Pierre Corfdir

Exciton localization on basal stacking faults in a-plane epitaxial lateral overgrown GaN grown by hydride vapor phase epitaxy

We present a detailed study of the luminescence at 3.42 eV usually observed in a-plane epitaxial lateral overgrowth (ELO) GaN grown by hydride vapor phase epitaxy on r-plane sapphire. This band is related to radiative recombination of excitons in a commonly encountered extended defect of a-plane GaN: I1 basal stacking fault. Cathodoluminescence measurements show that these stacking faults are essentially located in the windows and the N-face wings of the ELO-GaN and that they can appear isolated as well as organized into bundles. Time-integrated and time-resolved photoluminescence, supported by a qualitative model, evidence not only the efficient trapping of free excitons (FXs) by basal plane stacking faults but also some localization inside I1 stacking faults themselves. Measurements at room temperature show that FXs recombine efficiently with rather long luminescence decay times (360 ps), comparable to those encountered in high-quality GaN epilayers. We discuss the possible role of I1 stacking faults in...

Time-resolved spectroscopy on GaN nanocolumns grown by plasma assisted molecular beam epitaxy on Si substrates

A detailed study of excitons in unstrained GaN nanocolumns grown by plasma assisted molecular beam epitaxy on silicon substrates is presented. The time-integrated and time-resolved photoluminescence spectra do not depend significantly on the (111) or (001) Si surface used. However, an unusually high relative intensity of the two-electron satellite peak of the dominant donor-bound exciton line is systematically observed. We correlate this observation with the nanocolumn morphology determined by scanning electron microscopy, and therefore propose an interpretation based on the alteration of wave functions of excitonic complexes and of donor states by the proximity of the semiconductor surface. This explanation is supported by a model that qualitatively accounts for both relative intensities and time decays of the photoluminescence lines.

Low-temperature time-resolved cathodoluminescence study of exciton dynamics involving basal stacking faults in a-plane GaN

Time-resolved cathodoluminescence at 27 K has been performed on a-plane GaN grown by epitaxial lateral overgrowth. We detail the relaxation and recombination mechanisms of excitons [free or bound to neutral donors, or bound to I1-type basal stacking faults (BSFs)] in relation to the local density in BSFs. We describe the slow exciton capture rate on isolated BSFs by a diffusion model involving donors via a hopping process. Where BSFs are organized into bundles, we relate the shorter rise time to intra-BSF localization processes and the multiexponential decay to the type-II band alignment of BSFs in wurtzite GaN.

Molecular beam epitaxy of single crystalline GaN nanowires on a flexible Ti foil

We demonstrate the self-assembled growth of vertically aligned GaN nanowire ensembles on a flexible Ti foil by plasma-assisted molecular beam epitaxy. The analysis of single nanowires by transmission electron microscopy reveals that they are single crystalline. Low-temperature photoluminescence spectroscopy demonstrates that in comparison to standard GaN nanowires grown on Si, the nanowires prepared on the Ti foil exhibit an equivalent crystalline perfection, a higher density of basal-plane stacking faults, but a reduced density of inversion domain boundaries. The room-temperature photoluminescence spectrum of the nanowire ensemble is not influenced or degraded by the bending of the substrate. The present results pave the way for the fabrication of flexible optoelectronic devices based on GaN nanowires on metal foils.

Exciton recombination dynamics in a-plane (Al,Ga)N/GaN quantum wells probed by picosecond photo and cathodoluminescence

We present a combined low-temperature time-resolved cathodoluminescence and photoluminescence study of exciton recombination mechanisms in a 3.8 nm thick a-plane (Al,Ga)N/GaN quantum well (QW). We observe the luminescence from QW excitons and from excitons localized on basal stacking faults (BSFs) crossing the QW plane, forming quantum wires (QWRs) at the intersection. We show that the dynamics of QW excitons is dominated by their capture on QWRs, with characteristic decay times ranging from 50 to 350 ps, depending on whether the local density of BSFs is large or small. We therefore relate the multiexponential behavior generally observed by time-resolved photoluminescence in non-polar (Al,Ga)/GaN QW to the spatial dependence of QW exciton dynamics on the local BSF density. QWR exciton decay time is independent of the local density in BSFs and its temperature evolution exhibits a zero-dimensional behavior below 60 K. We propose that QWR exciton localization along the wire axis is induced by well-width fluc...

Stacking faults as quantum wells in nanowires: Density of states, oscillator strength, and radiative efficiency

We investigate the nature of excitons bound to I1 basal-plane stacking faults [(I1,X)] in GaN nanowire ensembles by continuous-wave and time-resolved photoluminescence spectroscopy. Based on the linear increase of the radiative lifetime of these excitons with temperature, they are demonstrated to exhibit a two-dimensional density of states, i.e., a basal-plane stacking fault acts as a quantum well. From the slope of the linear increase, we determine the oscillator strength of the (I1,X) and show that the value obtained reflects the presence of large internal electrostatic fields across the stacking fault. While the recombination of donor-bound and free excitons in the GaN nanowire ensemble is dominated by nonradiative phenonema already at 10 K, we observe that the (I1,X) recombines purely radiatively up to 60 K. This finding provides important insight into the nonradiative recombination processes in GaN nanowires. First, the radiative lifetime of about 6 ns measured at 60 K sets an upper limit for the surface recombination velocity of 210 cm s −1 considering the nanowires mean diameter of 50 nm. Second, the density of nonradiative centers responsible for the fast decay of donor-bound and free excitons cannot be higher than 6 × 10 16 cm −3 . As a consequence, the nonradiative decay of donor-bound excitons in these GaN nanowire ensembles has to occur indirectly via the free exciton state.

