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Advances in Resist Technology and Processing XX | 2003

Novel development technique using ozonated water

Kei Hayasaki; Riichiro Takahashi; Tomoyuki Takeishi; Shinichi Ito

Two kinds of development processes were investigated. One is two-step development in which surface treatment using ozonated water was employed between the two steps of the development. The other is development in which ozonated water and hydrogenated water were employed in the pre-treatment step and the post-treatment step. The above-mentioned processes were applied to KrF resist process of 130nm generation. By pre-treatment using ozonated water and two-step development using ozonated water in inter-treatment, the shot-to-shot CD variation of isolated line (line width = 180nm) and the intra-shot variation were improved from 6.6nm to 4.4nm and from 13.5nm to 8.6nm, respectively. And the total variation was greatly improved from 15.0nm to 8.6nm. Moreover, the number of defects was greatly decreased by post-treatment using ozonated water and hydrogenated water continuously.


Archive | 2008

Processing method, manufacturing method of semiconductor device, and processing apparatus

Tomoyuki Takeishi; Kenji Kawano; Hiroshi Ikegami; Shinichi Ito; Riichiro Takahashi


Archive | 2003

Substrate treating method, substrate-processing apparatus, developing method, method of manufacturing a semiconductor device, and method of cleaning a developing solution nozzle

Kei Hayasaki; Shinichi Ito; Tatsuhiko Ema; Riichiro Takahashi


Archive | 2001

Chemical liquid processing apparatus for processing a substrate and the method thereof

Shinichi Ito; Riichiro Takahashi; Tatsuhiko Ema; K. Okamura


Archive | 2004

Alkaline solution and manufacturing method, and alkaline solution applied to pattern forming method, resist film removing method, solution application method, substrate treatment method, solution supply method, and semiconductor device manufacturing method

Riichiro Takahashi; Kei Hayasaki; Tomoyuki Takeishi; Shinichi Ito


Archive | 2002

Method of manufacturing alkaline solution, the alkaline solution, pattern-forming method, resist film peeling method, chemical agent applying device, wafer-treating method and chemical agent supplying method

Kei Hayazaki; Shinichi Ito; Riichiro Takahashi; Tomoyuki Takeishi; 信一 伊藤; 圭 早崎; 知之 竹石; 理一郎 高橋


Archive | 2001

Ultraviolet microscope and observation method using the same

Tatsuhiko Ema; Shinichi Ito; Jiro Mizuno; Riichiro Takahashi; Tokuji Tsurumune; 信一 伊藤; 次郎 水野; 達彦 江間; 理一郎 高橋; 篤司 鶴旨


Archive | 2004

Chemical liquid processing apparatus for processing a substrate

Shinichi Ito; Riichiro Takahashi; Tatsuhiko Ema; K. Okamura


Archive | 2002

Method of forming a pattern

Riichiro Takahashi; Kei Hayasaki; Shinichi Ito


神奈川ロージャーナル | 2010

専任教員の研究・社会活動(2008年10月~2010年3月)

和志 安達; Kazushi Adachi; 浩己 安部; Kohki Abe; 睦雄 栗田; Mutsuo Kurita; 和哉 近藤; Kazuya Kondo; 勉 田口; Tsutomu Taguchi; 倫道 鶴藤; Norimichi Tsurufuji; 泰史 橡川; Yasushi Tochikawa; 茂 丸山; Shigeru Maruyama; 俊昭 矢口; Toshiaki Yaguchi; 理一郎 高橋; Riichiro Takahashi; 正夫 仁平; Masao Nihei; 明 森田; Akira Morita

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