Ru-Shang Hsiao

1.3-/spl mu/m InAs-InGaAs quantum-dot vertical-cavity surface-emitting laser with fully doped DBRs grown by MBE

We report InAs-InGaAs quantum-dot vertical-cavity surface-emitting lasers (VCSELs) grown by molecular beam epitaxy with fully doped n- and p-doped AlGaAs distributed Bragg reflectors and including an AlAs layer to form a current and waveguiding aperture. The metal contacts are deposited on a topmost p/sup +/-GaAs contact layer and on the bottom surface of the n/sup +/-GaAs substrate. This conventional selectively oxidized top-emitting device configuration avoids the added complexity of fabricating intracavity or coplanar ohmic contacts. The VCSELs operate continuous-wave at room temperature with peak output powers of 0.33 mW and differential slope efficiencies up to 0.23 W/A. The peak lasing wavelengths are near 1.275 /spl mu/m, with a sidemode suppression ratio of 28 dB.

Single-mode monolithic quantum-dot VCSEL in 1.3 /spl mu/m with sidemode suppression ratio over 30 dB

We present monolithic quantum-dot vertical-cavity surface-emitting lasers (QD VCSELs) operating in the 1.3-/spl mu/m optical communication wavelength. The QD VCSELs have adapted fully doped structure on GaAs substrate. The output power is /spl sim/330 /spl mu/W with slope efficiency of 0.18 W/A at room temperature. Single-mode operation was obtained with a sidemode suppression ratio of >30 dB. The modulation bandwidth and eye diagram in 2.5 Gb/s was also presented.

Engineering laser gain spectrum using electronic vertically coupled InAs-GaAs quantum dots

Continuous large-broad laser gain spectra near 1.3 /spl mu/m are obtained using an active region of electronic vertically coupled (EVC) InAs-GaAs quantum dots (QDs). A wide continuous electroluminescence spectrum, unlike that from conventional uncoupled InAs QD lasers, was obtained around 230 nm (below threshold) with a narrow lasing spectrum. An internal differential quantum efficiency as high as 90%, a maximum measured external differential efficiency of 73% for a stripe-length of L=1 mm, and a threshold current density for zero total optical loss as low as 7 A/cm/sup 2/ per QD layer were achieved.

Characteristics of MOCVD- and MBE-grown InGa(N)As VCSELs

We report our results on InGaNAs/GaAs vertical-cavity surface-emitting lasers (VCSELs) in the 1.3 ?m range. The epitaxial structures were grown on (1?0?0) GaAs substrates by metalorganic chemical vapour deposition (MOCVD) or molecular beam epitaxy (MBE). The nitrogen composition of the InGa(N)As/GaAs quantum-well (QW) active region is 0?0.02. The long-wavelength (up to 1.3 ?m) room-temperature continuous-wave (RT CW) lasing operation was achieved for MBE- and MOCVD-grown VCSELs. For MOCVD-grown devices with n- and p-doped distributed Bragg reflectors (DBRs), a maximum optical output power of 0.74 mW was measured for In0.36Ga0.64N0.006As0.994/GaAs VCSELs. A very low Jth of 2.55 kA cm?2 was obtained for the InGaNAs/GaAs VCSELs. The MBE-grown devices were made with an intracavity structure. Top-emitting multi-mode 1.3 ?m In0.35Ga0.65N0.02As0.98/GaAs VCSELs with 1 mW output power have been achieved under RT CW operation. A Jth of 1.52 kA cm?2 has been obtained for the MBE-grown In0.35Ga0.65N0.02As0.98/GaAs VCSELs, which is the lowest threshold current density reported. The emission characteristics of the InGaNAs/GaAs VCSELs were measured and analysed.

Strain relaxation in InAs∕InGaAs quantum dots investigated by photoluminescence and capacitance-voltage profiling

We present detailed studies of the onset of strain relaxation in InAs∕InGaAs quantum dots. We show that the ground-state photoluminescence (PL) emission redshifts with increasing the InAs coverage before relaxation and blueshifts when relaxation occurs. PL spectra of the relaxed samples show two predominant families of dots with very different temperature-dependent efficiency. By comparison we show that the dots emitting at long wavelength are degraded by relaxation while the dots emitting at short wavelength remain coherently strained. Consequently, the PL spectra are dominated by the dots emitting at short wavelength, leading to the observed blueshift. This result suggests that the relaxation does not occur uniformly. In addition, we show that the relaxation occurs in the dot bottom interface.

