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Dive into the research topics where Qinghu Xu is active.

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Featured researches published by Qinghu Xu.


PHYSICS OF SEMICONDUCTORS: 28th International Conference on the Physics of Semiconductors - ICPS 2006 | 2007

Melting Kinetics of Confined Systems at the Nanoscale: Superheating and Supercooling

Ian D. Sharp; Qinghu Xu; C. W. Yuan; D. O. Yi; C. Y. Liao; Andreas M. Glaeser; Andrew M. Minor; J W Beeman; Mark C Ridgway; Patrick Kluth; Joel W. Ager; D. C. Chrzan; E. E. Haller

In situ electron diffraction measurements of silica‐embedded Ge nanocrystals reveal a melting/solidification hysteresis of 470 K which is approximately symmetric about the bulk melting point. This surprising behavior, which is thought to be impossible in bulk systems, is well described by a simple, classical thermodynamic model. Surface pre‐melting, which occurs for materials with free surfaces, is suppressed by the presence of the host matrix, thereby allowing both kinetic supercooling and kinetic superheating of the embedded nanocrystals.


Physical Review Letters | 2006

Large melting-point hysteresis of Ge nanocrystals embedded in SiO2.

Qinghu Xu; Ian D. Sharp; C.W. Yuan; D.O. Yi; C. Y. Liao; Andreas M. Glaeser; Andrew M. Minor; J. W. Beeman; Mark C Ridgway; Patrick Kluth; Joel W. Ager; D. C. Chrzan; Eugene E. Haller


Physical Review Letters | 1995

Xuet al.Reply

Qinghu Xu; Ian D. Sharp; C.W. Yuan; D.O. Yi; C. Y. Liao; Andreas M. Glaeser; Andrew M. Minor; J. W. Beeman; Mark C Ridgway; Patrick Kluth; Joel W. Ager; D. C. Chrzan; Eugene E. Haller


Lawrence Berkeley National Laboratory | 2008

Photo-oxidation of Ge Nanocrystals: Kinetic Measurements by In Situ Raman Spectroscopy

Ian D. Sharp; Qinghu Xu; C.W. Yuan; J. W. Beeman; Joel W. Ager; D. C. Chrzan; Eugene E. Haller


Physical Review Letters | 2007

Xu etal. Reply

Qinghu Xu; Ian D. Sharp; Cheng-Wei Yuan; Diana Ofelia Yi; C. Y. Liao; Andreas M. Glaeser; Andrew M. Minor; Jeffrey W. Beeman; Mark C Ridgway; Patrick Kluth; Joel W. Ager; D. C. Chrzan; E. E. Haller


Physical Review Letters | 2006

Publisher’s Note: Large Melting-Point Hysteresis of Ge Nanocrystals Embedded in SiO 2 [Phys. Rev. Lett. 97 , 155701 (2006)]

Qinghu Xu; Ian D. Sharp; C.W. Yuan; D.O. Yi; C. Y. Liao; Andreas M. Glaeser; Andrew M. Minor; J. W. Beeman; Mark C Ridgway; Patrick Kluth; Joel W. Ager; D. C. Chrzan; Eugene E. Haller


Lawrence Berkeley National Laboratory | 2005

Stable, free-standing Ge nanocrystals

Ian D. Sharp; Qinghu Xu; C. Y. Liao; D.O. Yi; J. W. Beeman; Z. Liliental-Weber; K. M. Yu; D. Zakharov; Joel W. Ager; E. E. Haller


Lawrence Berkeley National Laboratory | 2005

A Chemical Approach to 3-D Lithographic Patterning of Si and Ge Nanocrystals

Ian D. Sharp; Qinghu Xu; D.O. Yi; C. Y. Liao; Joel W. Ager; J. W. Beeman; K. M. Yu; Jeremy T. Robinson; O. D. Dubon; D. C. Chrzan; Eugene E. Haller


Archive | 2004

Theory of Stress Relaxation During Annealing of Ion Beam Synthesized Nanocrystals

Diana Ofelia Yi; Ian D. Sharp; Qinghu Xu; C. Y. Liao; Joel W. Ager; Jeffrey W. Beeman; Z. Liliental-Weber; Kin Man Yu; D. Zakharov; Eugene E. Haller; D. C. Chrzan


Archive | 2003

Liberation of Ge Nanocrystals from SiO2 Thin Films

Ian D. Sharp; Qinghu Xu; Eugene E. Haller; C. Y. Liao; Joel W. Ager; Jeffrey W. Beeman; Z. Liliental-Weber; Kin Man Yu; D. Zakharov

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Joel W. Ager

Lawrence Berkeley National Laboratory

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C. Y. Liao

University of California

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Eugene E. Haller

Lawrence Livermore National Laboratory

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D. C. Chrzan

University of California

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J. W. Beeman

Lawrence Berkeley National Laboratory

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D.O. Yi

University of California

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Jeffrey W. Beeman

Lawrence Berkeley National Laboratory

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Z. Liliental-Weber

Lawrence Berkeley National Laboratory

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Mark C Ridgway

Australian National University

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