Advantages and remaining issues of state-of-the-art m-plane freestanding GaN substrates grown by halide vapor phase epitaxy for m-plane InGaN epitaxial growth

Advantages and remaining issues of state-of-the-art m-plane freestanding GaN (FS-GaN) substrates grown by halide vapor phase epitaxy (HVPE) for m-plane InxGa1 − xN epitaxial film growth by metalorganic vapor phase epitaxy are described. Because of the low threading dislocation and basal-plane stacking fault densities, improved quantum efficiency and short radiative lifetime are achieved for the near-band-edge emission of 200–250 nm thick m-plane pseudomorphic InxGa1 − xN (x ⩽ 0.14) epilayers. Values of full-width at half-maximum for the x-ray ω-rocking curves remain unchanged as the substrate values being 80 and 60 arcsec for the (100) diffraction with 〈0001〉 and azimuths, respectively, and 80 arcsec for the (102) diffraction. As the surface flatness is greatly improved, the In-incorporation efficiency (ηIninc) is lower than the cases for conventional c-plane growth and m-plane growths on defective GaN bases. The former originates from nonidentical surface kinetics, and the latter is due to the reduction in the area of inclined and tilted planes. Sub-micrometer-wide zonary patterns parallel to the c-axis and 2 μm long axis figure-of-eight patterns parallel to the a-axis are clearly visualized in the monochromatic cathodoluminescence (CL) intensity images. Because the spatio-time-resolved CL measurement reveals very little spatial variation of low-temperature radiative lifetime, the slight peak energy variation is interpreted to originate from nonidentical ηIninc for the growing surfaces exhibiting various miscut angles. The figure-of-eight patterns are ascribed to originate from the anisotropic, severe m-plane tilt mosaic along the a-axis of the GaN substrate, and the zonary patterns may originate from the m-plane tilt mosaic along the c-axis. Further reduction in the tilt and twist mosaics is necessary for HVPE of FS-GaN substrates, in order to grow homogeneous InGaN epilayers.

Three-Dimensional Magneto-Photoluminescence as a Probe of the Electronic Properties of Crystal-Phase Quantum Disks in GaAs Nanowires

Crystal-phase engineering has emerged as a novel method of bandgap engineering, made feasible by the high surface-to-volume ratio of nanowires. There remains intense debate about the exact characteristics of the band structure of the novel crystal phases, such as wurtzite GaAs, obtained by this approach. We attack this problem via a low-temperature angle-dependent magneto-photoluminescence study of wurtzite/zinc-blende quantum disks in single GaAs nanowires. The exciton diamagnetic coefficient is proportional to the electron-hole correlation length, enabling a determination of the spatial extent of the exciton wave function in the plane and along the confinement axis of the crystal-phase quantum disks. Depending on the disk nature, the diamagnetic coefficient measured in Faraday geometry ranges between 25 and 75 μeV/T(2). For a given disk, the diamagnetic coefficient remains constant upon rotation of the magnetic field. Along with our envelope function calculation accounting for excitonic effects, we demonstrate that the electron effective mass in wurtzite GaAs quantum disks is heavy, mostly isotropic and results from mixing of the two lower-energy conduction bands with Γ7 and Γ8 symmetries. Finally, we discuss the implications of the results of the angle dependent magneto-luminescence for the likely symmetry of the exciton states. This work provides important insight in the band structure of wurtzite GaAs for future nanowire-based polytypic bandgap engineering.

Sub-meV linewidth in GaN nanowire ensembles: Absence of surface excitons due to the field ionization of donors

We observe unusually narrow donor-bound exciton transitions (400 µeV) in the photoluminescence spectra of GaN nanowire ensembles grown on Si(111) substrates at very high (>850 ∘C) temperatures. The spectra of these samples reveal a prominent transition of excitons bound to neutral Si impurities which is not observed for samples grown under standard conditions. Motivated by these experimental results, we investigate theoretically the impact of surface-induced internal electric fields on the binding energy of donors by a combined Monte Carlo and envelope function approach. We obtain the ranges of doping and diameter for which the potential is well described using the Poisson equation, where one assumes a spatially homogeneous distribution of dopants. Our calculations also show that surface donors in nanowires with a diameter smaller than 100 nm are ionized when the surface electric field is larger than about 10 kV/cm, corresponding to a doping level higher than 2×1016cm−3. This result explains the experimental observation: since the (D+,X) complex is not stable in GaN, surface-donor-bound excitons do not contribute to the photoluminescence spectra of GaN nanowires above a certain doping level, and the linewidth reflects the actual structural perfection of the nanowire ensemble.

Charge carrier generation, relaxation, and recombination in polytypic GaAs nanowires studied by photoluminescence excitation spectroscopy

We report results of a study of polytypic GaAs nanowires using low-temperature photoluminescence excitation spectroscopy. The nanowire ensemble shows a strong absorption at 1.517 eV, as a result of resonant generation of heavy-hole excitons in the zinc-blende segments of the nanowires. Excitons then diffuse along the length of the nanowire and are trapped by the type-II quantum discs arising from the zinc-blende/wurtzite crystal structure alternation and recombine radiatively. Finally, experiments on single nanowires demonstrate that the energy of the Γ7 conduction band to Γ9 valence band exciton of wurtzite GaAs is 1.521 eV at 4 K.