Pradyumna Thiruvenkatanathan

Enhancing Parametric Sensitivity in Electrically Coupled MEMS Resonators

In an array of identical resonators coupled through weak springs, a small perturbation in the structural properties of one of the resonators strongly impacts coupled oscillations causing the vibration modes to localize. Theoretical studies show that measuring the variation in eigenstates due to such vibration-mode localization can yield orders of magnitude enhancement in signal sensitivity over the technique of simply measuring induced resonant-frequency shifts. In this paper, we propose the application of mode localization for detecting small perturbations in stiffness in pairs of nearly identical weakly coupled microelectromechanical-system resonators and also examine the effect of initial mechanical asymmetry caused by fabrication tolerances in such sensors. For the first time, the variation in eigenstates is studied by coupling the resonators using electrostatic means that allow for significantly weaker coupling-spring constants and the possibility for stronger localization of vibration modes. Eigenstate variations that are nearly three orders of magnitude greater than the corresponding shifts in the resonant frequency for an induced perturbation in stiffness are experimentally demonstrated. Such high electrically tunable parametric sensitivities, together with the added advantage of intrinsic common-mode rejection, pave the way to a new paradigm of mechanical sensing.

Ultrasensitive mode-localized mass sensor with electrically tunable parametric sensitivity

We use the phenomena of mode localization and vibration confinement in pairs of weakly coupled, nearly identical microelectromechanical (MEMS) resonators as an ultrasensitive technique of detecting added mass on the resonator. The variations in the eigenstates for induced mass additions are studied and compared with corresponding resonant frequency shifts in pairs of MEMS resonators that are coupled electrostatically. We demonstrate that the relative shifts in the eigenstates can be over three orders of magnitude greater than those in resonant frequency for the same addition of mass. We also investigate the effects of voltage controlled electrical spring tuning on the parametric sensitivity of such sensors and demonstrate sensitivities tunable by over 400%.

A Seismic-Grade Resonant MEMS Accelerometer

We report on the characterization of a high-resolution micromachined resonant accelerometer fabricated in an SoI-microelectromechanical (MEMS) foundry process. A prototype device demonstrated scale factor of 142.8 Hz/m/s2, dynamic range of >140 dB, and noise-limited resolution that is comparable with existing high-resolution macroscale seismometers. Experimental characterisation detailing the benchmarking of the MEMS prototype relative to an existing macroscale seismometer shows that the MEMS device tracks the passive ambient seismic response measured by a macroscale seismometer (Guralp systems CMG-3TD) over a measurement bandwidth extending from near dc (0.02 Hz) up to 100 Hz.

Manipulating Vibration Energy Confinement in Electrically Coupled Microelectromechanical Resonator Arrays

This paper reports the first detailed experimental evidence of the phenomena of eigenvalue loci veering and vibration mode localization in microelectromechanical resonator arrays subjected to weak electroelastic coupling. A rapid but continuous interchange of the eigenfunctions associated with the eigenvalues is experimentally observed during veering as the variations in the eigenvalues are studied for induced stiffness variations on one of the coupled resonators. It is also noticed that the electrical tunability of the coupling spring constant in such microsystems enables a manipulation of the severity of modal interchange during veering and in consequence, the extent of energy confinement within the system. These results, while experimentally confirming the elastic behavior of such electrical coupling elements, also suggest that such microsystems provide a unique platform for investigating the general nature and properties of these dynamic phenomena under significantly weaker tunable coupling spring constants that are very difficult to implement in corresponding “macroscopic” systems.

Limits to mode-localized sensing using micro- and nanomechanical resonator arrays

In recent years, the concept of utilizing the phenomenon of vibration mode-localization as a paradigm of mechanical sensing has made profound impact in the design and development of highly sensitive micro- and nanomechanical sensors. Unprecedented enhancements in sensor response exceeding three orders of magnitude relative to the more conventional resonant frequency shift based technique have been both theoretically and experimentally demonstrated using this new sensing approach. However, the ultimate limits of detection and in consequence, the minimum attainable resolution in such mode-localized sensors still remain uncertain. This paper aims to fill this gap by investigating the limits to sensitivity enhancement imposed on such sensors, by some of the fundamental physical noise processes, the bandwidth of operation and the noise from the electronic interfacial circuits. Our analyses indicate that such mode-localized sensors offer tremendous potential for highly sensitive mass and stiffness detection with ultimate resolutions that may be orders of magnitude better than most conventional micro- and nanomechanical resonant sensors.

