P. Basa
Hungarian Academy of Sciences
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Publication
Featured researches published by P. Basa.
Applied Physics Letters | 2010
Béla Szentpáli; P. Basa; P. Fürjes; G. Battistig; István Bársony; Gergely Karolyi; Tibor Berceli; Vitaly Rymanov; Andreas Stöhr
A thermopile structure is proposed for the detection of microwave/millimeter wave radiation. The thermopairs in the suggested linear arrangement function as antennas. 5.58 V/W responsivity was achieved at 100 GHz with 40 serial connected thermopairs. The experimentally observed polarity and frequency dependence convincingly verify the proper detector operation.
Journal of Applied Physics | 2009
P. Petrik; M. Fried; Eva Vazsonyi; P. Basa; T. Lohner; Peter Kozma; Zsolt Makkai
Porous silicon layers were prepared by electrochemical etching of p-type single-crystal Si (c-Si) of varying dopant concentration resulting in gradually changing morphology and nanocrystal (wall) sizes in the range of 2–25nm. We used the model dielectric function (MDF) of Adachi to characterize these porous silicon thin films of systematically changing nanocrystal size. In the optical model both the surface and interface roughnesses have to be taken into account, and the E0, E1, and E2 critical point (CP) features are all described by a combination of several lineshapes (two-dimensional CP, excitonic, damped harmonic oscillator). This results in using numerous parameters, so the number of fitted parameters were reduced by parameter coupling and neglecting insensitive parameters. Because of the large number of fitted parameters, cross correlations have to be investigated thoroughly. The broadening parameters of the interband transitions in the measured photon energy range correlate with the long-range orde...
Materials Science Forum | 2009
Zsolt József Horváth; P. Basa
The physical background and present status of the application of metal-insulator-silicon structures with semiconductor nanocrystals embedded in the insulator layer for memory purposes is breafly summarized.
RSC Advances | 2015
Emőke Albert; P. Basa; András Deák; Attila Németh; Zoltán Osváth; G. Sáfrán; Z. Zolnai; Zoltán Hórvölgyi; Norbert Nagy
Mesoporous silica thin films were patterned at the sub-micron scale utilizing the ion hammering effect in order to combine the advantages of mesoporous character and surface morphology, while preserving the interconnected pore system or creating laterally separated porous volumes surrounded by nonpermeable compact zones. Porous silica coatings were prepared by a sol–gel method with an ordered and disordered pore system using micellar templates. A hexagonally ordered Langmuir–Blodgett type monolayer of silica spheres was applied as a mask against Xe+ ion irradiation. The ion energy was chosen according to Monte-Carlo simulations to achieve structures with high lateral contrast between irradiated and unirradiated, i.e., masked areas. The disordered pore system proved to be more resistant against ion bombardment. Although the created surface morphologies were similar, the main character of the pore system could be tailored to be interconnected or separated by controlling the ion fluence. Confocal fluorescence images and ellipsometric porosimetry measurements confirmed that the contribution of transition zone between the intact masked and damaged regions to the porosity is negligible. Furthermore, the majority of the porous volume can be preserved as an interconnected pore system by the application of low ion fluence. By increasing the fluence value, however, separated porous volumes can be created at the expense of the total pore volume.
international spring seminar on electronics technology | 2009
Zsolt József Horváth; P. Basa; T. Jászi; Andrea Edit Pap; György Molnár; A.I. Kovalev; Dmitry Wainstein; Péter Turmezei
Memory structures with an embedded sheet of separated Si nanocrystals were prepared by low pressure chemical vapour deposition using a Si3N4 control and SiO2 tunnel layers. It was obtained that a properly located layer of Si or Ge nanocrystals can improve both the charging and rettntion behaviour of the MNOS structures simultaneously. Memory window width of about 6.6 V and retention time of 41 years has been achieved for charging pulses of ±15 V, 10 m.s.
Towards Intelligent Engineering and Information Technology | 2009
Zsolt József Horváth; P. Basa
The construction and the physical background of operation of floating gate, nanocrystal, silicon nitride-based, phase-change, ferroelectric and magnetoresistive memories are breafly summarized.
international conference on advanced semiconductor devices and microsystems | 2008
P. Basa; Zs. J. Horváth; T. Jászi; Andrea Edit Pap; G. Molnár; A. Kovalev; D. Wainstein; P. Turmezei
Memory structures with an embedded sheet of separated Si nanocrystals were prepared by low pressure chemical vapour deposition using a Si<sub>3</sub>N<sub>4</sub> control layer and SiO<sub>2</sub> or Si<sub>3</sub>N<sub>4</sub> tunnel layers. It was obtained that a properly located layer of Si nanocrystals improves the charging behaviour of the MNOS structures. Memory window width of about 6.6 V and retention time of 41 years has been achieved for charging pulses of plusmn15 V, 10 ms.
international conference on advanced semiconductor devices and microsystems | 2006
Zs. J. Horváth; P. Basa; T. Jászi; Andrea Edit Pap; P. Szollosi; K. Nagy; V. Hardy
Memory structures with an embedded sheet of separated Si nanocrystals were prepared by low pressure chemical vapour deposition using a Si<sub>3</sub>N<sub>4</sub> control layer and a SiO<sub>2</sub> or a Si<sub>3</sub>N<sub>4</sub> tunnel layer. It was obtained that the charging behaviour of structures with SiO<sub>2</sub> tunnel layer was better than with Si<sub>3</sub>N<sub>4</sub> tunnel layer
international conference on advanced semiconductor devices and microsystems | 2006
P. Basa; P. Petrik; M. Fried
Low-pressure chemical vapour deposited and annealed SiN<sub>x</sub>/nc-Si/SiN<sub>x</sub> and Si<sub>3</sub>N<sub>4</sub>/nc-Si/Si<sub>3</sub>N<sub>4</sub> layers prepared on Si substrates were characterized by spectroscopic ellipsometry. The effective medium approximation model was used to obtain the thickness, the composition and homogeneity of the layers. It was obtained that the deposited nc-Si layer thickness depended on the stoichiometry of the underlying silicon nitride layer
international semiconductor conference | 2005
P. Basa; P. Petrik
Low pressure chemical vapour deposited and annealed SiNx/nc-Si/SiNx layers prepared on Si substrates were characterized by spectroscopic ellipsometry. The effective medium approximation model was used to obtain the thickness, the composition and homogeneity of the layers. A significant effect of the deposition time and annealing process was obtained