Robert L. Cobene
Hewlett-Packard
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Featured researches published by Robert L. Cobene.
Proceedings of SPIE | 2010
Albert Jeans; Marcia Almanza-Workman; Robert L. Cobene; Richard Elder; Robert A. Garcia; Fernando Gomez-Pancorbo; Warren Jackson; Mehrban Jam; Han-Jun Kim; Ohseung Kwon; Hao Luo; John Maltabes; Ping Mei; Craig Perlov; Mark T. Smith; Carl Taussig; Frank Jeffrey; Steve Braymen; Jason Hauschildt; Kelly Junge; Don Larson; Dan Stieler
A solution to the problems of roll-to-roll lithography on flexible substrates is presented. We have developed a roll-toroll imprint lithography technique to fabricate active matrix transistor backplanes on flexible webs of polyimide that have a blanket material stack of metals, dielectrics, and semiconductors. Imprint lithography produces a multi-level 3- dimensional mask that is then successively etched to pattern the underlying layers into the desired structures. This process, Self-Aligned Imprint Lithography (SAIL), solves the layer-to-layer alignment problem because all masking levels are created with one imprint step. The processes and equipment required for complete roll-to-roll SAIL fabrication will be described. Emphasis will be placed on the advances in the roll-to-roll imprint process which have enabled us to produce working transistor arrays.
Journal of Materials Chemistry | 2011
A. Marcia Almanza-Workman; Carl Taussig; Albert Jeans; Robert L. Cobene
Self-aligned imprint lithography (SAIL) enables the patterning and alignment of submicron-sized features on metre-scaled flexible substrates in the roll-to roll (R2R) environment. SAIL solves the problem of precision interlayer registry on a moving web by encoding all the geometry information required for the entire patterning steps into a monolithic three-dimensional mask that is imprinted on the thin film stack deposited on a flexible substrate. Soft molds made of plastics or elastomers cast on a silicon master have been used as stamps to pattern the 3D masks because of their low cost and ease of fabrication. However, the durability of these stamps is one factor that limits their efficiency in a R2R process. Fluorothermoplastics are low cost imprint stamp materials with great mechanical strength and chemical compatibility but with low gas permeability that trap air bubbles in the photopolymer during the imprint process. This paper describes the strategy for increasing gas permeability of fluorothermoplastics by introducing voids or pores in the stamp material by fabricating the stamps with aqueous colloidal dispersions of tetrafluoroethylene–hexafluoropropylene copolymer (FEP) nanoparticles. The basic idea is that the hard fluorinated particles, whose modulus is too high to deform during drying, remain as hard spheres and lead to a porous packing when drying is complete. The selection of suitable additives to eliminate cracks created by capillary stresses during water evaporation is also described in this paper.
SID Symposium Digest of Technical Papers | 2010
Carl Taussig; Robert L. Cobene; Richard Elder; Warren Jackson; Mehrban Jam; Albert Jeans; Hao Luo; John Maltabes; Ping Mei; Mark T. Smith; Craig Perlov; Lihua Zhao; Marcia Almanza-Workman; Robert A. Garcia; Han-Jun Kim; Ohseung Kwon; Frank Jeffrey
HP and Phicot are planning the worlds first R2R (roll-to-roll) manufacturing line for display backplanes based on the SAIL (Self-Aligned Imprint Lithography) process. Economic benefits for R2R compared to batch, cost comparisons of different R2R processes, comparison of substrate options, and necessary supply chain infrastructure developments are presented.
Archive | 2002
Akinobu Kuramoto; Robert L. Cobene; John P. Ertel
Archive | 2002
Robert L. Cobene; John P. Ertel; Akinobu Kuramoto
Archive | 2001
John P. Ertel; Akinobu Kuramoto; Robert L. Cobene
Archive | 2001
Robert L. Cobene; Steven W. Trovinger; Raymond G. Schuder; John P. Ertel
Archive | 2001
John P. Ertel; Akinobu Kuramoto; Robert L. Cobene
Archive | 2004
Raymond G. Schuder; John P. Ertel; Robert L. Cobene; Steven W. Trovinger; Ross R. Allen
Journal of Nanoscience and Nanotechnology | 2010
Ping Mei; Marcia Almanza-Workman; Alison Chaiken; Robert L. Cobene; Richard Elder; Bob Garcia; Warren Jackson; Mehrban Jam; Albert Jeans; Han-Jun Kim; Ohseung Kwon; Hao Luo; Craig Perlov; Carl Taussig