Rajen S. Sidhu
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Featured researches published by Rajen S. Sidhu.
Journal of Electronic Materials | 2012
Z. Huang; Praveen Kumar; I. Dutta; John Hock Lye Pang; Rajen S. Sidhu; M. Renavikar; R. Mahajan
During service, microcracks form inside solder joints, making microelectronic packages highly prone to failure on dropping. Hence, the fracture behavior of solder joints under drop conditions at high strain rates and under mixed-mode conditions is a critically important design consideration for robust joints. This study reports on the effects of joint processing and loading conditions on the microstructure and fracture response of Sn-3.8%Ag-0.7%Cu (SAC387) solder joints attached to Cu substrates. The impact of parameters which control the microstructure (reflow condition, aging) as well as loading conditions (strain rate and loading angle) are explicitly studied. A methodology based on the calculation of the critical energy release rate, GC, using compact mixed-mode (CMM) samples was developed to quantify the fracture toughness of the joints under conditions of adhesive (i.e., interface-related) fracture. In general, higher strain rate and increased mode-mixity resulted in decreased GC. GC also decreased with increasing dwell time at reflow temperature, which produced a thicker intermetallic layer at the solder–substrate interface. Softer solders, produced by slower cooling following reflow, or post-reflow aging, showed enhanced GC. The sensitivity of the fracture toughness to all of the aforementioned parameters reduced with an increase in the mode-mixity. Fracture mechanisms, elucidating the effects of the loading conditions and process parameters, are briefly highlighted.
ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, MEMS and NEMS: Volume 2 | 2011
Z. Huang; Praveen Kumar; I. Dutta; John H. L. Pang; Rajen S. Sidhu; M. Renavikar; R. Mahajan
During service, micro-cracks form inside solder joints, making a microelectronic package prone to failure particularly during a drop. Hence, the understanding of the fracture behavior of solder joints under drop conditions, synonymously at high strain rates and in mixed mode, is critically important. This study reports: (i) the effects of processing conditions (reflow parameters and aging) on the microstructure and fracture behavior of Sn-3.8%Ag-0.7%Cu (SAC387) solder joints attached to Cu substrates, and (ii) the effects of the loading conditions (strain rate and loading angle) on the fracture toughness of these joints, especially at high strain rates. A methodology for calculating critical energy release rate, GC , was employed to quantify the fracture toughness of the joints. Two parameters, (i) effective thickness of the interfacial intermetallic compounds (IMC) layer, which is proportional to the product of the thickness and the roughness of the IMC layer, and (ii) yield strength of the solder, which depends on the solder microstructure and the loading rate, were identified as the dominant quantities affecting the fracture behavior of the solder joints. The fracture toughness of the solder joint decreased with an increase in the effective thickness of the IMC layer and the yield strength of the solder. A 2-dimensional fracture mechanism map with the effective thickness of the IMC layer and the yield strength of the solder as two axes and the fracture toughness as well as the fraction of different fracture paths as contour-lines was prepared. Trends in the fracture toughness of the solder joints and their correlation with the fracture modes are explained using the fracture mechanism map.Copyright
electronics packaging technology conference | 2010
Z. Huang; Praveen Kumar; I. Dutta; John H. L. Pang; Rajen S. Sidhu; M. Renavikar; R. Mahajan
Solder joints, which serve as mechanical and electrical interconnects in a package, are particularly prone to failure during a drop. Hence, the fracture behavior of solders at high strain rates and in mixed mode is a critically important design parameter. This study reports the effects of (a) loading conditions (strain rate and loading angle), (b) reflow parameters (dwell time and cooling rate), and (c) post-reflow aging on the mixed mode fracture toughness of a lead-free solder (Sn-3.8%Ag-0.7%Cu)/Cu joint. A methodology based on the calculation of critical energy release rate, GC, which is equal to the fracture toughness of a material under limited plasticity condition, was employed. An increase in the strain rate results in limited plasticity ahead of the crack tip leading to a reduction in the fracture toughness of the solder joints. Fracture toughness also decreases with increasing mode-mixity (up to a loading angle of 75°). A slower cooling rate increases the fracture toughness whereas a longer dwell time adversely affects it. Also, aged samples show higher GC value. A fracture mechanism map is developed to describe the correlation between the yield strength of the solder, which depends on the solder microstructure and the loading rate, the IMC morphology, which depends on the reflow conditions and aging, and the fracture toughness of the solder joint.
Journal of Electronic Materials | 2012
Praveen Kumar; Z. Huang; I. Dutta; Rajen S. Sidhu; M. Renavikar; R. Mahajan
Archive | 2013
Hongjin Jiang; Arun Kumar C. Nallani; Rajen S. Sidhu; Martha A. Dudek; Weihua Tang
Archive | 2014
Rajen S. Sidhu; Wei Hu; Carl L. Deppisch; Martha A. Dudek
JOM | 2011
Rajen S. Sidhu; Raiyo Aspandiar; Steve Vandervoort; Dudi Amir; Gregorio Murtagian
Journal of Materials Science | 2014
J. Liu; Uttara Sahaym; I. Dutta; Rishi Raj; M. Renavikar; Rajen S. Sidhu; R. Mahajan
Archive | 2015
Sriram Srinivasan; Ram S. Viswanath; Paul R. Start; Rajen S. Sidhu; Rajasekaran Swaminathan
Archive | 2012
Rajen S. Sidhu; Martha A. Dudek; Wei Tan