Richard L. Antley

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme

This paper provides development of an RF circuit software tool that automatically generates diagnostic programs for device interface boards. The diagnostic tool utilizes novel techniques to differentiate faulty RF circuits embedded in printed circuit boards. We present RF circuit diagnostic techniques using power sensors and multi-tone dither testing, which we integrated into the diagnostic software tool that we developed. The diagnostic tool provides user-transparent pseudocodes with high fault coverage and significantly decreases time to market.

Physics Based Fault Models for Testing High-Voltage LDMOS

This paper presents a fault model based test technique for high-voltage laterally-diffused metal oxide semiconductor field effect transistor (HV-LDMOS) to test for structural defects such as gate-FOX breakdown, gate-stress due to thermal overload and drain leakage due to high voltage stress. We have developed highly accurate equivalent circuit models for HV-LDMOS which is represented as a hybrid model and has been validated for different device geometries including both large and small gate-channels. The hybrid model is incorporated to develop fault models for testing and diagnosis of HV-LDMOS. We have developed fault models for structural defects by inducing their physical effect in the HV-LDMOS hybrid model. HV-LDMOS testing is performed by connecting the device in common-emitter configuration and computing its gain by using a chopped test stimulus and capturing the device response using a digitizer. The test measurements are further processed using a lock-in amplifier (noise-reduction scheme) in MATLAB-Simulink software platform. The proposed test technique is low-cost and highly accurate.

RADPro: Automatic RF analyzer and diagnostic program generation tool

This paper provides development of an RF circuit software tool that generates diagnostic programs automatically for device interface boards. The diagnostic tool utilizes novel techniques to differentiate faulty RF circuits embedded in printed circuit boards. The diagnostic tool provides user-transparent pseudocodes with high fault coverage and significantly decreases time to market.