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Dive into the research topics where Rajen S. Sidhu is active.

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Featured researches published by Rajen S. Sidhu.


Journal of Electronic Materials | 2012

Fracture of Sn-Ag-Cu Solder Joints on Cu Substrates:I. Effects of Loading and Processing Conditions

Z. Huang; Praveen Kumar; I. Dutta; John Hock Lye Pang; Rajen S. Sidhu; M. Renavikar; R. Mahajan

During service, microcracks form inside solder joints, making microelectronic packages highly prone to failure on dropping. Hence, the fracture behavior of solder joints under drop conditions at high strain rates and under mixed-mode conditions is a critically important design consideration for robust joints. This study reports on the effects of joint processing and loading conditions on the microstructure and fracture response of Sn-3.8%Ag-0.7%Cu (SAC387) solder joints attached to Cu substrates. The impact of parameters which control the microstructure (reflow condition, aging) as well as loading conditions (strain rate and loading angle) are explicitly studied. A methodology based on the calculation of the critical energy release rate, GC, using compact mixed-mode (CMM) samples was developed to quantify the fracture toughness of the joints under conditions of adhesive (i.e., interface-related) fracture. In general, higher strain rate and increased mode-mixity resulted in decreased GC. GC also decreased with increasing dwell time at reflow temperature, which produced a thicker intermetallic layer at the solder–substrate interface. Softer solders, produced by slower cooling following reflow, or post-reflow aging, showed enhanced GC. The sensitivity of the fracture toughness to all of the aforementioned parameters reduced with an increase in the mode-mixity. Fracture mechanisms, elucidating the effects of the loading conditions and process parameters, are briefly highlighted.


ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, MEMS and NEMS: Volume 2 | 2011

High Strain Rate Fracture Behavior of Sn-Ag-Cu Solder Joints on Cu Substrates

Z. Huang; Praveen Kumar; I. Dutta; John H. L. Pang; Rajen S. Sidhu; M. Renavikar; R. Mahajan

During service, micro-cracks form inside solder joints, making a microelectronic package prone to failure particularly during a drop. Hence, the understanding of the fracture behavior of solder joints under drop conditions, synonymously at high strain rates and in mixed mode, is critically important. This study reports: (i) the effects of processing conditions (reflow parameters and aging) on the microstructure and fracture behavior of Sn-3.8%Ag-0.7%Cu (SAC387) solder joints attached to Cu substrates, and (ii) the effects of the loading conditions (strain rate and loading angle) on the fracture toughness of these joints, especially at high strain rates. A methodology for calculating critical energy release rate, GC , was employed to quantify the fracture toughness of the joints. Two parameters, (i) effective thickness of the interfacial intermetallic compounds (IMC) layer, which is proportional to the product of the thickness and the roughness of the IMC layer, and (ii) yield strength of the solder, which depends on the solder microstructure and the loading rate, were identified as the dominant quantities affecting the fracture behavior of the solder joints. The fracture toughness of the solder joint decreased with an increase in the effective thickness of the IMC layer and the yield strength of the solder. A 2-dimensional fracture mechanism map with the effective thickness of the IMC layer and the yield strength of the solder as two axes and the fracture toughness as well as the fraction of different fracture paths as contour-lines was prepared. Trends in the fracture toughness of the solder joints and their correlation with the fracture modes are explained using the fracture mechanism map.Copyright


electronics packaging technology conference | 2010

Fracture mechanism map for the fracture of microelectronic Pb-free solder joints under dynamic loading conditions

Z. Huang; Praveen Kumar; I. Dutta; John H. L. Pang; Rajen S. Sidhu; M. Renavikar; R. Mahajan

Solder joints, which serve as mechanical and electrical interconnects in a package, are particularly prone to failure during a drop. Hence, the fracture behavior of solders at high strain rates and in mixed mode is a critically important design parameter. This study reports the effects of (a) loading conditions (strain rate and loading angle), (b) reflow parameters (dwell time and cooling rate), and (c) post-reflow aging on the mixed mode fracture toughness of a lead-free solder (Sn-3.8%Ag-0.7%Cu)/Cu joint. A methodology based on the calculation of critical energy release rate, GC, which is equal to the fracture toughness of a material under limited plasticity condition, was employed. An increase in the strain rate results in limited plasticity ahead of the crack tip leading to a reduction in the fracture toughness of the solder joints. Fracture toughness also decreases with increasing mode-mixity (up to a loading angle of 75°). A slower cooling rate increases the fracture toughness whereas a longer dwell time adversely affects it. Also, aged samples show higher GC value. A fracture mechanism map is developed to describe the correlation between the yield strength of the solder, which depends on the solder microstructure and the loading rate, the IMC morphology, which depends on the reflow conditions and aging, and the fracture toughness of the solder joint.


Journal of Electronic Materials | 2012

Fracture of Sn-Ag-Cu Solder Joints on Cu Substrates. II: Fracture Mechanism Map

Praveen Kumar; Z. Huang; I. Dutta; Rajen S. Sidhu; M. Renavikar; R. Mahajan


Archive | 2013

HYBRID SOLDER AND FILLED PASTE IN MICROELECTRONIC PACKAGING

Hongjin Jiang; Arun Kumar C. Nallani; Rajen S. Sidhu; Martha A. Dudek; Weihua Tang


Archive | 2014

MULTI-SOLDER TECHNIQUES AND CONFIGURATIONS FOR INTEGRATED CIRCUIT PACKAGE ASSEMBLY

Rajen S. Sidhu; Wei Hu; Carl L. Deppisch; Martha A. Dudek


JOM | 2011

Impact of processing conditions and solder materials on surface mount assembly defects

Rajen S. Sidhu; Raiyo Aspandiar; Steve Vandervoort; Dudi Amir; Gregorio Murtagian


Journal of Materials Science | 2014

Interfacially engineered liquid-phase-sintered Cu–In composite solders for thermal interface material applications

J. Liu; Uttara Sahaym; I. Dutta; Rishi Raj; M. Renavikar; Rajen S. Sidhu; R. Mahajan


Archive | 2015

Methods of forming ultra thin package structures including low temperature solder and structures formed therby

Sriram Srinivasan; Ram S. Viswanath; Paul R. Start; Rajen S. Sidhu; Rajasekaran Swaminathan


Archive | 2012

FLUX MATERIALS FOR HEATED SOLDER PLACEMENT AND ASSOCIATED TECHNIQUES AND CONFIGURATIONS

Rajen S. Sidhu; Martha A. Dudek; Wei Tan

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I. Dutta

Washington State University

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Z. Huang

Washington State University

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Praveen Kumar

Indian Institute of Science

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John H. L. Pang

Nanyang Technological University

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