaoka; Masao Morimoto; Noriaki Maeda; Yasuhisa Shimazaki; Kenichi Osada

A multi-stage replica bitline technique for reducing access time by suppressing enable timing variation of a sense amplifier was developed. Applied to a 288-kbit SRAM of the 40-nm process node, this technique achieves 6.1% access time reduction by reducing the sense-amplifier timing variation by 43%.


symposium on vlsi circuits | 2012

A 0.41µA standby leakage 32Kb embedded SRAM with Low-Voltage resume-standby utilizing all digital current comparator in 28nm HKMG CMOS

Noriaki Maeda; Shigenobu Komatsu; Masao Morimoto; Yasuhisa Shimazaki

A high-performance and low-leakage current embedded SRAM for mobile phones is proposed. The proposed SRAM has a low-voltage resume-standby mode to reduce the standby leakage. An all digital current comparator is also proposed to choose a suitable standby mode. A test chip was fabricated using 28 nm HKMG CMOS technology. The proposed 32 Kb SRAM achives 0.41 μA standby leakage which is half of the conventional value, with 420 ps access.


IEEE Micro | 2013

Power-Management Features of R-Mobile U2, an Integrated Application Processor and Baseband Processor

Kazuki Fukuoka; Noriaki Maeda; Koji Nii; Masaki Fujigaya; Noriaki Sakamoto; Takao Koike; Takahiro Irita; Kohei Wakahara; Tsugio Matsuyama; Keiji Hasegawa; Toshiharu Saito; Akira Fukuda; Kaname Teranishi; Takeshi Kataoka; Toshihiro Hattori

R-mobile U2 integrates an application processor and an LTE-capable triple-band baseband processor in 28-nm technology to provide rich content to the mid-range market. Several power-management techniques are equipped, including a low-leakage power switch, dual-standby mode static RAM (SRAM), and frequency control for maximum power suppression.


Archive | 2007

Semiconductor memory device and semiconductor integrated circuit device

Noriyoshi Watanabe; Noriaki Maeda; Masanao Yamaoka; Yoshihiro Shinozaki


Archive | 2005

Semiconductor integrated circuite device

Noriaki Maeda; Yoshihiro Shinozaki; Masanao Yamaoka; Yasuhisa Shimazaki; Masanori Isoda; Koji Nii


Archive | 2010

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SYSTEM

Shigenobu Komatsu; Masanao Yamaoka; Noriaki Maeda; Masao Morimoto; Yasuhisa Shimazaki; Yasuyuki Okuma; Toshiaki Sano


Archive | 2010

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND OPERATING METHOD THEREOF

Shigenobu Komatsu; Masanao Yamaoka; Noriaki Maeda; Masao Morimoto; Yasuhisa Shimazaki


Archive | 2015

Semiconductor device including memory cell with transistors disposed in different active regions

Masao Morimoto; Noriaki Maeda; Yasuhisa Shimazaki

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