Mode-Localized Displacement Sensing

We report the construction of a new class of micromachined displacement sensors that employ the phenomenon of vibration-mode localization for monitoring minute inertial displacements. It is demonstrated both theoretically and experimentally that the eigenstate-shifted output signal of such mode-localized displacement sensors may be as high as 1000 times greater than corresponding resonant-frequency variations that serve as the output in the more traditional vibratory resonant micromechanical displacement/motion sensors. The high parametric sensitivities attainable in such mode-localized displacement sensors, together with their inherent advantages of improved environmental robustness and electrical tunability, suggest an alternative approach in achieving improved sensitivity and stability in high-resolution displacement transduction.

Differential amplification of structural perturbations in weakly coupled MEMS resonators

Measuring shifts in eigenstates caused by vibration localization in an array of weakly coupled resonators offers 2 distinct advantages for sensor applications compared with the technique of simply measuring resonant frequency shifts: 1) orders of magnitude enhancement in parametric sensitivity; and 2) intrinsic common mode rejection. In this paper, we experimentally demonstrate the common mode rejection in weakly coupled MEMS resonators with significant potential implications for sensor applications. The vibration behavior is studied in pairs of nearly identical MEMS resonators that are electrically coupled and subjected to small perturbations in stiffness under different ambient pressure and temperature. The shifts in the eigenstates for the same parametric perturbation in stiffness are experimentally demonstrated to be more than 3 orders of magnitude greater than corresponding resonant frequency variations. They are also shown to remain relatively constant to variations in ambient temperature and pressure. This increased relative robustness to environmental drift, along with the advantage of ultra-high parametric sensitivity, opens the door to an alternative approach to achieving higher sensitivity and stability in micromechanical sensors.

Electrical actuation and readout in a nanoelectromechanical resonator based on a laterally suspended zinc oxide nanowire.

In this paper, we present experimental results describing enhanced readout of the vibratory response of a doubly clamped zinc oxide (ZnO) nanowire employing a purely electrical actuation and detection scheme. The measured response suggests that the piezoelectric and semiconducting properties of ZnO effectively enhance the motional current for electromechanical transduction. For a doubly clamped ZnO nanowire resonator with radius ~10 nm and length ~1.91 µm, a resonant frequency around 21.4 MHz is observed with a quality factor (Q) of ~358 in vacuum. A comparison with the Q obtained in air (~242) shows that these nano-scale devices may be operated in fluid as viscous damping is less significant at these length scales. Additionally, the suspended nanowire bridges show field effect transistor (FET) characteristics when the underlying silicon substrate is used as a gate electrode or using a lithographically patterned in-plane gate electrode. Moreover, the Youngs modulus of ZnO nanowires is extracted from a static bending test performed on a nanowire cantilever using an AFM and the value is compared to that obtained from resonant frequency measurements of electrically addressed clamped–clamped beam nanowire resonators.

Ultrasensitive mode-localized micromechanical electrometer

We report a highly sensitive prototype micromechanical electrometer that employs the phenomena of mode-localization and curve veering for monitoring minute charge fluctuations across an input capacitor. The device consists of a pair of weakly coupled, nearly identical single crystal silicon, double-ended tuning fork (DETF) resonators. An addition of charge across an input capacitor on one of the coupled resonators induces a differential axial strain on that resonator relative to the other consequently perturbing the structural symmetry of the nearly periodic system. The resulting shifts in the eigenstates for the same magnitudes of charge input are theoretically and experimentally demonstrated to be nearly three orders of magnitude greater than corresponding resonant frequency variations. The topology chosen may also be adapted for force or strain monitoring thereby widening the relevance of the results reported here to precision inertial sensing as well.

Impact of mode localization on the motional resistance of coupled MEMS resonators

This paper investigates the effect of mode-localization that arises from structural asymmetry induced by manufacturing tolerances in mechanically coupled, electrically transduced Si MEMS resonators. We demonstrate that in the case of such mechanically coupled resonators, the achievable series motional resistance (Rx) is dependent not only on the quality factor (Q) but also on the variations in the eigenvector of the chosen mode of vibration induced by mode localization due to manufacturing tolerances during the fabrication process. We study this effect of mode-localization both theoretically and experimentally in two pairs of coupled double-ended tuning fork resonators with different levels of initial structural asymmetry. The measured series Rx is minimal when the system is close to perfect symmetry and any deviation from structural symmetry induced by fabrication tolerances leads to a degradation in the effective Rx. Mechanical tuning experiments of the stiffness of one of the coupled resonators was also conducted to study variations in Rx as a function of structural asymmetry within the system, the results of which demonstrated consistent variations in motional resistance with predictions.