A Novel Dilute Antimony Channel

This letter reports, for the first time, a high-electron mobility transistor (HEMT) using a dilute antimony In0.2Ga0.8 AsSb channel, which is grown by a molecular-beam epitaxy system. The interfacial quality within the InGaAsSb/GaAs quantum well of the HEMT device was effectively improved by introducing the surfactantlike Sb atoms during the growth of the InGaAs layer. The improved heterostructural quality and electron transport properties have also been verified by various surface characterization techniques. In comparison, the proposed HEMT with (without) the incorporation of Sb atoms has demonstrated the maximum extrinsic transconductance gm,max of 227 (180) mS/mm, a drain saturation current density IDSS of 218 (170) mA/mm, a gate-voltage swing of 1.215 (1.15) V, a cutoff frequency fT of 25 (20.6) GHz, and the maximum oscillation frequency fmax of 28.3 (25.6) GHz at 300 K with gate dimensions of 1.2times200 mum2

\hbox{In}_{0.2}\hbox{Ga}_{0.8}\hbox{AsSb}/\hbox{GaAs}

We have made InGaAs submonolayer (SML) quantum-dot (QD) and InAs QD photonic-crystal vertical-cavity surface-emitting lasers (PhC-VCSELs) for fiber-optic communications in the 990 and 1300 nm ranges, respectively. The active region of the InGaAs SML QD PhC-VCSEL contains three InGaAs SML QD layers, with each of the SML QD layer formed by alternating depositions of InAs and GaAs. The active region of the InAs QD PhC-VCSEL contains 17 undoped InAs-InGaAs QD layers. Both types of QD PhC-VCSELs exhibit single-mode characteristics throughout the current range, with side-mode suppression ratio (SMSR) larger than 35 dB. A maximum output power of 5.7 mW has been achieved for the InGaAs SML QD PhC-VCSEL. The near-field image study of the QD PhC-VCSELs indicates that the laser beam is well confined by the photonic-crystal structure of the device.

HEMT

This work systematically investigated the optical and structural properties of multilayer electronic vertically coupled InAs/GaAs quantum dot (QDs) structures grown by molecular beam epitaxy for long-wavelength applications. A significant energy blue-shift in the photoluminescence (PL) spectra from 30-period InAs/GaAs QDs structures was observed as the GaAs spacer thickness was decreased. Transmission electron microscopy (TEM) and PL measurements indicated that the abnormal blue-shift can be attributed to the strain-driven In/Ga intermixing between QDs and spacer layers, which overcompensates for the effects of electronic and structural couplings between QD layers. Moreover, this study demonstrates that increasing the growth rate of InAs QDs can prevent intermixing. A PL emission wavelength of 1320 nm with strong luminescence at room temperature, which corresponds to an energy red-shift of 50 meV from that of the single QD layer sample, was achieved in a 10-period InAs/GaAs QD superlattice with a spacer thickness of 16 nm.

Characteristics of InGaAs Submonolayer Quantum-Dot and InAs Quantum-Dot Photonic-Crystal Vertical-Cavity Surface-Emitting Lasers

The effect of strain relaxation in a relaxed InAs quantum dot (QD) capped with InGaAs is investigated by admittance and deep-level transient spectroscopy (DLTS). Strain relaxation markedly increases the emission time in the QD region and extends carrier depletion to the bottom GaAs layer. The experimental data show the presence of relaxation traps in the QD region and the neighboring bottom GaAs layer. The electron emission from the QD region is governed by a trap located at 0.17–0.21 eV below the QD ground state. The electron-escape process is identified as thermal activation at high temperatures and direct tunneling at low temperatures from the trap. In the bottom GaAs layer near the QD, DLTS reveals a relaxation trap at 0.37–0.41 eV relative to the GaAs conduction band. The energy difference between these two traps is comparable to the QD ground-state energy relative to the GaAs conduction-band edge, suggesting that the two traps may be the same trap which is pinned to the GaAs conduction band. The con...

Optical and structural properties of vertically stacked and electronically coupled quantum dots in InAs/GaAs multilayer structures

The optoelectronic characteristics of self-assembled InAs quantum dots (QDs) with strain-reduced layers (SRLs) were investigated using photoluminescence (PL) spectroscopy. Various SRLs that combine In0.14Al0.86As and In0.14Ga0.86As with the same total thickness were examined to ascertain their confining effect on carriers in InAs QDs. The emission wavelength is blueshifted as the thickness of InAlAs is increased. The energy separation between the ground state and the first excited state of QDs with InAlAs SRLs greatly exceeds that of QDs with InGaAs SRLs. Atomic force microscopic images and PL spectra of the QD samples demonstrated that high-quality InAs QDs with long emission wavelengths and a large energy separation can be generated by growing a low-temperature, thin InAlAs SRL onto self-assembled QDs.