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Richard W. Jarvis

Advanced Micro Devices

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Publication

Featured researches published by Richard W. Jarvis.

Archive | 1998

Product wafer yield prediction method employing a unit cell approach

Richard W. Jarvis

Archive | 2002

Split manufacturing method for advanced semiconductor circuits

Richard W. Jarvis; Michael G. McIntyre

Archive | 1999

Multipurpose defect test structure with switchable voltage contrast capability and method of use

Richard W. Jarvis; Iraj Emami; John L. Nistler; Michael G. McIntyre

Archive | 1999

Drop-in test structure and methodology for characterizing an integrated circuit process flow and topography

Richard W. Jarvis; Iraj Emami; Charles E. May

Archive | 2000

Integrated defect monitor structures for conductive features on a semiconductor topography and method of use

Richard W. Jarvis; Michael G. McIntyre

Archive | 1999

Semiconductor test structure with intentional partial defects and method of use

Richard W. Jarvis; Iraj Emami; Alan Berezin

Archive | 1999

Test structure and methodology for characterizing etching in an integrated circuit fabrication process

Richard W. Jarvis

Archive | 1999

Drop-in test structure and abbreviated integrated circuit process flow for characterizing production integrated circuit process flow, topography, and equipment

Richard W. Jarvis; Iraj Emami; Charles E. May

Archive | 1999

Micro-void detection

Richard W. Jarvis

Archive | 1999

Test structure and methodology for characterizing ion implantation in an integrated circuit fabrication process

Richard W. Jarvis

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Iraj Emami

Advanced Micro Devices

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Michael G. McIntyre

Advanced Micro Devices

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Charles E. May

Advanced Micro Devices

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Alan Berezin

Advanced Micro Devices

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John L. Nistler

Advanced Micro Devices

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