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Publication
Featured researches published by Richard I. Kaufman.
SID Symposium Digest of Technical Papers | 2003
Takatoshi Tsujimura; Yoshinao Kobayashi; Kohji Murayama; Atsushi Tanaka; Mitsuo Morooka; Eri Fukumoto; Hiroki Fujimoto; Junichi Sekine; Keigo Kanoh; Keizo Takeda; Koichi Miwa; Motohiko Asano; Nami Ikeda; Sayuri Kohara; Shinya Ono; Chia-Tin Chung; Ruey-Min Chen; Jun-Wen Chung; Chen-Wei Huang; Hong-Ru Guo; Cheng-Chung Yang; Chun-Che Hsu; Hao-Jung Huang; Walter Riess; Heike Riel; S. Karg; Tilman A. Beierlein; Dave Gundlach; Santos F. Alvarado; Constance Rost
A 20-inch, largest OLED display in the world is demonstrated which is driven by “Super Amorphous Silicon” technology. It has been widely believed that the characteristics of amorphous silicon TFT is not sufficient to drive OLED display. This paper turns over the hypothesis to prove that amorphous silicon can be applied to the large active-matrix driven displays. Novel approaches to enable amorphous silicon to drive bright and long life OLED display are shown to open a bright future to realize larger OLED televisions.
Ibm Journal of Research and Development | 1998
Evan G. Colgan; Paul Matthew Alt; Robert L. Wisnieff; Peter M. Fryer; Eileen A. Galligan; William S. Graham; Paul F. Greier; Raymond Robert Horton; Harold Ifill; Leslie Charles Jenkins; Richard A. John; Richard I. Kaufman; Yue Kuo; Alphonso P. Lanzetta; Kenneth F. Latzko; Frank R. Libsch; Shui-Chih Alan Lien; Steven Edward Millman; Robert Wayne Nywening; Robert J. Polastre; Carl G. Powell; Rick A. Rand; John J. Ritsko; Mary Beth Rothwell; John L. Staples; Kevin W. Warren; J. Wilson; Steven L. Wright
A 157-dot-per-inch, 262K-color, 10.5-in.- diagonal, 1280 × 1024 (SXGA) display has been fabricated using a six-mask process with Cu or Al-alloy thin-film gates. The combination of high resolution and gray-scale accuracy has been shown to render color images and text with paperlike legibility. The low-resistivity gate metallization and trilayer-type TFTs with a channel length of 6-8 µm were fabricated with a six-mask process which is extendible to larger, higher-resolution displays. A combination of double-sided driving and active line repair was used so that open gate lines or data lines did not result in visible line defects. A flexible drive-electronics system was developed to address the display and characterize its performance under different drive conditions.
Archive | 2001
Paul F. Greier; Kenneth C. Ho; Richard I. Kaufman; Steven Edward Millman; Gerhard Robert Thompson; Steven L. Wright; Chai Wah Wu
Archive | 2002
Thomas Mario Cipolla; Richard I. Kaufman; Lawrence S. Mok
Archive | 2009
Steven T. Berman; Paul F. Greier; Kenneth C. Ho; Richard I. Kaufman; Alphonso P. Lanzetta; Michael Mastro; Steven Edward Millman; Ron Ridgeway; Kai Schleupen; Steven L. Wright
Archive | 1991
Chengjun Julian Chen; Richard I. Kaufman; Julian P. Partridge
Archive | 2001
Paul F. Greier; Kenneth C. Ho; Richard I. Kaufman; Steven Edward Millman; Gerhard Robert Thompson; Steven L. Wright; Chai W. Wu
Archive | 1996
Frank J. Canora; Michael Frank Cina; Brian P. Gaucher; Paul F. Greier; Richard I. Kaufman; Alphonso Philip Lanzetta; Lawrence Shungwei Mok; Robert Stephen Olyha; Saila Ponnapalli; John L. Staples
Archive | 1996
Mark John Allen; Richard I. Kaufman; Jeffrey Joseph Kleikamp; Lawrence Shungwei Mok; I. C. Noyan; Roger A. Pollak; Ricky Allen Rand; Arthur Robert Williams
Archive | 2006
Ron Ridgeway; Steven T. Berman; Paul F. Greier; Kenneth C. Ho; Richard I. Kaufman; Alphonso P. Lanzetta; Michael Mastro; Steven Edward Millman; Kai Schleupen; Steven L. Wright